Chemical Analysis Instruments
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Showing 5491–5520 of 10742 results
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | M530 |
| Price Range | USD 9,200 – 13,100 (est.) |
| Optical Design | Pseudo-Double-Beam |
| Detector | DLATGS (Deuterated L-Alanine doped Triglycine Sulfate) |
| Spectral Range | 4000 – 600 cm⁻¹ |
| Spectral Resolution | <3 cm⁻¹ (4000–2000 cm⁻¹), <2 cm⁻¹ (2000–600 cm⁻¹) |
| Wavelength Accuracy | ±0.1 cm⁻¹ |
| Spectral Bandwidth | 4 cm⁻¹ (nominal) |
| Stray Light | <0.01% T |
| Automation Level | Motorized Wavelength Calibration & Auto-Alignment |
| Display | Integrated 7-inch Capacitive Touchscreen |
| Interface | RS-232, USB 2.0 |
| Power Supply | 115/230 VAC, 50/60 Hz, 150 W |
| Dimensions (W×D×H) | 66.7 × 38.7 × 18.4 cm |
| Weight | 17.2 kg (38 lbs) |
| Sample Compartment | 150 mm² Clear Aperture |
| Source | Ceramic-encapsulated NiCr Wire (1250 K, 36 W) |
| Origin | Beijing, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (PRC) |
| Model | M7 |
| Price Range | USD 42,000 – 70,000 |
| Instrument Type | Single Quadrupole Mass Spectrometer |
| GC Configuration | Standalone GC-MS Platform |
| Mass Range | 1.5–1050 Da |
| Resolution | Unit Mass Resolution (UMR) |
| Mass Stability | ±0.1 Da over 48 h |
| Repeatability | RSD ≤9% for 10 ng Hexachlorobenzene (m/z 284) |
| Ion Source | Dual-Filament Electron Impact (EI) Source |
| Vacuum System | Pfeiffer Turbo Molecular Pump (60 L/s) |
| Interface | LAN-enabled Remote Operation |
| Software | Graphical User Interface (GUI) with Embedded Method Library |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MA150 |
| Pricing | Upon Request |
| Capacity | 150 g |
| Readability | 1 mg |
| Moisture Resolution | 0.01% |
| Repeatability | ±0.2% (for initial sample mass ≥1 g) |
| Heating Temperature Range | 40–230 °C (adjustable in 1 °C increments) |
| Timer Range | 0.1–99 minutes |
| Heating Source | Ceramic IR Heater |
| Net Weight | 5.5 kg |
| Dimensions (W × L × H) | 213 × 320 × 180.5 mm |
| Brand | Macherey-Nagel |
|---|---|
| Origin | Germany |
| Model | NANOCOLOR 500D |
| Wavelength Range | 340–860 nm |
| Wavelength Selection | 10 fixed-band interference filters (345, 365, 436, 470, 520, 540, 585, 620, 690, 800 nm) |
| Wavelength Accuracy | ±2 nm |
| Bandwidth | 10–12 nm |
| Light Source | Tungsten halogen lamp |
| Detector | Silicon photodiode |
| Photometric Accuracy | ±1% of reading |
| Stability | <0.002 Abs/h |
| Sample Holders | 16-mm round cuvettes (NANOCOLOR tubes), plus 10 mm, 20 mm, and 50 mm rectangular cuvettes |
| Data Storage | 500 measurements with GLP-compliant metadata |
| Display | Graphic LCD (64 × 128 pixels), backlit, 10-language interface |
| Interfaces | RS-232 (bidirectional), USB 1.1 |
| Power | Internal rechargeable 6 V / 3.2 Ah battery or AC adapter (100–240 V~, 50/60 Hz) |
| Operating Environment | 0–50 °C, ≤90% RH (non-condensing) |
| Dimensions | 227 × 282 × 105 mm |
| Weight | 2.4 kg |
| Brand | Macherey-Nagel |
|---|---|
| Origin | Germany |
| Model | 919650.1 |
| Optical Design | Single-beam |
| Detector | Photodiode Array |
| Wavelength Range | 340–960 nm |
| Wavelength Accuracy | ±2 nm |
| Wavelength Repeatability | ±1 nm |
| Spectral Bandwidth | 5 nm |
| Stray Light | ≤0.5% |
| Automation | Automatic wavelength selection |
| Compliance | EN ISO 7027 for turbidity measurement |
| Brand | Macylab |
|---|---|
| Origin | Beijing, China |
| Model | UL-5000 |
| Wavelength Range | 190–900 nm |
| Wavelength Accuracy | ±1% (0.76 at 260 nm) |
| Wavelength Repeatability | ≤0.5% for OD < 3, ≤2% for OD 3–4 |
| Photometric Range | 0–4.000 Abs (OD600) |
| Minimum Sample Volume | 0.3 µL |
