HORIBA
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| Brand | HORIBA |
|---|---|
| Origin | Canada |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Category | Imported Instrument |
| Model | QuantaMaster 8000 |
| Wavelength Range | UV–NIR (up to 5500 nm) |
| Monochromator Type | Triple-grating Czerny-Turner with 300 mm focal length |
| Slit Resolution (Spectral Bandpass) | 0.01 nm |
| Optical Resolution | 0.1 nm |
| Sensitivity | >30,000:1 (Water Raman SNR) |
| Wavelength Accuracy | ±0.3 nm |
| Excitation Sources | Up to 4 integrated sources including PowerArc™ Xe lamp and pulsed lasers (210–2200 nm) |
| Detection Channels | 6 configurable PMT/InGaAs/MCT channels |
| Lifetime Techniques | TCSPC, Strobe, SSTD (Single-Shot Time-Domain), up to 5500 nm |
| Automation | Fully motorized gratings, slits, mirrors, filter wheels, and accessory control via FelixGX software |
| Brand | HORIBA |
|---|---|
| Origin | France |
| Manufacturer Type | Manufacturer |
| Import Status | Imported |
| Model | RZ-660 |
| Price | Upon Request |
| Spectral Range | 680 – 3,800 cm⁻¹ |
| Spatial Resolution | < 5 µm |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported Instrument |
| Model | SA-9650 |
| Instrument Type | Specific Surface Area Analyzer |
| Measurement Principle | Dynamic Flow Method (Gas Adsorption) |
| Number of Analysis Stations | 1–3 |
| Specific Surface Area Range | 0.10 to >2000 m²/g |
| Repeatability | RSD < 1% |
| Brand | HORIBA |
|---|---|
| Origin | France |
| Manufacturer Type | Manufacturer |
| Import Status | Imported |
| Model | Signature SPM |
| Instrument Category | Atomic Force Microscope |
| Instrument Type | Materials-Focused AFM |
| Spectroscopy Integration | Confocal Raman & Photoluminescence (PL) |
| Core Capability | True Co-Localized Multimodal Imaging (Topography + Nanomechanics + Electrostatics + Magnetism + Chemical Fingerprinting) |
| Scanner Range | 100 × 100 × 15 µm |
| Optical Access | Dual-Path, IR AFM Laser (1310 nm) + Visible/NIR Excitation Lasers (e.g., 532 nm, 638 nm, 785 nm) |
| Spectrometer | Achromatic, >95% Reflectivity, Triple-Grating Support (150–6000 cm⁻¹) |
| Software Feature | “Probe Away” / “Probe Back” Automated Tip Retraction & Re-Registration |
| Compliance | Designed for GLP/GMP-adjacent research environments |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | SLFA-60 |
| Detection Target | Total Sulfur |
| Measurement Principle | X-ray Fluorescence (XRF) Spectrometry |
| Detection Range | 0–10 wt% S |
| Detection Limit | 5 ppm |
| Precision | ±5 ppm (at 1.0% S), ±1.6 ppm (at 0% S) |
| Sample Volume | 4–10 mL per analysis |
| Measurement Time | Adjustable from 10 to 600 seconds |
| Sample Capacity | 8-position automated rotary stage |
| Sample Holder | Disposable liquid-specific film-bottom cup |
| Calibration Flexibility | Up to 20 calibration points across 5 stored curves (linear/nonlinear) |
| Environmental Operating Range | 5–35 °C, 30–85% RH |
| Power Supply | AC 100–240 V ±10%, 50/60 Hz |
| Power Consumption | 150 VA |
| Interface | RS-232C standard serial port |
| Dimensions | 430 × 500 × 230 mm |
| Weight | ~24 kg |
| Compliance | ASTM D4294, ISO 8754, JIS K2541 & B7995, GB/T 17040–1997, GB/T 17060–1998, SN/T 0509–1995 |
| Brand | HORIBA |
|---|---|
| Origin | France |
| Model | Smart SE |
| Spectral Range | 450–1000 nm |
| Spot Size Options | Multiple Micro-Spot Sizes with Real-Time Visual Observation |
| Incidence Angle | Variable (Motorized Multi-Angle Capability) |
| Measurement Speed | Full-Spectrum Acquisition in <1 Second |
| Single-Measurement Time | <2 s (Typical, Including Stage Positioning) |
| Sample Stage | Motorized XYZ Translation (200 mm × 200 mm Travel, Z-Travel >35 mm) |
| Detector | CCD-Based Spectral Analyzer |
| Modulation Technology | Liquid Crystal Variable Retarder (LCVR), No Moving Parts in Optical Path |
