Sinton Instruments
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| Brand | Sinton Instruments |
|---|---|
| Origin | USA |
| Model | WCT-120 |
| Minority Carrier Lifetime Range | 0.1 µs – 15 ms |
| Penetration Depth | 3 mm |
| Sample Diameter | up to 210 mm |
| Resistivity Measurement Range | 0.15 – 300 Ω·cm |
| Test Material | Silicon Wafers |
| Brand | Sinton Instruments |
|---|---|
| Origin | USA |
| Model | WCT-120MX + Suns-VocMX |
| Minority Carrier Lifetime Range | 0.1 µs – 15 ms |
| Penetration Depth | 3 mm |
| Sample Diameter | Up to 230 mm |
| Resistivity Range | 0.15 – 300 Ω·cm |
| Material Compatibility | Silicon wafers |
| Brand | Sinton Instruments |
|---|---|
| Origin | USA |
| Model | WCT-120MX + Suns-VocMX |
| Minority Carrier Lifetime Range | 0.1 µs – 15 ms |
| Penetration Depth | 3 mm |
| Maximum Sample Diameter | 230 mm |
| Resistivity Range | 0.15 – 300 Ω·cm |
| Compatible Material | Silicon wafers |
| Brand | Sinton Instruments |
|---|---|
| Origin | USA |
| Model | WCT-120PL |
| Measurement Principle | Quasi-Steady-State Photoconductance (QSSPC) & Contactless Photoluminescence (PL) |
| Compliance | ASTM F1534, ISO 17987 (applicable to silicon wafer characterization), GLP-aligned data traceability |