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| Brand | Rtec |
|---|---|
| Origin | Switzerland |
| Model | UP Series |
| Measurement Principle | White-Light Interferometry |
| Product Type | Non-Contact Profilometer / Surface Roughness Analyzer |
| Standard Stage | 150 × 150 mm motorized XY stage (optional 210 × 310 mm) |
| Vertical Range | Up to 100 mm |
| Tilt Stage | ±6° |
| XY Stage Resolution | 0.1 µm |
| Imaging Modes | White-Light Interferometry, Rotating-Disk Confocal Microscopy, Dark-Field Microscopy, Bright-Field Microscopy |
| Sensor Heads | Sigma Head (WLI only), Lambda Head (WLI + Confocal + Dark-Field + Bright-Field) |
| Automated Stitching Capability | Yes |
| Software Compliance | ASTM E1250, ISO 25178-2, ISO 4287, USP <1059>, FDA 21 CFR Part 11 audit trail support |
| Brand | Rtec |
|---|---|
| Origin | Switzerland |
| Model | UP Series |
| Product Type | Non-contact Profilometer / Roughness Analyzer |
| Working Principle | White-light Interferometry |
| Camera Resolution | 5 MP Auto-Focus CCD |
| Lateral Sampling Resolution | Adjustable down to 0.05 µm |
| Optical Contrast Modes | Brightfield, Darkfield, Optical DIC |
| Objective Compatibility | Long-working-distance telecentric objectives |
| Application Scope | Transparent thin films, high-aspect-ratio structures, steep slopes, reflectivity-agnostic surface topography |
| Stability | High mechanical and thermal stability |
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