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| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | PHI 700 SAM |
| Price | Upon Request |
| Detection Limit | 0.1 at.% |
| Minimum Probe Spot Size | 6 nm |
| Information Depth | ≤ 5 nm |
| Elemental Coverage | All elements except H and He |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | PHI Quantera SXM |
| Price | USD 900,000 |
| Vacuum Base Pressure | <5×10⁻¹⁰ Torr |
| Ag 3d₅/₂ FWHM Energy Resolution | <0.50 eV |
| PET C1s (O=C–O) FWHM Energy Resolution | <0.85 eV |
| Minimum Monochromated X-ray Spot Size | 9.0 µm (X) × 9.0 µm (Y) |
| Typical X-ray Spot Sizes | 10.0 µm @ ≤1.25 W |
| XPS Sensitivity | >125 kcps @ 20.0 µm, <1.00 eV resolution |
| Ion Gun Max Current | >5.0 µA at 5 kV |
| Ion Sputtering Pressure | <5×10⁻⁸ Torr during operation |
| Analysis Chamber Material | UHV-compatible stainless steel |
| Ion Pump Speed | 360 L/s (with Ti sublimation pump) |
| Software | MultiPeak™, CasaXPS-compatible data processing suite (peak fitting, least-squares deconvolution, multivariate analysis, chemical-state imaging, line scan extraction, depth profile quantification) |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | VersaProbe III |
| Price | USD 950,000 (FOB Yokohama) |
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