HP Spectroscopy
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| Brand | HP Spectroscopy |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | hardLIGHT |
| Pricing | Available Upon Request |
| Brand | HP Spectroscopy |
|---|---|
| Origin | Germany |
| Type | Aberration-Corrected Normal-Incidence Spectrometer |
| Wavelength Range | 80–300 nm |
| Vacuum Compatibility | <10⁻⁶ mbar (UHV version available) |
| Slit Width | 0–4 mm (manual or motorized) |
| Grating Positioning | Closed-loop motorized stage |
| Dispersion | ~2.5 nm/mm |
| Resolution | <0.1 nm |
| Wavelength Accuracy | <0.05 nm |
| Deviation Angle | 64° |
| f/# | 4.2 |
| Detector Options | VUV-optimized CCD, MCP, CMOS, or PMT |
| Data Interface | USB or Ethernet |
| Software Support | Windows GUI + LabVIEW, VB, C, C++ SDK |
| Optional Features | Filter insertion unit, non-magnetic construction, rotational geometry |
| Brand | HP Spectroscopy |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | easyLIGHT XUV |
| Price | Upon Request |
| Wavelength Range | 30–250 nm |
| Brand | HP Spectroscopy |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | highLIGHT High-Resolution Flat-Field XUV Spectrometer |
| Wavelength Range | 1–100 nm |
| Topology | Aberration-Corrected Flat-Field Spectrometer |
| Slitless Operation | Yes (slit optional) |
| Grating Positioning | Closed-Loop Motorized Stage |
| Filter Insertion | Integrated with USB/Ethernet Control Interface |
| Detector Compatibility | nXUV CCD, MCP/CMOS |
| Vacuum Compatibility | <10⁻⁶ mbar (UHV version available on request) |
| Dispersion | 0.06 nm/mm (SXR), 0.1–0.2 nm/mm (SXRXUV), 0.2–0.7 nm/mm (XUV) |
| Resolution | <0.001 nm @ 3 nm |
| Customization Options | Non-magnetic design, rotational geometry, spectral band optimization |
| Brand | HP Spectroscopy |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | hiXAS |
| X-ray Energy Range | 5–12 keV |
| Minimum Detectable Element Concentration | Low to several wt% |
| XAFS Acquisition Time | 3–8 min (depending on sample concentration and normalization requirements) |
| Spectral Resolution (E/ΔE) | Constant 4000 across full energy range |
| Detector | Photon-counting pixelated X-ray detector |
| Monochromator | HAPG-based von Hamos geometry spectrometer |
| Footprint | 2.0 m × 1.0 m |
| Sample Handling | Motorized sample wheel with multi-position mounting |
| Brand | HP Spectroscopy |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | maxLIGHT |
| Price | Upon Request |
| Wavelength Range | 1–200 nm |
| Brand | HP Spectroscopy |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | monoLIGHT |
| Application System | Vacuum Ultraviolet (VUV) Emission Spectroscopy |
| Grating Line Density | 1200 lines/mm (He II optimized) |
| First-Order He I Efficiency | 10% |
| First-Order He II Efficiency | 20% |
| Second-Order He II Efficiency | <0.5% |
| Spectral Resolution | ≤1 meV (at He I α/β separation) |
| Optical Configuration | Off-axis toroidal grating, in-situ beam characterization capable |
| Brand | HP Spectroscopy |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | proXAS |
| Price Range | USD 280,000 – 700,000 |
| X-ray Energy Range | 200–1200 eV (1–6 nm) |
| Elemental Coverage | C, N, O, Ca, Ti, and other light elements at K-edges |
| Minimum Detectable Elemental Content | Low percent-level (mass %) |
| Acquisition Time per XAFS Scan | Minutes |
| Source Repetition Rate | 25 Hz |
| Source Power Stability | ±1.5% RMS |
| Spectrometer Type | Aberration-Corrected Flat-Field Grating Spectrometer |
| Spectral Resolution | R = 1500 (λ/Δλ) |
| Sample Handling | Motorized Multi-Sample Carousel |
| Footprint | 1.5 m × 1.0 m |
| Software Suite | Integrated Control, Spectral Calibration, Background Subtraction, Edge Alignment, and Reference-Based Chemical State Fitting |
| Brand | HP Spectroscopy |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | oLIGHT |
| Wavelength Range | 10–80 nm |
| Grating Efficiency | ~20% |
| MCP Detector Quantum Efficiency | ~20% |
| Spectral Resolution | 0.13–0.25 nm |
| Beam Profiling Resolution | 100 µm |
| Footprint | 16 × 17 cm² |
| Filter Wheel | Motorized Metal Filter Insertion Unit |
| Operational Modes | Spectroscopy / Beam Profiling / Combined Dual-Mode Acquisition |