Chemical Analysis Instruments
Filter
Showing 3331–3360 of 4337 results
| Brand | SPEC (Beijing Spark) |
|---|---|
| Origin | Beijing, China |
| Model | SPEC-3015V |
| Instrument Type | Magnetic Resonance Imaging (MRI) System |
| Sample Compatibility | Solid–Liquid Dual-Phase Core Samples |
| Operating Mode | Pulsed Fourier Transform (PFT) |
| Magnet Bore Diameter | 300 mm |
| Field Strength Range | 0.05–1.5 T (Tunable) |
| Maximum Operating Temperature | 150 °C |
| Maximum Confining Pressure | 100 MPa |
| Supported Nuclei | ¹H, ²³Na, ¹⁹F, ¹³C |
| Cryogen Requirement | Cryogen-Free (Zero-Liquid-Helium) |
| Brand | Specim (Finland) |
|---|---|
| Origin | Finland |
| Model | AFX10 / AFX17 |
| Spectral Range | AFX10 — 400–1000 nm (Vis-NIR), AFX17 — 900–1700 nm (NIR) |
| Spatial Resolution | Up to 1280 pixels across track |
| Frame Rate | Up to 300 fps (configurable) |
| Integration | GNSS/IMU-aided georeferencing |
| Platform Compatibility | UAVs (multirotor, fixed-wing), light aircraft |
| Onboard Processing | Embedded real-time data acquisition & preprocessing unit |
| Data Output Format | ENVI-compatible raw and radiometrically calibrated cubes (.bil/.hdr) |
| Weight | < 2.5 kg (full integrated system) |
| Origin | Finland |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CNT-NIR Series |
| Price | Upon Request |
| Origin | Finland |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Imspector Series |
| Pricing | Available Upon Request |
| Brand | Specim (Finland) |
|---|---|
| Origin | Finland |
| Model | Specim IQ |
| Form Factor | Handheld |
| Spectral Range | 400–1000 nm |
| Spatial Resolution | 512 × 512 pixels |
| Field of View (TFOV) | 31° × 31° |
| Interface | USB 3.0, Wi-Fi |
| Onboard Processing | Integrated ARM-based computing platform |
| Storage | Removable microSD card (UHS-I compatible) |
| Battery | Rechargeable Li-ion (up to 90 min continuous operation) |
| Environmental Rating | IP54 (dust- and splash-resistant) |
| Compliance | CE, FCC, RoHS |
| Brand | Specim (Finland) |
|---|---|
| Origin | Finland |
| Model | SPECIMONE |
| Operating Principle | Push-broom |
| Imaging Method | Dispersive |
| Deployment | Ground-based |
| Spectral Range | 400–1000 nm |
| Spectral Resolution | 2 nm |
| Spatial Resolution | 1280 × 1024 pixels |
| Total Field of View (TFOV) | 8° |
| Instantaneous Field of View (IFOV) | 0.18 mrad |
| Frame Rate | 15 fps |
| Certification | CE, FCC, RoHS3 |
| Operating Temperature | −10 °C to +60 °C |
| Operating Humidity | 95% RH (at 40 °C, non-condensing) |
| Data Interface | GigE Vision (RGB8, Mono12, Mono12packed), USB 3.0, RS-232/485, CAN |
| Embedded Platform | NVIDIA Jetson AGX Xavier SoC |
| Onboard Storage | 256 GB |
| Dimensions | 190 × 300 × 90 mm |
| Weight | 4.6 kg |
| Compatible Cameras | Specim FX10, FX17, FX50 |
| OS | Specim CameraOS |
| Web UI | CameraOS webUI |
| Data Format | ENVI-compatible Specim native format |
| Origin | Finland |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | V10E Series |
| Pricing | Available Upon Request |
| Spectral Range | 400–1000 nm |
| Spectral Resolution | 2.8–3.2 nm |
| Spectral Sampling Interval | 0.63–5.8 nm |
| Effective Slit Length | 8.7–11.84 mm |
| Optical Throughput | >50% |
| Relative Aperture | F/2.4 |
| Slit Width | 30 µm |
| Stray Light | ≤0.5% |
| Spectral Bands | 100–300 |
| Sensor Type | CMOS |
