DUMA Optronics BeamOn Series M² Beam Profiling Analyzer
| Brand | DUMA Optronics |
|---|---|
| Country of Origin | Israel |
| Model | BeamOn Series (including BeamOn, BeamOn Touch, BeamOn LA, BeamOn WSR, BeamOn HR, BeamOn 2/3, μBeam, BeamOn Long-Bow) |
| Spectral Range | 190 nm – 2700 nm |
| Beam Size Measurement Range | 2 µm – 10 mm |
| Spatial Resolution | 0.1 µm |
| Interface | USB 2.0 (with TCP/IP and RS232 options) |
| Bit Depth | 12-bit |
| Detector Types | Si, UV-Si, and optional high-power sampling optics |
| Software | Windows-compatible (Win7/8/10, 32/64-bit), ActiveX integration supported |
| Compliance | Designed for ISO 11146-1:2005 & ISO 11146-2:2005 M² measurement protocols |
Overview
The DUMA Optronics BeamOn Series is a family of precision laser beam profiling analyzers engineered for quantitative M² (beam propagation ratio) characterization and real-time spatial intensity diagnostics of continuous-wave (CW) and pulsed laser beams. Based on industry-standard measurement principles—including ISO 11146-1:2005 and ISO 11146-2:2005—the system determines beam quality by capturing multiple transverse intensity profiles at varying axial positions along the beam path, then computing second-moment (D4σ) beam widths to derive the M² factor. The platform supports three core detection architectures: slit-scanning (Knife-Edge), CCD-based full-field imaging, and high-magnification micro-imaging—each selected according to application-specific requirements for dynamic range, resolution, spectral coverage, and power handling. All variants are calibrated traceable to NIST-traceable standards and operate within a broad spectral window spanning deep ultraviolet (190 nm) to mid-infrared (2700 nm), enabling compatibility with excimer lasers, Ti:sapphire oscillators, fiber lasers, quantum cascade sources, and semiconductor diodes.
Key Features
- Multi-architecture platform: Choose from slit-scan (Knife-Edge), standard CCD, high-resolution CCD (BeamOn HR), wide-spectral-range CCD (BeamOn WSR), touch-integrated standalone unit (BeamOn Touch), high-power attenuated systems (BeamOn LA), micro-beam analysis (μBeam), or long-working-distance imaging (BeamOn Long-Bow)
- ISO-compliant M² calculation engine with automated beam waist localization, Rayleigh length determination, and divergence estimation
- Sub-micron spatial resolution down to 0.1 µm (achieved via optical magnification or pixel binning strategies)
- Beam size measurement range from 2 µm (FWHM) to 10 mm (full width at 1/e²), supporting both single-mode and multimode source characterization
- 12-bit analog-to-digital conversion across all CCD variants, ensuring >40 dB dynamic range for accurate peak-to-background contrast analysis
- Integrated neutral density filter sets (ND8–ND1000) and Schott colored filters (NG4, NG9, NG10) for safe, spectrally optimized attenuation without saturation or nonlinear response
- USB 2.0 host interface with optional TCP/IP and RS232 communication paths for OEM integration and remote operation
- ActiveX control libraries enable seamless embedding into custom LabVIEW, MATLAB, or C# applications for automated test benches and production line validation
Sample Compatibility & Compliance
The BeamOn Series accommodates diverse laser sources including CW gas lasers (HeNe, Ar⁺), solid-state lasers (Nd:YAG, Yb:fiber), ultrafast oscillators (Ti:sapphire, Cr:forsterite), VCSELs, edge-emitting diodes, and IPL (intense pulsed light) systems. Each configuration meets optical safety Class 1 requirements when used with appropriate filtering. The system supports GLP/GMP-aligned workflows through timestamped measurement logs, user-accessible calibration certificates, and software audit trails. While not inherently 21 CFR Part 11 compliant out-of-the-box, the architecture permits integration with third-party electronic signature and data integrity modules required for regulated environments (e.g., medical laser manufacturing, aerospace component qualification). All optical components comply with RoHS directives, and mechanical housings meet IP52 ingress protection specifications for laboratory-grade durability.
Software & Data Management
DUMA’s proprietary BeamStudio software provides a unified GUI for acquisition, analysis, and reporting across all BeamOn models. It implements ISO 11146-conforming algorithms for beam width (D4σ), centroid position, ellipticity, kurtosis, and M² derivation. Raw image data is stored in lossless TIFF format with embedded metadata (wavelength, exposure time, filter ID, calibration date). Batch processing mode enables automated M² sweeps across predefined z-positions, with exportable CSV reports containing full statistical summaries (mean, std dev, min/max) per parameter. The software supports configurable pass/fail thresholds for SPC (statistical process control) monitoring and generates PDF-certified reports with digital signatures. For enterprise deployment, network licensing and centralized configuration management are available via optional server modules.
Applications
- Laser resonator alignment and cavity optimization in R&D laboratories
- Production-line verification of fiber-coupled diode modules and pump combiners
- M² certification for ISO 11146-compliant laser safety classification (IEC 60825-1)
- Characterization of ultrafast amplifier output beams prior to pulse compression
- Quantitative assessment of beam degradation due to thermal lensing or optical damage
- Validation of beam homogenizers, diffractive optical elements (DOEs), and microlens arrays
- Micro-optics alignment support for photonic integrated circuit (PIC) packaging
- Long-distance beam diagnostics in free-space optical communication testbeds (BeamOn Long-Bow variant)
FAQ
What beam parameters does the BeamOn Series measure?
It measures beam width (D4σ, knife-edge, 1/e²), centroid position (x₀, y₀), ellipticity, beam aspect ratio, peak intensity, total energy/power, beam propagation factor (M²), Rayleigh length, and divergence angle.
Is M² measurement fully automated?
Yes—BeamStudio performs automatic multi-position scanning, identifies the beam waist location, fits the hyperbolic fit curve, and computes M² with uncertainty estimation per ISO 11146.
Can the system handle high-power lasers?
Standard configurations include ND and Schott filters for safe attenuation; high-power variants (e.g., BeamOn LA, μBeam HP) integrate calibrated beam samplers (SAM-HP) for kW-class sources.
Which operating systems are supported?
Windows 7 (32/64-bit), Windows 8.x, and Windows 10 (64-bit); legacy support for Windows XP/Vista is maintained for older installations.
Is calibration traceable to national standards?
Yes—factory calibration uses NIST-traceable reference apertures and certified neutral density filters, with documentation provided per unit.
