Duma Optronics BeamOn-VIS Beam Profiler
| Brand | Duma Optronics |
|---|---|
| Origin | Israel |
| Model | BeamOn-VIS |
| Wavelength Range | 350–1310 nm |
| Detector Active Area | 7.6 × 6.2 mm |
| Sensor Type | 12-bit CCD |
| Measurement Modes | CW and Pulsed Lasers |
| Includes | Mounting Bracket, ND Filters, 6 V Power Supply, BeamGage Software |
Overview
The Duma Optronics BeamOn-VIS is a high-precision beam profiling system engineered for quantitative characterization of laser beams in visible to near-infrared spectral ranges. Based on the principle of direct imaging using a calibrated CCD sensor, the instrument captures spatial intensity distributions with pixel-level resolution, enabling rigorous calculation of ISO 11146-compliant beam parameters—including beam width (D4σ, knife-edge, and 1/e² definitions), centroid position, ellipticity, beam propagation factor (M²) when integrated with optional translation stages, and peak-to-average intensity ratios. Designed for laboratory, production, and R&D environments, the BeamOn-VIS delivers traceable, repeatable measurements essential for laser alignment verification, cavity optimization, optical component validation, and compliance testing against international standards such as ISO 13694 and IEC 60825-1.
Key Features
- 12-bit monochrome CCD sensor with high quantum efficiency across 350–1310 nm, optimized for low-noise performance in both continuous-wave (CW) and nanosecond-to-microsecond pulsed laser regimes
- Active detector area of 7.6 × 6.2 mm, supporting full-beam capture for collimated or moderately divergent sources without cropping artifacts
- Integrated neutral density (ND) filter set enabling safe, linear-response measurement of lasers ranging from µW to multi-watt average power levels
- Rugged aluminum housing with precision kinematic mounting interface compatible with standard optical tables and post systems
- Real-time frame rate up to 30 Hz at full resolution, with hardware-triggered acquisition support for synchronized pulsed-laser profiling
- Thermally stabilized sensor design minimizing drift during extended measurement sessions—critical for long-duration M² or stability studies
Sample Compatibility & Compliance
The BeamOn-VIS accommodates free-space laser beams from common solid-state lasers (e.g., Nd:YAG, Ti:Sapphire, diode-pumped lasers), fiber-coupled outputs, and low-divergence HeNe sources. It supports beam diameters from 5 mm without reconfiguration. All measurements adhere to ISO 11146-1:2005 and ISO 11146-2:2005 methodologies for transverse beam parameter determination. The system meets electromagnetic compatibility (EMC) requirements per EN 61326-1 and carries CE marking for use in EU-regulated laboratories. When operated under documented SOPs with calibration certificates traceable to NIST or PTB standards, data generated satisfies GLP and internal quality audit requirements.
Software & Data Management
BeamGage software—supplied standard with the BeamOn-VIS—provides a validated, menu-driven interface for acquisition, analysis, and reporting. It supports automated batch processing of time-series profiles, export of raw TIFF/CSV datasets, and generation of PDF reports compliant with FDA 21 CFR Part 11 when configured with electronic signatures and audit trail modules. Calibration files are stored per-sensor unit and automatically applied during startup; wavelength-dependent responsivity corrections are embedded for all supported bands. The software architecture permits integration into LabVIEW and MATLAB environments via COM/ActiveX and DLL APIs, facilitating custom automation in manufacturing test stations or academic experimental control loops.
Applications
- Verification of TEM₀₀ mode purity and multimode content in DPSS and diode lasers
- Quantitative assessment of beam distortion introduced by optical elements (e.g., lenses, scanners, spatial light modulators)
- In-process monitoring of laser welding and cutting head alignment stability
- Characterization of ultrafast amplifier output before compressor tuning
- Validation of beam homogenizers and diffusers used in lithography illumination systems
- Teaching and demonstration of Gaussian optics principles in university photonics labs
FAQ
What is the minimum measurable beam diameter with the BeamOn-VIS?
The theoretical limit is governed by pixel pitch and magnification; with native resolution (~4.65 µm/pixel), beams ≥20 µm can be resolved reliably. Sub-micron beams require optional telecentric or microscope objectives.
Can the BeamOn-VIS measure ultrashort pulses (e.g., femtosecond lasers)?
Yes—provided pulse energy remains within sensor damage thresholds and repetition rate allows sufficient signal averaging. For pulses <10 ps, temporal gating or external sync triggering is recommended.
Is calibration included with the instrument?
Each unit ships with a factory calibration certificate covering spatial uniformity, pixel response linearity, and wavelength-dependent responsivity across 405–1064 nm.
Does BeamGage support multi-camera synchronization?
Not natively; however, external TTL trigger inputs allow coordinated acquisition across multiple BeamOn units in distributed beamline diagnostics setups.
How often should recalibration be performed?
Annual recalibration is recommended for metrology-critical applications; users performing ISO 17025-accredited testing must follow their internal calibration schedule aligned with uncertainty budgets.