| Pixel Array | 1024×1024 to 1600×1200 |
| Pixel Size | 6.45–10.6 µm |
| A/D Conversion | 12-bit |
| Dynamic Range | 60 dB to >1,500:1 |
| Frame Rate (Full Resolution) | 8.9–33 fps |
| Frame Rate (Binned) | up to 120 fps |
| Exposure Time | 0.001–120,000 ms |
| Interface | USB / IEEE 1394 / Ethernet / Camera Link |
| Lens Mount | C-Mount |
| Brand | SPECREATION |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic |
| Model | CP-EFlat |
| Price Range | USD 70,000 – 125,000 |
| Optical Design | Grazing-Incidence Concave Varied-Line-Spacing (VLS) Flat-Field Spectrograph |
| Detector Type | CCD (Charge-Coupled Device) |
| Wavelength Range | 1–200 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ±0.05 nm |
| Spectral Bandwidth | 0.1–5.0 nm (adjustable) |
| Stray Light | ≤0.01% T |
| Slit Width | 0.05–0.5 mm (motorized, continuous adjustment) |
| Flat-Field Imaging Area | 25 mm |
| Vacuum Performance | ≤1×10⁻⁴ Pa (UHV option available: ≤1×10⁻⁸ Pa) |
| Grating Options | 120, 300, 1200, 2400 g/mm (dual-grating vacuum-compatible turret mount) |
| Resolution (FWHM) | 0.01–0.3 nm (grating-dependent) |
| Zero-Order Blocker | Standard |
| Filter Holder | Standard |
| Laser Alignment Aid | Integrated visible (635 nm) alignment diode |
| Software Control | LabVIEW-based platform with wavelength calibration traceability to NIST-traceable emission lines |
| Brand | SPECREATION |
|---|---|
| Origin | Anhui, China |
| Model | TableXAFS-3000 |
| X-ray Source Power | 2.0 kW Mo anode with high-performance power supply (optional foreign source upgrade) |
| Monochromatic X-ray Photon Flux | 2.5 × 10⁶ photons/s |
| Minimum Detectable Elemental Concentration | < 0.5 wt% |
| Tunable X-ray Absorption Energy Range | 4.5–20 keV |
| Brand | SPECREATION |
|---|---|
| Model | TableXAFS-500 |
| Origin | Anhui, China |
| X-ray Source Power | 1.2 kW |
| Monochromatic Photon Flux | 500,000–1,000,000 photons/sec @ 9 keV |
| Detectable Elemental Concentration Limit | ≥1 wt% |
| Tunable X-ray Energy Range | 5–20 keV |
| XAFS Scan Speed | 20 eV/min |
| Energy Resolution | 0.5–1.5 eV (near-edge, 7–9 keV) |
| Monochromator Crystal | 100 mm diameter, R = 500 mm spherical Si or Ge bent crystal |
| Detector | Silicon Drift Detector (SDD) |
| Sample Carousel Capacity | 7–16 positions |
| Single-Scan Energy Coverage | >600 eV @ 7–9 keV |
| Brand | SPECREATION |
|---|---|
| Model | TableXES-V2k |
| Origin | Anhui, China |
| Instrument Type | Benchtop XES/XAFS Spectrometer |
| X-ray Source | 1.2 kW Sealed-Tube X-ray Tube (Customizable Anode Material) |
| Energy Range | 4.5–20 keV (Single-scan range >600 eV at 7–9 keV) |
| Energy Resolution | 0.5–1.5 eV (at 7–9 keV, XANES region) |
| Monochromator | Spherical bent crystal (Si or Ge), 100 mm aperture, 500 mm radius |
| Photon Flux | 5×10⁵–1×10⁶ photons/sec @ 9 keV |
| Detector | Silicon Drift Detector (SDD) |
| Sample Carousel | 7–16-position motorized sample wheel |
| Scan Mechanism | High-precision goniometric stage with thermal drift compensation |
| Safety | Interlocked radiation shielding compliant with IEC 61010-1 and GBZ 117-2020 |
| Optional Modes | Fluorescence-detected XAFS (FD-XAFS), Resonant Inelastic X-ray Scattering (RIXS)-compatible XES, In Situ/Operando cell integration |
| Brand | SPECREATION |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | Custom Configurable |
