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| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | XR-100CR |
| Pricing | Upon Request |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | Fast SDD |
| Energy Resolution (55Fe) | ≤121 eV FWHM |
| Maximum Count Rate | >1 Mcps |
| Peak-to-Background Ratio | 20,000:1 |
| Operating Temperature | <80 K (achieved with thermoelectric cooling at +30 °C ambient) |
| Package | TO-8 vacuum-sealed |
| Detector Type | Silicon Drift Detector (SDD) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | XRA-700 |
| Detector Channels | 7 |
| Cooling | Thermoelectric (Peltier) |
| Power Supply | Integrated regulated DC supply |
| Preamp | Low-noise charge-sensitive preamplifier per channel |
| Energy Range | 1 keV – 40 keV (dependent on detector configuration) |
| Compliance | RoHS, CE |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | XR-100SDD |
| Detector Type | Silicon Drift Detector (SDD) |
| Active Area | 25 mm² |
| Thickness | 500 µm |
| Energy Resolution | 125 eV FWHM @ 5.9 keV (11.2 µs peaking time) |
| Max Count Rate | 500,000 cps |
| Peak-to-Background Ratio | 20,000:1 (5.9 keV / 1 keV) |
| Be Window Thickness | 12.5 µm (0.5 mil) |
| Cooling Method | Two-stage thermoelectric (Peltier), no liquid nitrogen required |
| Operating Temperature | ~250 K (−23 °C) |
| Housing | TO-8 metal can |
| Compliance | UL 61010-1:2004, CAN/CSA-C22.2 No. 61010-1:2004, TUV Certified (CU 72072412 02) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | XR-100FastSDD-70 |
| Active Area | 70 mm² (effective to 50 mm²) |
| Energy Resolution | 123 eV FWHM @ 5.9 keV |
| Max Count Rate | >2,000,000 cps |
| Peak-to-Background Ratio | >26,000:1 |
| Window Options | Be (12.5 µm) or Si₃N₄ (C₂) |
| Detector Thickness | 500 µm |
| Cooling ΔT | >85 K |
| Preamplifier Rise Time | <60 ns |
| Package | TO-8 |
| Certifications | UL 61010-1:2009, CAN/CSA C22.2 No. 61010-1, TUV CU 72101153 01 |
| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | X-123 FAST SDD C-Series Window |
| Detector Type | Silicon Drift Detector (SDD) with Si₃N₄/Al Thin-Film Window |
| Application Context | Low-Energy X-ray Detection (down to ~100 eV), Vacuum-Compatible & Ambient-Pressure Configurations |
| Compliance | ASTM E1598, ISO 21434 (X-ray instrumentation framework), Compatible with IEC 61000-4 Electromagnetic Immunity Standards |
| Software Interface | USB 2.0 / Ethernet |
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