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| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | FASTSDD & DP5-X |
| Element Range | Li to U |
| Detection Limit | 1 ppm |
| Concentration Range | 1 ppm – 99% |
| Energy Resolution | <140 eV (at Mn Kα, 5.9 keV) |
| Count Rate Capability | >1,000,000 cps |
| Repeatability | ±0.1% RSD |
| Detector Type | Fast Silicon Drift Detector (FASTSDD) |
| Form Factor | Portable / Handheld-Compatible Integrated Detector System |
| Compliance | RoHS/WEEE-ready architecture |
| Application Domain | OEM Integration, Process Monitoring, Laboratory Research, Regulatory Screening |
| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | X-123FAST SDD (70 mm²) |
| Element Range | C (Z=6) to U (Z=92) with C₂ window |
| Detection Limit | 1 ppm – 99.99% |
| Energy Resolution | 123 eV FWHM at 5.9 keV |
| Count Rate Capability | >1,000,000 cps |
| Peak-to-Background Ratio | 26,000:1 |
| Window Options | 0.5-mil Be or C₂ (Si₃N₄) |
| Cooling ΔT | >85 K |
| Rise Time | <60 ns |
| Active Si Thickness | 500 µm |
| Collimated Effective Area | 50 mm² |
| Vacuum Compatibility | Yes |
| OEM Integration | Fully supported for XR100FAST, PX5, and X-123 platform configurations |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | MCA8000D |
| Detector Interface | Analog Pulse Input (Unipolar/Bipolar) |
| ADC | 100 MHz, 16-bit |
| Channel Count | Up to 8192 (8K) |
| Differential Nonlinearity | < ±0.6% |
| Integral Nonlinearity | < ±0.02% |
| Peak Pileup Rejection | Dual TTL-compatible Gate Inputs (GATE1/GATE2) |
| Communication Interfaces | USB 2.0 Full-Speed (12 Mbps), RS-232 (115 kbps), 10BASE-T Ethernet (10 Mbps) |
| Input Voltage Range | 0–1 V or 0–10 V (software-selectable) |
| Input Impedance | 1 kΩ or 100 kΩ (factory-configurable) |
| Minimum Pulse Height | 5 mV |
| Pulse Peaking Time | ≥500 ns (200 ns shaping) |
| Conversion Time | 10 ns |
| Sliding-Scale Linearization | Yes |
| Operating Temperature | –20 °C to +60 °C |
| Dimensions | 125 × 71 × 20 mm |
| Weight | 165 g |
| Power | +4–5.5 V DC, ≤2 W (USB or external AC/DC adapter) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | FASTSDD-70-1000 |
| Detector Type | Silicon Drift Detector (SDD) |
| Active Area | 70 mm² |
| Thickness | 1000 µm |
| Elemental Range | Be (Z=4) to U (Z=92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <140 eV at Mn Kα (5.9 keV) |
| Count Rate Capability | High-throughput fast pulse processing |
| Reproducibility | ≤0.1% RSD |
| Package | TO-8 metal can, pin-compatible with legacy 0.5 mm thick SDDs |
| Operating Voltage | Standard ±5 V analog output |
| Transmission Efficiency | Enhanced above 15 keV vs. thinner SDDs |
| Mounting Form Factor | Benchtop and floor-standing EDXRF systems |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | X-123 |
| Form Factor | Benchtop/Portable |
| Element Range | Na (11) – U (92) |
| Detection Limit | 1 ppm – 99.99% |
| Energy Resolution | 139–260 eV @ 5.9 keV |
| Repeatability | 0.1% |
| Detector | Si-PIN with Two-Stage Thermoelectric Cooling |
| Effective Area | 6–25 mm² |
| Thickness | 500 µm |
| Be Window | 12.5–25 µm |
| Operating Temperature Range | −30 °C to +80 °C |
| Power Consumption | 2.5 W (5 VDC, 300–800 mA) |
| Weight | 180 g |
| Dimensions | 70 × 100 × 25 mm |
| Interface | USB 2.0 (12 Mbps), RS-232 (115.2 kbps), Ethernet (10BASE-T) |
| Compliance | RoHS-compliant, UL 61010-1:2009, CAN/CSA-C22.2 No. 61010-1, TÜV Certified (CU 72101153 01) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Detector Active Area | 25 mm² (standard) or 70 mm² (optional) |
| Thickness | 1 mm |
| Element Range | Na (Z=11) to U (Z=92) |
| Detection Limit | 1 ppm |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα (5.89 keV) |
| Count Rate Capability | High-throughput fast pulse processing |
| Repeatability | ±0.1% RSD (relative standard deviation) |
| Package | TO-8 metal can, pin-compatible with legacy 0.5 mm SDDs |
| Operating Voltage | Standard ±5 V bias |
| Transmission Efficiency | Enhanced above 15 keV vs. thinner detectors |
| Detector Type | Silicon Drift Detector (SDD) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | XR-100CR |
| Pricing | Upon Request |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | PA-210/PA-230 |
| Power Supply Requirements | +5 VDC / −5 VDC (±50 mV ripple, 15 mA each) |
| HV Input Range | +100 to +200 V (Si-PIN), −90 to −260 V (SDD/CdTe) |
| TEC Drive | 3.5 V / 350 mA (max), <0.1 Vpp noise |
| Temperature Sensing | 160 µA-biased diode output (calibrated to 230 K minimum operating point) |
| Connector | 10-pin micro coaxial (0.025" pitch) |
| Mechanical Form Factors | Cylindrical (PA-210, Ø18 mm × 40 mm) and Flexible PCB-mount (PA-230) |
