Spectral Products ASB-XE-175EX 175W Xenon Arc Tunable Monochromatic Light Source

Overview

The Spectral Products ASB-XE-175EX is a high-intensity, computer-controlled tunable monochromatic light source engineered for precision spectroscopic applications requiring stable, narrowband illumination across the deep ultraviolet (UV), visible (VIS), and near-infrared (NIR) spectral regions. At its core, the system integrates a 175 W short-arc xenon lamp—selected for its high radiance, continuous spectrum from 200 nm to >2.2 µm, and excellent temporal stability—with a high-throughput Czerny–Turner monochromator (CM110, f/3.9). The monochromator employs precision-machined optics and dual-grating turret architecture, enabling rapid switching between spectral resolution and throughput optimization without realignment. Unlike broadband lamps used in general illumination, this source delivers spectrally isolated output with typical bandwidths adjustable down to <1 nm (dependent on grating groove density and slit width), making it suitable for absorption, fluorescence excitation, photochemical kinetics, and calibration of spectroradiometers and array detectors.

Key Features

• Stable 175 W xenon arc lamp with ≥500-hour rated lifetime (typical 1000 h), optimized for UV-rich output and low spatial drift
• CM110 monochromator featuring f/3.9 optical speed, kinematic grating mount, and motorized dual-grating turret for seamless spectral range and resolution adaptation
• Full bidirectional wavelength scanning via RS-232 interface, supporting user-defined units: nanometers (nm), angstroms (Å), wavenumbers (cm⁻¹), and photon energy (eV)
• Modular mechanical design permitting field upgrades—including fiber-optic coupling (via AFCM-L series adapters), external filter wheel integration (AB202 mount), and custom collimation optics
• Native compatibility with Spectral Products’ ecosystem: direct electrical and software interoperability with SP’s Oriel® instrumentation controllers and spectroscopy software suites
• Optional calibrated NIST-traceable spectral irradiance output characterization available upon request for metrology-grade applications

Sample Compatibility & Compliance

The ASB-XE-175EX is designed for laboratory-based optical characterization where spectral purity, irradiance stability, and repeatability are critical. It supports solid, liquid, and gas-phase samples mounted in standard cuvette holders, integrating seamlessly with commercial spectrophotometers, ellipsometers, and quantum efficiency measurement systems. The source complies with IEC 61000-4-3 (radiated immunity) and IEC 61326-1 (EMC for laboratory equipment). While not certified as a medical or industrial safety device, its enclosure meets UL 61010-1 requirements for electrical safety in measurement and control equipment. For GLP/GMP-regulated environments, audit-ready operation logs (including lamp-on time, scan history, and grating position) can be exported via serial protocol for traceability per FDA 21 CFR Part 11 when paired with validated third-party data acquisition software.

Software & Data Management

Control is implemented through ASCII-based serial commands over RS-232, enabling integration into LabVIEW™, Python (PySerial), MATLAB®, or custom C/C++ applications. Spectral Products provides the optional “Monochromator Control Utility” (MCU) software—a Windows-native application supporting automated wavelength sweeps, multi-point intensity mapping, and script-driven sequence execution. All scan parameters (start/stop wavelength, step size, dwell time, grating selection) are programmable and stored in non-volatile memory. Data export formats include CSV and plain-text log files with timestamped metadata. Firmware updates are performed via serial bootloader; version history and checksum verification ensure firmware integrity during maintenance cycles.

Applications

• UV-VIS-NIR absorbance and transmittance spectroscopy of thin films, nanoparticles, and biological chromophores
• Excitation spectroscopy for photoluminescence quantum yield (PLQY) and time-resolved fluorescence studies
• Calibration of charge-coupled device (CCD) and complementary metal-oxide-semiconductor (CMOS) detector responsivity
• Photochemical reaction monitoring under defined monochromatic irradiation (e.g., photocatalysis, solar fuel research)
• Optical filter transmission and blocking characterization per ISO 9050 and ASTM E275
• Development and validation of hyperspectral imaging systems requiring tunable reference illumination

FAQ

What is the typical spectral bandwidth achievable with the ASB-XE-175EX?

Bandwidth depends on selected grating, entrance/exit slit widths, and wavelength. With a 1200 g/mm grating and 10 µm slits, FWHM is approximately 0.8 nm at 500 nm.
Can the xenon lamp be replaced by the end user?

Yes—the ASB-XE-175EX features a front-access lamp housing with alignment pins and torque-spec socket; replacement requires lamp alignment verification using a HeNe laser or collimated beam profiler.
Is fiber coupling included standard?

No—fiber-optic output is optional and requires separate purchase of an AFCM-L adapter (e.g., AFCM-L-SM-SMA for single-mode SMA termination).
Does the system support synchronization with external detectors or shutters?

Yes—TTL-compatible trigger outputs (sync pulse, scan start/end) are provided via DB9 connector for hardware-level timing coordination.
Are NIST-traceable irradiance calibrations available?

Yes—calibration certificates with uncertainty budgets (k=2) covering 250–1800 nm are offered as a factory service option (lead time: 3–4 weeks).