HP Spectroscopy easyLIGHT XUV Compact Flat-Field Extreme Ultraviolet Spectrometer
| Brand | HP Spectroscopy |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | easyLIGHT XUV |
| Price | Upon Request |
| Wavelength Range | 30–250 nm |
Overview
The HP Spectroscopy easyLIGHT XUV is a compact, aberration-corrected flat-field spectrometer engineered for high-efficiency spectral analysis in the extreme ultraviolet (EUV) and vacuum ultraviolet (VUV) regimes. Operating on the principle of vertical-incidence, off-axis parabolic grating spectroscopy, it eliminates the optical throughput limitation imposed by conventional entrance slits—replacing them with a slitless, direct-source imaging architecture. This proprietary design enables up to 20× higher photon flux at the detector compared to traditional grazing-incidence or Czerny–Turner spectrometers within the same footprint. Its 30–250 nm spectral coverage is optimized for time-resolved diagnostics of high-harmonic generation (HHG), attosecond pulse characterization, laser-produced plasma emission, discharge-based EUV sources, synchrotron beamline monitoring, and free-electron laser (FEL) spectral profiling. The instrument’s fixed 94° deviation angle and 75 mm physical footprint ensure compatibility with constrained experimental geometries—including ultrafast pump–probe chambers, UHV end-stations, and compact plasma diagnostics setups.
Key Features
- Slitless, vertical-incidence optical layout enabling direct source imaging and maximum light throughput
- Aberration-corrected flat-field focal plane for uniform spatial resolution across the full 30–250 nm range
- Closed-loop motorized grating positioning system with sub-arcsecond angular repeatability
- Integrated filter insertion unit for harmonic suppression and bandpass selection (e.g., MgF₂, LiF, Al filters)
- UHV-compatible construction (<10⁻⁶ mbar base pressure); optional fully non-magnetic configuration available
- Modular mechanical interface supporting rotation stages, multi-angle mounting, and custom beamline integration
- Standard USB 3.0 and Gigabit Ethernet data interfaces with deterministic latency for time-gated acquisition
Sample Compatibility & Compliance
The easyLIGHT XUV is designed for use with pulsed and continuous EUV/VUV sources including HHG-driven tabletop lasers, capillary discharge plasmas, laser-ablation plasmas, synchrotron bending magnets, and FELs. It supports both single-shot and averaged spectral acquisition modes. All optical components—including the gold-coated off-axis parabolic grating and flat-field mirror—are optimized for reflectivity stability under prolonged VUV irradiation. The spectrometer meets ISO 14644-1 Class 5 cleanroom assembly standards and conforms to CE marking requirements for electromagnetic compatibility (EMC Directive 2014/30/EU) and low-voltage safety (LVD Directive 2014/35/EU). For regulated environments, optional firmware logging and audit-trail-enabled software modules support GLP/GMP-aligned workflows compliant with FDA 21 CFR Part 11 requirements when paired with validated LabVIEW or C++ acquisition stacks.
Software & Data Management
A native Windows-based GUI provides real-time spectrum visualization, wavelength calibration (Hg/Ne/Ar lamp references), intensity normalization, and background subtraction. Full SDKs are provided for LabVIEW, VB.NET, C, and C++ development—enabling integration into custom control frameworks (e.g., EPICS, TANGO, or Python-based DAQ systems). Raw detector frames (16-bit TIFF or HDF5) retain full metadata including grating angle, filter position, exposure time, and vacuum status. Time-stamped spectral datasets include embedded timestamps traceable to system clock (PTPv2 over Ethernet) for synchronization with external triggers (TTL, LVDS, or optical). Optional spectral deconvolution modules implement Richardson–Lucy iteration for instrumental line shape correction, improving effective resolution to <0.08 nm FWHM under optimal signal-to-noise conditions.
Applications
- High-harmonic spectroscopy and attosecond pulse train characterization in strong-field physics experiments
- Time-resolved plasma diagnostics: electron temperature and density estimation via line-ratio analysis of He I, C III, O IV, and Ne VII transitions
- Synchrotron beamline commissioning and long-term flux stability monitoring
- FEL spectral bandwidth and central wavelength tracking during user runs
- Development and validation of EUV lithography source metrology tools
- Calibration transfer between laboratory-scale HHG sources and large-scale accelerator facilities
FAQ
Is the easyLIGHT XUV compatible with ultra-high vacuum (UHV) environments?
Yes—standard units operate reliably down to 10⁻⁶ mbar; UHV-rated versions with all-metal seals, low-outgassing materials, and bakeable housings are available upon request.
Can I use my existing VUV CCD or MCP detector with this spectrometer?
Yes—the modular detector interface supports standard 25.4 mm or 50.8 mm flange mounts (CF-35 or CF-63) and accommodates both front-illuminated and back-thinned CCDs, microchannel plate (MCP) intensifiers, and scientific CMOS sensors.
What calibration standards are supported?
Factory calibration uses NIST-traceable Hg, Ne, and Ar emission lines; users may perform in-situ recalibration using known plasma line emissions or synchrotron edge features.
Does the system support time-gated detection?
Yes—via TTL/CMOS trigger input synchronized to detector gate control; minimum gate width is 2 ns for MCP configurations and 100 ns for CCD readout.
Is remote operation and scripting supported?
Yes—full command-line interface (CLI) and REST API endpoints are included in the SDK, enabling headless operation, batch acquisition, and integration into automated experiment orchestration platforms.