| Compliance | Designed for OEM integration into ISO/IEC 17025-compliant XRF, XRD, and EDX systems |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | Fast SDD |
| Energy Resolution (55Fe) | ≤121 eV FWHM |
| Maximum Count Rate | >1 Mcps |
| Peak-to-Background Ratio | 20,000:1 |
| Operating Temperature | <80 K (achieved with thermoelectric cooling at +30 °C ambient) |
| Package | TO-8 vacuum-sealed |
| Detector Type | Silicon Drift Detector (SDD) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | XRA-700 |
| Detector Channels | 7 |
| Cooling | Thermoelectric (Peltier) |
| Power Supply | Integrated regulated DC supply |
| Preamp | Low-noise charge-sensitive preamplifier per channel |
| Energy Range | 1 keV – 40 keV (dependent on detector configuration) |
| Compliance | RoHS, CE |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | OEM Solution |
| Form Factor | Benchtop / Portable |
| Industry Focus | Electronics |
| Elemental Range | Na (11) – U (92) |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV FWHM at Mn Kα |
| Repeatability | ≤0.1% RSD |
| Detector Type | X-ray Detector (Si-PIN, SDD, or CdTe) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | XR-100SDD |
| Detector Type | Silicon Drift Detector (SDD) |
| Active Area | 25 mm² |
| Thickness | 500 µm |
| Energy Resolution | 125 eV FWHM @ 5.9 keV (11.2 µs peaking time) |
| Max Count Rate | 500,000 cps |
| Peak-to-Background Ratio | 20,000:1 (5.9 keV / 1 keV) |
| Be Window Thickness | 12.5 µm (0.5 mil) |
| Cooling Method | Two-stage thermoelectric (Peltier), no liquid nitrogen required |
| Operating Temperature | ~250 K (−23 °C) |
| Housing | TO-8 metal can |
| Compliance | UL 61010-1:2004, CAN/CSA-C22.2 No. 61010-1:2004, TUV Certified (CU 72072412 02) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | C1/C2 |
| Window Substrate | Silicon Nitride (Si₃N₄) |
| Front Coating | Aluminum |
| Thickness | C1 ≈ 80 nm, C2 ≈ 150 nm |
| Compatible Detectors | SuperSDD®, standard SDDs (25 mm² / 50 mm² active area) |
| Energy Range Enhancement | Extended low-energy response down to boron (B, 183 eV) and carbon (C, 277 eV) |
| Compliance | RoHS-compliant, vacuum-compatible, TEM-grid compatible |
| Mounting | Standard 3.5 mm or 5.0 mm diameter window frames |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | XR-100FastSDD-70 |
| Active Area | 70 mm² (effective to 50 mm²) |
| Energy Resolution | 123 eV FWHM @ 5.9 keV |
| Max Count Rate | >2,000,000 cps |
| Peak-to-Background Ratio | >26,000:1 |
| Window Options | Be (12.5 µm) or Si₃N₄ (C₂) |
| Detector Thickness | 500 µm |
| Cooling ΔT | >85 K |
| Preamplifier Rise Time | <60 ns |
| Package | TO-8 |
| Certifications | UL 61010-1:2009, CAN/CSA C22.2 No. 61010-1, TUV CU 72101153 01 |
| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | X-123 FAST SDD C-Series Window |
| Detector Type | Silicon Drift Detector (SDD) with Si₃N₄/Al Thin-Film Window |
| Application Context | Low-Energy X-ray Detection (down to ~100 eV), Vacuum-Compatible & Ambient-Pressure Configurations |
| Compliance | ASTM E1598, ISO 21434 (X-ray instrumentation framework), Compatible with IEC 61000-4 Electromagnetic Immunity Standards |
| Software Interface | USB 2.0 / Ethernet |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | OEM System Package |
| Form Factor | Handheld or Benchtop Configurable |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Design | Electronics Manufacturing & RoHS Compliance |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα (5.9 keV) |
| Repeatability | ≤0.1% RSD (for major elements under controlled conditions) |
| Detector | Silicon Drift Detector (SDD) with Peltier cooling |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Detector Type | Silicon Pin Diode (SiPIN) and Fast Silicon Drift Detector (FASTSDD) with Boron Carbide (B4C) Window |
| Element Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Analytical Range | 1 ppm – 99.99% |
| Repeatability | ±0.1% RSD |
| Form Factor | Handheld/Portable Compatible |
| Compliance | RoHS-compliant, Be-free alternative per ASTM E1361 and ISO 18557 |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | XRT-450 |
| Target Anode | Ag (customizable) |
| Window | Be, 125 µm |
| Focal Spot Size | <150 µm FWHM |
| Beam Divergence | 120° |
| Operating Voltage | 5–50 kV |
| Max Tube Current | 250 µA |
| Max Output Power | 6 W |
| Input Voltage | 20 VDC |
| HV Polarity | Anode Grounded |
| Cooling | Conduction or Convection |
| Mounting | Threaded Nozzle |
| Weight | 400 g |
| Operating Temperature | –10 °C to +50 °C |
| Radiation Shielding Compliance | IEC 62495 |
| RoHS Compliance | RoHS3 |
| Warranty | 2 years or 4000 operating hours |
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