| Pathlength Options | 0.02–1 mm (auto-adjustable), 1/2/5/10 mm cuvette |
| Absorbance Resolution | 0.002 Abs (1 mm path) |
| Detector | UV-enhanced CMOS linear array sensor |
| Light Source | Imported miniature xenon flash lamp (≥10⁹ flashes, >10-year lifetime) |
| Measurement Time | <3 s |
| Display | 7-inch Android-based touchscreen |
| Optical Principle | Fixed-pathlength, direct-drop microvolume absorbance measurement |
| Brand | MagQu |
|---|---|
| Origin | Taiwan |
| Model | Gyrolyzer |
| Operating Frequency Range | 1.5–15 kHz |
| Static Magnetic Field Range | 0–3 G |
| Sample Volume | < 10 mL |
| Interface | USB 2.0 |
| Compliance | Designed for educational use in accordance with IUPAC NMR pedagogy guidelines and ASTM E2834-12 (Standard Guide for Teaching NMR Principles) |
| Brand | MakeWave |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | MKG-J2H |
| Price Range | USD 28,000 – 70,000 |
| Instrument Type | Continuous Flow Analyzer |
| Wavelength Range | Not applicable (microwave frequency domain, 2.45 GHz) |
| Sample Capacity | 1 stream |
| Reagent Ports | 1 |
| Flow Cell Optical Path Length | 300 mm |
| Radiation Source | 2.45 GHz Magnetron-Based Microwave Generator |
| Microwave Power Output | 0–1600 W, continuously adjustable |
| Power Supply | 220 V / 50 Hz |
| Dimensions (W×D×H) | 600 × 400 × 1200 mm |
| Cavity Dimensions (W×D×H) | 450 × 400 × 550 mm |
| Tubing Material | High-purity alumina ceramic or PEEK-lined engineering polymer |
| Internal Tubing Diameter | 60 mm |
| Temperature Monitoring | Integrated Pt100 RTD sensor with closed-loop feedback |
| Control System | Industrial PLC with 7-inch HMI touchscreen interface |
| Safety Compliance | Meets GB 10436-2008 (Chinese national standard for microwave leakage ≤ 5 mW/cm² at 5 cm) |
| Brand | Makeway |
|---|---|
| Origin | Shanghai, China |
| Model | MKW-5250 |
| Energy Resolution | 40 meV |
| X-ray Source | Al Kα (1486.6 eV) |
| Spatial Resolution | ≤ 5 µm (focused monochromated beam) |
| Analysis Area | Up to 300 µm × 300 µm |
| Detection Sensitivity | 11,800 kcps (for C 1s at pass energy 20 eV) |
| Sample Stage | Motorized XYZ + tilt/rotation |
| Compatible Techniques | XPS, UPS, LEIPS, REELS, AES, HAXPES (with optional Cr/Mg anode), GCIB depth profiling, angle-resolved XPS (AR-XPS) |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | 2830 ZT |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Detector Configuration | Sequential Multi-channel |
| Analyzable Elements | B, C, N, O, F, Mg, TiSiₓ, CoSiₓ, WSiₓ |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | Aeris |
| Instrument Type | Powder X-ray Diffractometer |
| Form Factor | Benchtop |
| Power Stability | < 0.0001 (unitless relative stability, typical for high-stability X-ray tube voltage/current regulation) |
| Brand | Malvern PANalytical |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Aeris Cement Edition |
| Pricing | Upon Request |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Aeris HCSC |
| Instrument Type | Powder X-ray Diffractometer |
| Form Factor | Benchtop |
| Brand | Malvern PANalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Axios FAST |
| Instrument Type | Floor-standing |
| Instrument Configuration | Simultaneous Multi-Channel WDXRF |
| X-ray Tube | SST-mAX with 160 mA high-power capability |
| Analyzable Elements | Up to 28 elements (Na to U) |
| Detection Range | ppm to 100 wt% |
| Sample Throughput | Up to 168 samples unattended |
| Minimum Measurement Time per Sample | 2 seconds |
| Optional Configurations | Up to 4 goniometers, HiPer channel for light elements (Na–F), anode materials (Rh, Cr, Mo, Au) |
| Compliance | Designed for GLP/GMP environments |
| Brand | Malvern Panalytical |
|---|---|
