Neaspec
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| Brand | Neaspec |
|---|---|
| Origin | Germany |
| Configuration | Near-field infrared and terahertz pump-probe nanoscopy system with visible–NIR excitation and mid-IR/THz detection |
| Spatial Resolution | 20–50 nm |
| Temporal Resolution | down to 50 fs |
| Probe Spectral Ranges | 650–2200 cm⁻¹ (mid-IR) or 0.5–2 THz |
| Pump Laser Compatibility | tunable visible to near-infrared sources |
| Brand | Neaspec |
|---|---|
| Origin | Germany |
| Model | o-FTIR |
| Instrument Type | Laboratory-based FTIR Spectrometer |
| Spatial Resolution | 10 nm |
| Spectral Resolution | 3.0 cm⁻¹ |
| Acquisition Speed | 3 spectra/s |
| Signal-to-Noise Ratio | 80:1 |
| Spectral Range | 0.5–20 µm (Visible to Mid-IR) |
| Illumination Mode | Reflection-mode AFM tip illumination |
| Detection | Interferometric scattering near-field detection with background-free architecture |
| Brand | Neaspec |
|---|---|
| Origin | Germany |
| Model | neaSCOPE |
| Detection Principle | Scattering-type Near-field Optical Microscopy (s-SNOM) |
| Spatial Resolution | <10 nm (wavelength-independent) |
| Spectral Range | Visible, Mid-IR (2.5–20 µm), THz (0.1–10 THz), Ultrafast (fs pump-probe) |
| Compatible Modalities | nano-FTIR, TERS, ultrafast s-SNOM, cryo-s-SNOM, THz-s-SNOM, polarization-resolved s-SNOM |
| AFM Integration | Fully integrated high-stability atomic force microscope with tapping, contact, and non-contact modes |
| Environmental Options | Ambient, vacuum, cryogenic (down to 4 K) |
| Software Platform | neaSCAN v5.x with guided workflow, real-time FFT processing, GLP-compliant audit trail, and 21 CFR Part 11-ready user access control |
| Brand | Neaspec |
|---|---|
| Origin | Germany |
| Model | neaSNOM |
| Application Range | Visible to THz |
| Spatial Resolution | <10 nm |
| Detection Method | Pseudo-Heterodyne Interferometric s-SNOM |
| Compatible Modes | nano-FTIR, TERS, Ultrafast Spectroscopy, THz Imaging |
| Brand | Neaspec |
|---|---|
| Origin | Germany |
| Model | THz-NeaSNOM |
| Spatial Resolution | <30 nm |
| THz Frequency Range | 0.1–3 THz |
| Compatible Light Source | Femtosecond Laser for THz-TDS |
| AFM Probe Compatibility | Commercial tapping-mode AFM probes |
| Optical Collection | Broadband Parabolic Mirror Optics |
| Application Domain | Nanoscale Semiconductor Metrology, Ultrafast Carrier Dynamics, 2D Material Characterization |