| Configuration Flexibility | Supports Both In-Line Process Integration and Stand-Alone Lab Use |
| Compliance | Designed for ISO/IEC 17025-Compatible Metrology Environments |
| Software | HORIBA DeltaPsi² Platform with Audit Trail, User Access Control, and Exportable Raw Data (CSV, XML, HDF5) |
| Brand | HORIBA |
|---|---|
| Origin | France |
| Model | Smart SE |
| Measurement Speed | 5 s (typical), down to 1 s (max) |
| Wavelength Range | 450–1000 nm |
| Spot Sizes | 7 selectable configurations (e.g., 75 µm × 150 µm to 500 µm × 500 µm) |
| Software | DeltaPsi² v5.x (Windows-based) |
| Compliance | Designed for GLP/GMP-aligned workflows |
| Brand | HORIBA |
|---|---|
| Origin | USA |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | Symphony CCD |
| Price | Upon Request |
| Brand | HORIBA |
|---|---|
| Origin | USA |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | Synapse Plus High-Speed CCD |
| Pricing | Upon Request |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | SZ-100 V2 |
| Dispersion Method | Wet Dispersion |
| Instrument Type | Laboratory Laser-Based Particle Characterization System |
| Size Range | 0.3 nm – 10 µm |
| Reproducibility | ±2% |
| Measurement Time | < 2 min |
| Zeta Potential Range | −500 mV to +500 mV |
| Molecular Weight Range | 1,000 – 2×10⁷ Da |
| Detection Angles | 90° and 173° (automatically or manually selectable) |
| Sample Volume | 12 µL – 1,000 µL |
| Measurement Principle for Size | Dynamic Light Scattering (DLS), also known as Photon Correlation Spectroscopy (PCS) |
| Zeta Potential Principle | Laser Doppler Electrophoresis |
| Molecular Weight Determination | Debye Plot Analysis |
| Second Virial Coefficient (A₂) | Yes |
| Integrated Auto-Titrator | Yes (for pH-controlled zeta potential studies) |
| Compliance | NIST-traceable calibration with 100 nm standard particles |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | TCA-51d / TCA-51p |
| Explosion Protection | Ex d IIB+H2 T4 / Ex px d IIC T4X |
| Detection Principle | Thermal Conductivity |
| Measurands | H₂, O₂ |
| Range | 0–10 to 0–100 vol% (H₂), 0–5 to 0–25 vol% (O₂) |
| Repeatability | ±0.5% F.S. (standard range) |
| Linearity | ±1.0% F.S. |
| Zero Drift | ±1.0% F.S./week (standard range) |
| Span Drift | ±2.0% F.S./week (standard range) |
| Response Time (T90) | ≤20 s |
| Sample Flow Rate | 300–1500 mL/min |
| Operating Pressure | ≥1.98 kPa (TCA-51d), ≥14.7 kPa (TCA-51p) |
| Wetted Materials | SUS304, SUS316, FKM, Pt, Au, SiO₂, Borosilicate Glass |
| Compliance | IEC 60079-0, IEC 60079-1 (Ex d), IEC 60079-2 (Ex p), ATEX Directive 2014/34/EU, UKCA |
| Brand | HORIBA |
|---|---|
| Origin | USA |
| Manufacturer Type | Manufacturer |
| Import Status | Imported |
| Model | Tunable PowerArc / Tunable KiloArc |
| Output Power (Tunable PowerArc) | Up to 20 mW (wavelength-, grating-, and bandwidth-dependent) |
| Output Power (Tunable KiloArc) | >300 mW (wavelength-, grating-, and bandwidth-dependent) |
| Beam Divergence | 14.5° (PowerArc) / 14.4° (KiloArc) |
| Numerical Aperture (N.A.) | 0.12 |
| Optical Noise | 0.07% RMS |
| Power Stability | ±0.2% (over 8 hours, temperature-controlled environment) |
| Spectral Range | 180–2200 nm |
| Bandwidth Tunability | 0–25 nm (continuously adjustable) |
| Lamp Options | 75 W to 1000 W Xenon arc lamps |
| Brand | HORIBA |
|---|---|
| Origin | France |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Ultima Expert |
| Instrument Type | Sequential Scanning ICP-OES |
| Detection Limit | Not Specified |
| Precision (RSD) | ≤1% |
| Long-Term Stability (RSD) | ≤2% |
| Wavelength Range | 160–800 nm |
| Optical Resolution | ≤0.005 nm at 200 nm (Constant Resolution Across Full Range) |
| Brand | HORIBA |
|---|---|
| Origin | France |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported Instrument |
| Model | UVISEL |
| Pricing | Available Upon Request |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | VA-5000 |
