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Bruker AXS Inc. (X-ray Products and Electron Microscopy Analytical Instruments)

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BrandBruker
OriginGermany
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
ModelQUANTAX xsense
PricingUpon Request
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BrandBruker
OriginGermany
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
ModelQUANTAX EBSD
PricingUpon Request
CCD Camera Resolution640 × 480 pixels
Maximum Stage Speed10 mm/s
Spatial Resolution1.5 nm
Angular Resolution0.1°
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BrandBruker
OriginGermany
Manufacturer TypeAuthorized Distributor
Import StatusImported
ModelQUANTAX ED-XS
CCD Camera Resolution640 × 480 pixels
Maximum Stage Speed10 mm/s
Spatial Resolution50 nm
Angular Resolution0.2°
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BrandBruker
OriginUSA
ModelPI 89 AUTO
Application DomainIn situ SEM-integrated nanomechanical characterization
Automation LevelFully motorized stage + patented dual-axis rotation/tilt (R/T) mechanism
Software PlatformTriboScan Auto v5.0+
Compliance FrameworkDesigned for GLP-compliant workflows
Sample EnvironmentCompatible with standard high-vacuum and low-vacuum SEM chambers (FEI, Thermo Fisher, Zeiss, JEOL)
Maximum Load ResolutionSub-100 nN
Displacement Resolution< 0.05 nm
Stage Precision±50 nm positional repeatability over 10 mm × 10 mm travel range
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BrandBruker
OriginGermany
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
ModelQUANTAX XTrace
PricingAvailable Upon Request
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BrandBruker
OriginUSA
ModelHysitron PI 89
ApplicationIn-situ nanomechanical testing inside SEM and FIB/SEM chambers
Sensing PrincipleCapacitive displacement sensing with sub-nanometer resolution
ActuationElectromechanical force actuation
Force RangeUp to 100 mN (standard configuration)
Displacement Resolution< 0.2 nm
Positioning Accuracy≤ 50 nm (with integrated linear encoder and motorized tilt/rotate stages)
CompatibilityFully compatible with FEI/Thermo Fisher, Zeiss, JEOL, and Hitachi SEM/FIB platforms
Analytical IntegrationSynchronized acquisition with EBSD, EDS, BSE, and TKD detectors
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BrandBruker
OriginGermany
ModelQuantax XFlash Series
Energy Resolution<129 eV
Peak-to-Background Ratio20,000:1
Maximum Count Rate1,500 kcps
Elemental Detection RangeBe to Cf
Detector Active Area10–300 mm²
Window OptionsUltrathin Polymer Window or Windowless Configuration
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BrandBruker
OriginGermany
ModelESPRIT QUBE
CompatibilityIntegrated with Bruker e-Flash EBSD detectors and QUANTAX EDS systems
Data Format SupportHDF5, .ctf, .ang, .h5ebsd, .edax, .oxford, .bmp, .tiff
LicensingConcurrent or node-locked perpetual license
System RequirementsWindows 10/11 (64-bit), ≥32 GB RAM, ≥2 TB SSD storage recommended, NVIDIA GPU with ≥8 GB VRAM (CUDA 11.2+)
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BrandBruker
OriginGermany
Product TypeImported Software for Electron Microscopy
ModelESPRIT 2
Price RangeUSD 25,000 – 65,000
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BrandBruker
OriginGermany
ModelQUANTAX FlatQUAD
Energy Resolution<129 eV
Peak-to-Background Ratio20,000:1
Maximum Count Rate4,000 kcps
Elemental Detection RangeBoron (B) to Californium (Cf)
Detector Active Area10–300 mm²
Window TypeWindowless
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BrandBruker
OriginGermany
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
Model SeriesQUANTAX Transmission Electron Microscopy (TEM/STEM) EDS
Energy Resolution<129 eV
Peak-to-Background Ratio20,000:1
Maximum Count Rate1500 kcps
Elemental Detection RangeBe to Cf
Detector Active Area10–300 mm²
Window OptionsPolymer Ultrathin Window or Windowless
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BrandBruker
OriginGermany
Manufacturer TypeAuthorized Distributor
Product OriginImported
ModelOPTIMUS 2 QUANTAX EBSD eflash FS
CCD Camera Resolution640 × 480
Maximum Stage Speed10 mm/s
Spatial Resolution1.5 nm
Angular Resolution0.2°
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BrandBruker
OriginGermany
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
ModeleWARP
QuotationUpon Request
Maximum Pattern Acquisition Rate14,400 patterns/second
Spatial Resolution20 nm
Angular Resolution0.1°
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