NanoMEGAS
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| Brand | NanoMEGAS |
|---|---|
| Origin | Belgium |
| Model | ADT-3D |
| Compatible TEM Voltage | 120–300 kV |
| Compatible Sources | LaB6, W, FEG |
| Minimum Crystal Size (Organic) | ~100 nm |
| Minimum Crystal Size (Inorganic) | ~20 nm |
| Tilt Range (Cell Parameter Determination) | −15° to +15°, 1° step |
| Recommended Tilt Range (Structure Solution) | −45° to +45°, 1° step or continuous rotation (MicroED) |
| Data Acquisition Modes | Manual or automated PED |
| Detector Compatibility | CCD cameras ≥1k × 1k resolution |
| Sample Holder Support | Single-tilt, tomography, cryo holders |
| Output | 3D reciprocal space reconstruction, unit cell parameters (2–5% error), space group assignment, integrated 3D reflection intensities |
| Compliance | Fully compatible with standard TEM workflows under GLP-aligned data handling practices |
| Brand | NanoMEGAS |
|---|---|
| Origin | Belgium |
| Model | ASTAR® |
| Compatibility | 120–300 kV TEM (including Cs-corrected FEG-TEM) |
| Spatial Resolution | 1–4 nm (FEG-TEM), <10 nm (LaB₆ TEM) |
| Acquisition Speed | Up to >1000 fps (with direct electron detectors) |
| PED Tilt Angle Range | 0.2°–2.5° |
| Output Data Types | Orientation Maps, Phase Maps, Correlation Index, Confidence Index, Virtual BF/DF Images, Grain Boundary Networks, Pole Figures, Strain-Compatible Integration (with TopSPIN) |
| Compliance | Fully compatible with GLP/GMP workflows requiring audit trails |
| Brand | NanoMEGAS |
|---|---|
| Origin | Imported (Non-China) |
| Manufacturer Type | Authorized Distributor |
| Model | DigiSTAR |
| Pricing | Upon Request |
| Brand | NanoMEGAS |
|---|---|
| Origin | Belgium |
| Model | TopSPIN STRAIN |
| Application | Automated High-Resolution Strain Mapping in Scanning Transmission Electron Microscopy (STEM) using 4D Scanning Precession Electron Diffraction (4D-SPED) |
| Spatial Resolution | 2–3 nm (FEG-TEM) |
| Strain Sensitivity | < 2 × 10⁻⁴ |
| Typical Acquisition Time | 5–10 min (150 × 150 pixels) |
| Pixel Dwell Time | 10–40 ms |
| Strain Quantification Accuracy | ±0.02% (at 200 kV FEG-TEM) |
| Analysis Engine | AppFive proprietary algorithm |
| Output Modalities | Point, line, and 2D strain tensor maps (εₓₓ, ε_zz, ε_xz), orientation/phase/strain/STEM co-registration |
| Brand | NanoMEGAS |
|---|---|
| Origin | Belgium |
| Model | TOPSPIN |
| Application | Precession Electron Diffraction (PED)–Enabled 4D-STEM Acquisition |
| Integration | DigiSTAR Beam Control & Direct Electron Detection |
| Compliance | TEM/STEM-Compatible with ASTAR & STRAIN Software Ecosystem |