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| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | FASTSDD & DP5-X |
| Element Range | Li to U |
| Detection Limit | 1 ppm |
| Concentration Range | 1 ppm – 99% |
| Energy Resolution | <140 eV (at Mn Kα, 5.9 keV) |
| Count Rate Capability | >1,000,000 cps |
| Repeatability | ±0.1% RSD |
| Detector Type | Fast Silicon Drift Detector (FASTSDD) |
| Form Factor | Portable / Handheld-Compatible Integrated Detector System |
| Compliance | RoHS/WEEE-ready architecture |
| Application Domain | OEM Integration, Process Monitoring, Laboratory Research, Regulatory Screening |
| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | X-123FAST SDD (70 mm²) |
| Element Range | C (Z=6) to U (Z=92) with C₂ window |
| Detection Limit | 1 ppm – 99.99% |
| Energy Resolution | 123 eV FWHM at 5.9 keV |
| Count Rate Capability | >1,000,000 cps |
| Peak-to-Background Ratio | 26,000:1 |
| Window Options | 0.5-mil Be or C₂ (Si₃N₄) |
| Cooling ΔT | >85 K |
| Rise Time | <60 ns |
| Active Si Thickness | 500 µm |
| Collimated Effective Area | 50 mm² |
| Vacuum Compatibility | Yes |
| OEM Integration | Fully supported for XR100FAST, PX5, and X-123 platform configurations |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | FASTSDD-70-1000 |
| Detector Type | Silicon Drift Detector (SDD) |
| Active Area | 70 mm² |
| Thickness | 1000 µm |
| Elemental Range | Be (Z=4) to U (Z=92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <140 eV at Mn Kα (5.9 keV) |
| Count Rate Capability | High-throughput fast pulse processing |
| Reproducibility | ≤0.1% RSD |
| Package | TO-8 metal can, pin-compatible with legacy 0.5 mm thick SDDs |
| Operating Voltage | Standard ±5 V analog output |
| Transmission Efficiency | Enhanced above 15 keV vs. thinner SDDs |
| Mounting Form Factor | Benchtop and floor-standing EDXRF systems |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | X-123 |
| Form Factor | Benchtop/Portable |
| Element Range | Na (11) – U (92) |
| Detection Limit | 1 ppm – 99.99% |
| Energy Resolution | 139–260 eV @ 5.9 keV |
| Repeatability | 0.1% |
| Detector | Si-PIN with Two-Stage Thermoelectric Cooling |
| Effective Area | 6–25 mm² |
| Thickness | 500 µm |
| Be Window | 12.5–25 µm |
| Operating Temperature Range | −30 °C to +80 °C |
| Power Consumption | 2.5 W (5 VDC, 300–800 mA) |
| Weight | 180 g |
| Dimensions | 70 × 100 × 25 mm |
| Interface | USB 2.0 (12 Mbps), RS-232 (115.2 kbps), Ethernet (10BASE-T) |
| Compliance | RoHS-compliant, UL 61010-1:2009, CAN/CSA-C22.2 No. 61010-1, TÜV Certified (CU 72101153 01) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Detector Active Area | 25 mm² (standard) or 70 mm² (optional) |
| Thickness | 1 mm |
| Element Range | Na (Z=11) to U (Z=92) |
| Detection Limit | 1 ppm |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα (5.89 keV) |
| Count Rate Capability | High-throughput fast pulse processing |
| Repeatability | ±0.1% RSD (relative standard deviation) |
| Package | TO-8 metal can, pin-compatible with legacy 0.5 mm SDDs |
| Operating Voltage | Standard ±5 V bias |
| Transmission Efficiency | Enhanced above 15 keV vs. thinner detectors |
| Detector Type | Silicon Drift Detector (SDD) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | OEM Solution |
| Form Factor | Benchtop / Portable |
| Industry Focus | Electronics |
| Elemental Range | Na (11) – U (92) |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV FWHM at Mn Kα |
| Repeatability | ≤0.1% RSD |
| Detector Type | X-ray Detector (Si-PIN, SDD, or CdTe) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | OEM System Package |
| Form Factor | Handheld or Benchtop Configurable |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Design | Electronics Manufacturing & RoHS Compliance |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα (5.9 keV) |
| Repeatability | ≤0.1% RSD (for major elements under controlled conditions) |
| Detector | Silicon Drift Detector (SDD) with Peltier cooling |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Detector Type | Silicon Pin Diode (SiPIN) and Fast Silicon Drift Detector (FASTSDD) with Boron Carbide (B4C) Window |
| Element Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Analytical Range | 1 ppm – 99.99% |
| Repeatability | ±0.1% RSD |
| Form Factor | Handheld/Portable Compatible |
| Compliance | RoHS-compliant, Be-free alternative per ASTM E1361 and ISO 18557 |
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