| Detection Range | CO, CO₂, NOₓ, SO₂, CH₄, C₂H₄, N₂O, O₂ |
| Repeatability | ±1.0% F.S. |
| Brand | HORIBA |
|---|---|
| Origin | USA |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | ViewSizer 3000 |
| Pricing | Upon Request |
| Dispersion Method | Wet Dispersion |
| Measurement Range | 10 nm – 15 µm |
| Repeatability | Not Specified |
| Measurement Time | 6 min |
| Brand | HORIBA |
|---|---|
| Origin | France |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model Series | VS20 |
| Resolution | ≤6.5 nm (with 50 µm slit) |
| Stray Light | <0.25% @ 260 nm, <0.1% @ 400 nm, <0.2% @ 600 nm |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-5200WR |
| Sample Environment | Air (Atmospheric) |
| Elemental Range | Na to U |
| Quantification Range | 1 ppm – 99.99% |
| Operating Conditions | 50 kV / 1 mA |
| Repeatability | ±0.1% RSD |
| Spot Size | Standard 400 µm, Optional 10 µm |
| Detector | Silicon Drift Detector (SDD), LN2-free |
| Geometry | Coaxial Optical Microscope Integration |
| Analysis Mode | Non-destructive, No Vacuum Required, No Sample Preparation |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-7000V |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Source | Rh anode, 50 kV / 1 mA |
| Spatial Resolution | Down to 10 µm |
| Measurement Range | Na (11) to U (92) |
| Vacuum Modes | Full vacuum & local vacuum (switchable in <5 s) |
| Optical Imaging | Co-axial CCD with macro/micro view |
| Sample Chamber | 300 mm × 300 mm × 80 mm (full vacuum), XY stage: 100 mm × 100 mm |
| Software | SmartMap™ for hyperspectral mapping, INCA™ pulse processor, GLP-compliant data handling |
| Quantification Methods | Fundamental Parameters (FP), single-standard FP, calibration curve, multilayer thin-film analysis (nm–µm scale) |
| Elemental Mapping | Pixel-resolved full-spectrum acquisition, offline reprocessing, RGB overlay, line scan, ROI masking |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-7200WR |
| Detection Principle | Energy Dispersive X-Ray Fluorescence (ED-XRF) |
| Spot Size Range | 10 µm to 1.2 mm |
| Detector Type | Silicon Drift Detector (SDD), Liquid-Nitrogen-Free |
| Maximum Scan Area | 10 cm × 10 cm |
| Optical-Element Image Co-Registration | Yes |
| Elemental Mapping Resolution | ≤10 µm |
| Compliance | ASTM E1621, ISO 8256, IEC 62321-5 (RoHS), USP <232>/<233>, GLP/GMP-ready data audit trail |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | XGT-9000 |
| Excitation Mode | Single-Wavelength Excitation |
| X-ray Tube Power | 50 W |
| Voltage Range | Up to 50 kV |
| Current Range | Up to 1000 µA |
| Elemental Coverage | Na (11) to U (92) |
| Minimum Spot Size | ≥10 µm |
| Optional Capillary Probes | 15 µm and 100 µm |
| Detector Configuration | Dual-mode — Energy-Dispersive XRF + Transmission X-ray Imaging |
| Sample Chamber Flexibility | Up to 4 configurable measurement atmospheres (air, He, vacuum, N₂) |
| Software Platform | HORIBA X-RAY LAB |
| Brand | HORIBA |
|---|---|
| Origin | France |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | XploRA Nano |
| Instrument Type | Confocal Micro-Raman Spectrometer with Integrated Atomic Force Microscopy |
| Spectral Range | 50–9000 cm⁻¹ |
| Spectral Resolution | 1 cm⁻¹ |
| Spatial Resolution (TERS mode) | <10 nm |
| Minimum Wavenumber | 50 cm⁻¹ |
| Spectral Reproducibility | <0.1 cm⁻¹ |
| Brand | HORIBA |
|---|---|
| Origin | France |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | XploRA PLUS |
| Instrument Type | Confocal Micro-Raman Spectrometer |
| Spectral Range | 50–9000 cm⁻¹ |
| Spectral Resolution | 1 cm⁻¹ |
| Spatial Resolution | Lateral 0.4 µm, Axial 1.5 µm |
| Minimum Wavenumber | 50 cm⁻¹ |
| Spectral Reproducibility | ≤ ±0.03 cm⁻¹ |
| Brand | HORIBA |
|---|---|
| Origin | USA |
| Manufacturer Type | Manufacturer |
| Import Status | Imported |
| Model | InverTau |
| Pricing | Upon Request |
| Dispersive Element | Filter-Based |
| Resolution | 4096 × 4096 |