| Price | Upon Request |
| Spectral Resolution | 0.07 nm @ 50 µm Slit Width |
| Brand | SPECS |
|---|---|
| Origin | Germany |
| Model | Phoibos 190 ARPES System |
| Energy Analyzer | ASTRAIOS 190 hemispherical analyzer with 2D-CMOS detector |
| Angular Resolution | <0.1° |
| Energy Resolution | <1.5 meV (with 2D-CMOS) |
| Acceptance Angle | ±30° |
| Vacuum Base Pressure | <1×10⁻¹⁰ mbar |
| Sample Stage | Closed-cycle 6-axis cryogenic manipulator (base temperature <7 K) |
| UV Source | UVS300 plasma discharge He lamp + TMM304 monochromator (HeI α/β, HeII lines |
| Soft X-ray Source | u-FOCUS 600 micro-focused monochromated Al/Ag/Cr anode (Rolan circle radius 600 mm |
| Detector | 1920×1200 pixel CMOS sensor, 160 fps frame rate, dynamic range >1×10⁶ cps, single-channel noise <0.002 cps |
| Software | SPECS Prodigy Suite (acquisition, real-time k-space mapping, Fermi surface reconstruction, GLP-compliant audit trail) |
| Brand | Spectral Evolution |
|---|---|
| Model | PSR-1900 |
| Spectral Range | 350–1900 nm |
| Detector | 512-pixel Si (350–1000 nm) + 256-pixel cooled InGaAs (970–1910 nm) |
| Spectral Resolution | 3.5 nm (350–1000 nm), 10 nm @ 1900 nm |
| Spectral Sampling Interval | ≤1 nm |
| Optical Interface | Interchangeable fore-optics (4°, 8°, 14° FOV) or fiber optic input |
| Integration Time | Adjustable from 1 ms to 60 s |
| Scan Speed | Full-spectrum acquisition in 100 ms (up to 10 Hz) |
| Wavelength Accuracy | ±0.5 nm (FWHM) |
| Wavelength Repeatability | ±0.1 nm |
| Radiometric Noise (4° lens, 0.5 s integration) | 1.0×10⁻⁹ W/cm²/nm/sr @ 400 nm, 1.5×10⁻⁹ W/cm²/nm/sr @ 1500 nm |
| Calibration Traceability | NIST-traceable |
| Data Storage | Onboard memory for 500 spectra |
| Connectivity | USB 2.0 and Bluetooth 4.0 |
| Power | Dual rechargeable Li-ion batteries (7.4 V, ≥2 h field operation) |
| Dimensions | 21.6 × 29.2 × 8.3 cm |
| Weight | 3.3 kg |
| Compliance | CE, FCC, RoHS |
| Brand | Spectral Industries |
|---|---|
| Origin | Netherlands |
| Model | SPECTRAL LIBS |
| Type | Online, Integrated |
| Spectrometer | IRIS Echelle (UV/Deep-UV & NIR) |
| Laser | Actively Q-Switched Nanosecond Pulsed |
| Spectral Range | 180–800 nm & 880–1100 nm (N₂-purged option for DUV) |
| Resolution | 0.1–0.45 nm (@ 180–800 nm, 25 µm slit) |
| F/# | f/2 |
| Delay Jitter | <10 ns |
| Working Distance | 50–500 mm (customizable) |
| Spot Size | ≤100 µm |
| Detector | Deep-UV-enhanced CMOS, Integration Time: 28 µs – 30 s |
| Stage | Motorized 3-Axis Translation (50 × 50 mm travel) |
| Software | Full Hardware Control + MATLAB-Based Data Processing & Visualization |
| Brand | AERO |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Instrument Category | Domestic |
| Model | SP301 / SP301-EX |
| Pricing | Upon Request |
| Instrument Class | Optical Photothermal Infrared Spectrometer |
| Form Factor | Portable |
| Wavenumber Range | 3333–10000 cm⁻¹ (equivalent to 1.0–3.0 µm for PbS |
| Spectral Resolution | 10–30 nm (dependent on slit width and grating selection) |
| Signal-to-Noise Ratio | ≥20 RMS counts (16-bit digitization) |
| Detector Cooling | Thermoelectric (TE), down to –20 °C |
| Detector Type | Linear PbS or PbSe array (256 pixels, 45 µm × 450 µm active area) |
| Max Readout Rate | 2 MHz |
| Linearity | >90% |
| Pixel-to-Pixel Response Uniformity (peak-to-peak) | ±10% |
