Fischer X-Ray Fluorescence Thickness Analyzer FISCHERSCOPE X-RAY Series
| Origin | UK |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | FISCHERSCOPE X-RAY Series |
| Pricing | Available Upon Request |
Overview
The Fischer FISCHERSCOPE X-RAY Series is a benchtop energy-dispersive X-ray fluorescence (EDXRF) thickness analyzer engineered for non-destructive, quantitative measurement of metallic and multi-layer coatings, thin films, and elemental composition. Operating on the fundamental principle of X-ray fluorescence spectroscopy, the instrument irradiates a sample with high-energy X-rays, inducing characteristic secondary (fluorescent) X-ray emission from constituent elements. By spectrally resolving these emissions using a silicon drift detector (SDD), the system simultaneously determines both elemental identity and areal density — enabling precise conversion to physical thickness for homogeneous layers on known substrates. Designed for laboratory and production-floor environments, this analyzer delivers trace-level detection limits (sub-ppm for many elements), high reproducibility (<1% RSD for repeated measurements under controlled conditions), and robust architecture suitable for continuous operation in quality assurance and incoming inspection workflows.
Key Features
- Non-destructive, rapid analysis of single- and multi-layer coating systems — including Au, Ni, Cu, Sn, Pb, Cr, Zn, Ag, Pt, Pd, and alloyed layers — without sample preparation or consumables
- Simultaneous elemental identification and thickness quantification via fundamental parameter (FP) and empirical calibration methods
- High-resolution silicon drift detector (SDD) with Peltier cooling, delivering superior peak-to-background ratio and count-rate stability
- Motorized XYZ stage with programmable positioning and automatic focus adjustment for repeatable spot analysis (spot sizes down to 30 µm)
- Integrated microfocus X-ray tube with selectable kV/mA settings to optimize excitation for light and heavy elements
- Compliance with IEC 61000-4-3 (EMC) and IEC 61010-1 (safety); fully shielded cabinet meeting ISO 2081 and ASTM B568 radiation safety requirements
Sample Compatibility & Compliance
The FISCHERSCOPE X-RAY Series accommodates solid, powdered, and liquid samples — including PCBs, watch components, jewelry alloys, automotive fasteners, semiconductor leadframes, and photovoltaic absorber layers. It supports magnetic and non-magnetic conductive substrates (e.g., Fe, Cu, Ni, Al, glass, ceramics) and enables accurate thickness determination even on complex geometries via height-sensing auto-focus. The system complies with international standards essential for regulated industries: ASTM B568 (standard test method for coating thickness by X-ray spectrometry), ISO 3497 (metallic coatings — measurement of coating thickness — X-ray spectrometric methods), and RoHS Directive 2011/65/EU for restricted substance screening (Pb, Cd, Hg, Cr⁶⁺, Br). Full audit trail functionality satisfies GLP/GMP documentation requirements and aligns with FDA 21 CFR Part 11 for electronic records and signatures when configured with optional secure user management.
Software & Data Management
Equipped with WinFTM® — Fischer’s proprietary Windows-based analysis software — the instrument provides intuitive workflow-driven operation, multi-layer modeling (up to 5 layers), matrix correction algorithms, and customizable report generation (PDF, CSV, XML). Data integrity is ensured through time-stamped measurement logs, operator ID tracking, method version control, and encrypted database storage. Batch analysis mode supports high-throughput QA/QC tasks, while statistical process control (SPC) tools enable real-time monitoring of coating thickness trends across production lots. Exported data integrates seamlessly with LIMS and MES platforms via ODBC or OPC UA protocols.
Applications
- Electronics & Semiconductor: Thickness verification of solder finishes (ENIG, ENEPIG), bond pad metallization (Au/Ni/Cu), and plating on connectors and PCBs
- Jewelry & Horology: Precise assay of gold, platinum, and rhodium plating on watch cases and fine jewelry; alloy composition verification per ISO 9277
- Automotive & Fasteners: Coating thickness control of Zn-Ni, Cr³⁺, and phosphate layers on bolts, brackets, and chassis components
- Photovoltaics: Quantitative analysis of CIGS, CdTe, and perovskite thin-film layer stoichiometry and thickness uniformity
- Electroplating & Surface Finishing: In-line validation of decorative and functional plating processes across batch and rack plating lines
- Regulatory Screening: RoHS-compliant screening of consumer electronics, toys, and packaging materials for hazardous substances
FAQ
Does the FISCHERSCOPE X-RAY require radioactive sources or chemical reagents?
No — it uses a sealed microfocus X-ray tube and requires no isotopic sources, acids, or wet chemistry.
Can it measure coatings on non-conductive substrates such as plastics or ceramics?
Yes — provided the coating material emits detectable fluorescence and the substrate does not strongly absorb the emitted X-rays.
Is calibration transfer possible between different FISCHERSCOPE X-RAY instruments?
Yes — via standardized calibration files and certified reference materials traceable to NIST and BAM standards.
What is the typical measurement repeatability for a 0.5 µm Au layer on Ni/Cu substrate?
Under optimized conditions, repeatability is typically ≤0.8% RSD (n=10, fixed geometry, temperature-stabilized environment).
Does the system support automated pass/fail decision logic based on tolerance limits?
Yes — WinFTM® allows configurable acceptance criteria, color-coded result display, and automated export of compliance status to factory networks.
