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inTEST Temptronic ECO-710-M High-Low Temperature Thermal Shock Test System for Optical Transceivers

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Brand inTEST Temptronic
Origin USA
Model ECO-710-M
Temperature Range -80°C to +225°C
Cooling/Heating Method Compressed Dry Air with Integrated Refrigeration & Resistive Heating
Thermal Ramp Rate Up to 150°C/min (typical, dependent on DUT mass and fixture)
Control Mode Air Mode (directed convective thermal stream)
Compliance Designed for ASTM F1634, Telcordia GR-468-CORE, IEC 61300-2-22, and JEDEC JESD22-A104 environmental stress screening protocols
Software Interface Windows-based Temptronic TControl™ v5.x with 21 CFR Part 11-compliant audit trail and user role management
Footprint Benchtop, modular integration capable

Overview

The inTEST Temptronic ECO-710-M is a high-performance, benchtop thermal shock test system engineered specifically for precision temperature cycling of optoelectronic components—particularly optical transceivers used in datacom and telecom infrastructure. Unlike conventional environmental chambers, the ECO-710-M employs a directed convective thermal stream delivery architecture based on the Air Mode principle: filtered, oil-free compressed air is conditioned through an integrated refrigeration unit and resistive heating head, then delivered via a flexible, low-inertia nozzle directly onto the device under test (DUT). This localized thermal application enables rapid, repeatable, and highly controllable thermal transitions—critical for evaluating thermal reliability, solder joint integrity, and operational stability of photonic modules operating across extended ambient ranges (e.g., outdoor base stations, hyperscale server racks, and 5G fronthaul units). The system operates within a validated temperature range of –80°C to +225°C, supporting both steady-state soak and dynamic thermal shock profiles per industry-standard qualification protocols.

Key Features

  • Modular Air Mode thermal delivery: Eliminates thermal mass lag by bypassing chamber walls; achieves ramp rates up to 150°C/min (measured at DUT surface, 1 g thermal mass)
  • Benchtop footprint with integrated air dryer, refrigeration compressor, and precision PID-controlled heating head
  • Programmable thermal profiles with up to 999 steps, including dwell, ramp, and cycle count parameters
  • Real-time DUT temperature monitoring via optional thermocouple or IR pyrometer input (compatible with K-, T-, or E-type sensors)
  • Thermal uniformity ±1.0°C across 25 mm² DUT area at setpoint (verified per IEC 60068-3-5)
  • Robust mechanical design compliant with ISO 14001 and RoHS directives; CE-marked for EU deployment

Sample Compatibility & Compliance

The ECO-710-M is optimized for discrete optoelectronic packages including SFP+, QSFP28, OSFP, and COB-based transceivers (up to 100 mm × 30 mm footprint). It supports both powered and unpowered testing configurations—enabling real-time electrical parametric monitoring (e.g., extinction ratio, eye diagram jitter, TEC current) during thermal transition via external instrumentation interfaces (GPIB, USB-TMC, LAN). The system meets functional requirements of Telcordia GR-468-CORE (Section 4.4.1.2), IEC 61300-2-22 (thermal shock), and JEDEC JESD22-A104F (temperature cycling). All thermal profiles are fully traceable and support GLP/GMP workflows: electronic signatures, change history logging, and secure user access levels align with FDA 21 CFR Part 11 Annex 11 expectations.

Software & Data Management

TControl™ v5.x software provides full system orchestration—including profile creation, live thermal mapping, alarm thresholding, and automated report generation (PDF/CSV). Audit trails record every parameter change, user login/logout event, and calibration action with timestamp and operator ID. Data export supports third-party analysis platforms (MATLAB, Python Pandas, JMP) via standardized .csv metadata headers. Optional add-ons include remote monitoring via HTTPS API, integration with MES systems (Siemens Opcenter, Rockwell FactoryTalk), and automated pass/fail decision logic based on user-defined thermal transient limits.

Applications

  • Qualification testing of 40G/100G/400G optical transceivers under accelerated thermal stress
  • Failure mode analysis (FMA) of solder interconnects and die-attach materials in photonic ICs
  • Thermal derating validation for TEC-controlled laser diodes and APD receivers
  • Environmental stress screening (ESS) prior to burn-in and final shipment
  • Design verification of thermal interface materials (TIMs) and heatsink integration efficacy
  • Reliability assessment of co-packaged optics (CPO) assemblies under heterogeneous thermal loads

FAQ

What distinguishes the ECO-710-M from standard thermal chambers?

It uses direct convective air delivery instead of chamber air circulation—enabling faster ramp rates, tighter temperature control at the DUT surface, and minimal thermal cross-talk between adjacent components.
Can the system perform powered-in testing while applying thermal stress?

Yes—via integrated analog/digital I/O ports and synchronization triggers, enabling concurrent thermal profiling and electrical parameter acquisition using external bit error rate testers (BERTs), oscilloscopes, or optical power meters.
Is calibration documentation provided with the system?

Each unit ships with NIST-traceable calibration certificates for temperature sensors and airflow actuators, valid for 12 months; optional annual recalibration service includes ISO/IEC 17025-accredited lab reporting.
Does the ECO-710-M support custom nozzle fixtures for non-standard module geometries?

Yes—Temptronic offers engineering support for bespoke thermal nozzles, DUT carriers, and EMI-shielded enclosures tailored to QSFP-DD, OSFP-XD, and pluggable coherent modules.
How is system validation performed after installation?

On-site IQ/OQ documentation is provided per ASTM E2500, including thermal mapping, ramp rate verification, and software functionality checks aligned with user requirement specifications (URS).

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