| Brand | AERO |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | SP304 |
| Instrument Class | Optical Photothermal Infrared Spectrometer |
| Form Factor | Portable |
| Wavelength Ranges | 0.9–1.7 µm, 0.9–2.05 µm, 0.9–2.2 µm, 0.9–2.5 µm |
| Spectral Resolution | >3 nm (overall, depending on configuration) |
| Signal-to-Noise Ratio | >15,000:1 @ 100 ms integration time |
| Detector Types | 256- and 512-pixel TE-cooled InGaAs linear arrays |
| Pixel Dimensions | 25 × 250 µm or 25 × 500 µm (model-dependent) |
| Compliance | CE, RoHS, ISO 9001-aligned manufacturing & calibration protocols |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | New SPECTRO ARCOS |
| Instrument Type | Full-Spectrum Direct-Reading ICP-OES |
| Detection Limit | <1 ppb |
| Precision (RSD) | 0.5% |
| Long-Term Stability | 1% |
| Wavelength Range | 130–770 nm |
| Optical Resolution | <8.5 pm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | SPECTRO ARCOS |
| Instrument Type | Full-Spectrum Simultaneous ICP-OES |
| Detection Limit | Sub-ppb to ppm |
| Repeatability | ≤1% RSD |
| Long-Term Stability | ≤0.1% RSD |
| Wavelength Range | 130–770 nm |
| Optical Resolution | ≤0.008 nm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO GENESIS |
| Instrument Type | Full-Spectrum Direct-Reading ICP-OES |
| Optical Detection | Dual-View Vertical Torch Configuration |
| Cooling | Air-Cooled Only |
| Purge Gas Flow | As Low as 0.5 L/min |
| Linear Dynamic Range | Sub-ppb to Percent Level |
| Sample Throughput | Up to 700 Samples per Day |
| Optical Architecture | DSOI (Dual-Spectrometer Optimized Imaging) |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO GENESIS |
| Type | Full-Spectrum Simultaneous ICP-OES |
| Wavelength Range | 175–770 nm |
| RF Generator | 27 MHz Solid-State |
| Optical Purge Flow | ≥0.5 L/min (Argon or Nitrogen) |
| Sample Throughput | Up to 700 samples/day |
| Detector | High-Quantum-Efficiency CCD Array |
| Compliance | ASTM D5185, D6595, ISO 11885, USP <233>, EPA Methods 200.7, 6010D, 6020B, GLP/GMP-ready with 21 CFR Part 11–compliant software options |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO M.01 |
| Instrument Type | Benchtop |
| Technology | Spark Optical Emission Spectrometry (OES) |
| Target Matrix | Ferrous Alloys |
| Compliance | ISO/IEC 17025 compatible, ASTM E415, ASTM E1086, EN 10315, DIN 51008 |
| Software | SPECTRO AnalyzeNet v3.x with ICAL 2.0 calibration technology |
| Gas Requirement | High-purity argon (≥99.996%) |
| Cooling | Air-cooled |
| Safety | CE, UL 61010-1 compliant |
| Data Management | Audit trail, user access levels, GLP/GMP-ready reporting |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROMIDEX |
| Instrument Type | Benchtop ED-XRF Spectrometer |
| Application Scope | General-purpose elemental analysis, optimized for precious metals |
| Compliance | Designed for ISO/IEC 17025-compliant labs, supports GLP/GMP data integrity requirements |
| Detector | High-resolution silicon drift detector (SDD) with micro-focus X-ray source |
| Measurement Principle | Energy-dispersive X-ray fluorescence (ED-XRF) with polycapillary optic collimation |
| Sample Form | Solid, powdered, or plated samples (non-destructive) |
| Software | SPECTRO XRF Analyzer Suite with audit trail, user-level permissions, and 21 CFR Part 11–ready reporting modules |
| Data Export | CSV, XML, PDF |
