YANRUN YR5040-Z Semi-Automatic Vision Measuring Machine
| Brand | YANRUN |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | YR5040-Z |
| Price | USD 1 (FOB Shanghai) |
| Measurement Accuracy | (3 + L/200) µm |
| Encoded Linear Scale Resolution | 1 µm (closed-loop optical grating) |
| Optical Magnification | 20×–140× (optional 40×–280×) |
| Camera | Hikvision high-speed fiber-optic industrial digital camera |
| Illumination | Imported LED ring/circular cold light source |
Overview
The YANRUN YR5040-Z Semi-Automatic Vision Measuring Machine is a precision coordinate metrology system engineered for non-contact two-dimensional geometric measurement of machined parts, sheet metal components, injection-molded products, and micro-electromechanical features. It operates on the principle of high-resolution optical imaging combined with closed-loop linear displacement feedback from precision optical grating scales, enabling traceable dimensional verification in accordance with ISO 10360-7 (coordinate measuring machines — acceptance and reverification tests) and aligned with GD&T standards per ASME Y14.5 and ISO 1101. Designed for laboratory, QC lab, and production-floor environments, the system delivers repeatable sub-micron resolution across its 500 mm × 400 mm × 180 mm volumetric measurement envelope, with Z-axis auto-focus capability ensuring consistent focus depth for height-sensitive features.
Key Features
- Structural stability: 00-grade granite base and column with surface flatness ≤ 3 µm, minimizing thermal drift and mechanical deformation under ambient load.
- Motion control: High-balance crossed roller guideways paired with precision servo-driven Z-axis for smooth, backlash-free vertical motion and automated focusing.
- Optical subsystem: 0.7×–4.5× continuous zoom telecentric lens with calibrated magnification; integrated Hikvision industrial CMOS camera featuring high frame rate and low-noise fiber-optic data transmission.
- Lighting architecture: Dual-mode LED illumination—adjustable ring light for surface edge contrast and coaxial circular cold light for profile shadow enhancement—enabling optimal feature segmentation across reflective, matte, or translucent surfaces.
- Closed-loop metrology: Fully enclosed 1 µm-resolution optical grating scales on X-, Y-, and Z-axes, certified to meet ISO 10012 requirements for measurement standard traceability.
Sample Compatibility & Compliance
The YR5040-Z accommodates workpieces up to 500 mm × 400 mm footprint and 180 mm height, including stamped parts, PCBs, precision gears, watch components, and medical device housings. Its non-destructive optical method supports materials ranging from aluminum alloys and stainless steel to plastics and ceramics. The system complies with electromagnetic compatibility (EMC) per IEC 61326-1 and safety requirements per IEC 61010-1. Software workflows support audit-ready documentation aligned with GLP and GMP environments, including user access control, electronic signatures, and full measurement history logging—facilitating FDA 21 CFR Part 11 readiness when deployed with validated configurations.
Software & Data Management
The machine runs ZONSON Intelligent Metrology Suite (multi-language UI), integrated with UWC3200 semi-automatic analysis engine. Core capabilities include automatic edge detection using adaptive thresholding and sub-pixel interpolation; GD&T evaluation per ASME Y14.5-2018 (parallelism, perpendicularity, position, concentricity, symmetry, profile of a surface, circular/runout); statistical process control (SPC) with real-time X-bar/R chart generation; and native export to industry-standard formats—PDF reports with annotated images, Excel datasets with metadata, DXF geometry files for CAD comparison, and AutoCAD-compatible DWG imports. All measurement records retain full traceability: operator ID, timestamp, calibration status, environmental conditions (if logged externally), and raw image archives.
Applications
- Quality assurance in automotive Tier-1 suppliers for bracket tolerances, hole pattern alignment, and flange flatness verification.
- Electronics manufacturing for SMT stencil inspection, connector pin pitch validation, and flex circuit fiducial placement accuracy.
- Medical device production for orthopedic implant slot geometry, catheter hub concentricity, and syringe barrel wall thickness uniformity.
- Aerospace subcontractors performing first-article inspection of turbine blade cooling holes and composite layup registration marks.
- R&D labs conducting iterative design verification of microfluidic channel dimensions and MEMS packaging clearances.
FAQ
What is the maximum permissible error (MPE) specification for this system?
The stated measurement uncertainty is (3 + L/200) µm, where L is the measured length in millimeters—consistent with ISO 10360-7 Clause 6.2 for vision-based CMMs operating under controlled environmental conditions (20 ± 1 °C, humidity 40–60% RH).
Can the system perform true 3D measurements?
The base configuration is 2.5D (X/Y planar + Z-height via focus peak detection). Optional Renishaw PH10MQ probe head with ruby stylus enables tactile 3D point acquisition, extending capability to stepped surfaces, threaded features, and undercuts.
Is software validation support available for regulated industries?
Yes—ZONSON software includes IQ/OQ documentation templates, configurable audit trails, and role-based permission sets. Full 21 CFR Part 11 compliance requires site-specific risk assessment and procedural SOPs, which YANRUN provides as part of its Validation Support Package.
What maintenance intervals are recommended for long-term accuracy retention?
Annual recalibration against NIST-traceable artifacts is advised. Daily cleaning of optical paths and monthly verification using the supplied 1 µm calibration scale are required per ISO 9001:2015 clause 7.1.5.1.
Does the system support integration into factory MES or QMS platforms?
Yes—via OPC UA and TCP/IP protocols, the ZONSON suite exposes structured JSON/XML measurement results and status codes for direct ingestion into Siemens Opcenter, PTC ThingWorx, or custom SQL-based quality databases.