| Brand | Spectro Scientific |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SpectrOil 100 |
| Pricing | Available Upon Request |
| Brand | Spectro Scientific |
|---|---|
| Origin | USA |
| Manufacturer | Spectro Scientific, Inc. |
| Type | Imported Instrument |
| Model | SpectrOil 100 |
| Pricing | Available Upon Request |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO SCOUT |
| Instrument Type | Polarized ED-XRF |
| Configuration | Benchtop/Field-Deployable |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Tube | Rhodium (Rh) anode, up to 50 kV |
| Elemental Range | Na (11) to U (92) |
| Detection Limits | As low as <1 ppm for selected elements |
| Analysis Time | 3–10 min per sample |
| Dimensions | 270 × 306 × 306 mm |
| Weight | 12.75 kg |
| Battery Life | Up to 5 hours continuous operation |
| Sample Chamber | Large-volume, accommodates irregular and bulk samples |
| Calibration | iCAL single-sample standardization in ≤5 minutes |
| Software Interface | Integrated touchscreen with preloaded application packages |
| Optional | Integrated high-resolution camera for sample positioning and image-result correlation |
| Connectivity | USB, Wi-Fi, Ethernet |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO SCOUT |
| Type | Portable, Hybrid (Scanning + Multi-Channel) ED-XRF Spectrometer |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Tube | Rh anode, max. 50 kV |
| Elemental Range | Na (11) to U (92) |
| Spot Size | 1 mm diameter |
| Dimensions (transport) | 270 × 306 × 306 mm |
| Dimensions (operational) | 350 × 306 × 306 mm |
| Weight | 12.0 kg (without battery), 12.75 kg (with battery) |
| Power Supply | 10–30 V DC (integrated Li-ion battery) |
| AC adapter | 90–264 V AC, 50–60 Hz |
| Interface | Integrated touchscreen PC, Bluetooth, Wi-Fi, LAN, USB |
| Software | SPECTRO XRF Analyzer Pro with iCAL (intelligent Calibration) |
| Compliance | Designed for field-deployable GLP-aligned workflows |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROCUBE |
| Configuration | Benchtop/Floor-Standing |
| Elemental Range | Na–U |
| Quantification Range | 0.1 ppm – 99.99% |
| Energy Resolution | 130 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements, n ≥ 10) |
| Detector | Silicon Drift Detector (SDD) |
| Compliance | CE, RoHS, IEC 61000-6-3/6-4 |
| Instrument Class | ED-XRF Spectrometer for Petrochemical QA/QC |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROCUBE (RoHS-Optimized) |
| Configuration | Benchtop/Free-Standing |
| Detector Type | High-Resolution Silicon Drift Detector (SDD) |
| Count Rate Capability | Up to 100,000 cps |
| Elemental Range | Na (11) to U (92) |
| Minimum Detection Limits (MDL) | Sub-ppm to low-ppm range for regulated elements (Pb, Cd, Hg, Cr, Br, Cl, etc.) |
| Compliance Standards | IEC 62321-5:2013, EN 62321-5:2014, ASTM F2853-21, USP <232>/<233>, ISO 17025-accredited operation support |
| Software | SPECTRO XRF Suite with RoHS-specific method templates, audit trail, and 21 CFR Part 11-compliant user management |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROLAB S LAS02 |
| Instrument Type | Floor-Standing |
| Excitation Source | Spark |
| Detector Type | CMOS+T Solid-State Array |
| Focal Length | 750 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 120–800 nm |
| Number of Channels | Application-Defined |