| Country of Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Empyrean |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power Consumption | 0.0001 kW |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Model | Empyrean |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| Power Consumption | 0.0001 kW |
| Core Technology | MultiCore Optics (iCore/dCore) |
| Detector Technology | Hybrid Pixel Array (PIXcel3D / GaliPIX3D) |
| Sample Flexibility | Powder, Thin Film, Nanomaterials, Bulk Solids |
| Compliance Framework | GLP-ready, PreFIX modular architecture, ISO/IEC 17025-compatible workflow support |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Epsilon 1 ISO 13032 |
| Configuration | Benchtop |
| Industry Application | Energy & Petrochemicals |
| Elemental Range | Na to Am |
| Quantification Range | ppm to % |
| Energy Resolution | 135 eV |
| Repeatability | High |
| Detector | High-Resolution Silicon Drift Detector (SDD) |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | Epsilon 4 |
| Form Factor | Benchtop / Floor-standing Configurable |
| Application Scope | Universal |
| Elemental Range | F–Am (C–Am with optional configuration) |
| Quantification Range | 0.01 ppm – 100 wt% |
| Energy Resolution | ~135 eV (at Mn Kα, 5.9 keV) |
| Repeatability | As low as 0.02% RSD (relative standard deviation) |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Epsilon Xflow |
| Form Factor | Benchtop or Floor-Standing |
| Industry-Specific Application | Energy & Chemical Processing |
| Elemental Range | Na (Z=11) to Am (Z=95) |
| Quantification Range | 1 ppm to 100% w/w |
| Energy Resolution | <145 eV at 5.9 keV (1000 cps) |
| Repeatability | Concentration-dependent |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Epsilon1 |
| Form Factor | Benchtop |
| Industry Application | Energy & Chemicals |
| Elemental Range | Na (Z=11) to Am (Z=95) |
| Quantification Range | 1 ppm to 100% w/w |
| Energy Resolution | <145 eV at Mn Kα (5.9 keV, 1000 cps) |
| Repeatability | Concentration-dependent, compliant with ISO 8258 and ASTM E1621 for precision validation |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Omega/Theta |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Orientation Accuracy (1σ) | <0.003° (rocking angle), <0.03° (in-plane direction) |
| Measurement Time | ≤10 s per orientation determination |
| Maximum Sample Weight | 30 kg |
| Maximum Sample Length | 450 mm |
| Goniometer Configuration | Omega/Theta (θ–2θ coupled or independent scanning) |
| Brand | Malvern PANalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Revontium |
| Form Factor | Benchtop/Floor-standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-purpose |
| Elemental Range | Na to Am (Z = 11 to Z = 95) |
| Energy Resolution | <145 eV at Mn Kα |
| Detectors | Four simultaneous silicon drift detectors (SDDs) |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | SDCOM |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| X-ray Source | 30 W air-cooled Cu-anode microfocus X-ray tube |
| Measurement Speed | Full orientation determination in ≤10 s per sample rotation |
| Sample Diameter Range | 1–200 mm |
| Angular Precision (Si 100) | Tilt magnitude < 0.01°, tilt direction < 0.03° |
| Uptime | >99% |
| Theta Scan Capability | Yes |
| Multi-crystal Transfer | Up to 6 oriented crystals per collimated beam |
| MES Integration | Compatible with SECS/GEM-compliant manufacturing execution systems |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TerraSpec HALO |
| Instrument Type | Portable |
| Operating Principle | Grating-based Scanning NIR Spectrometer |
| Wavelength Range | 350–2500 nm |
| Scan Rate | 100 spectra per second |
| Spectral Sampling Interval | 1 nm |
| Measurement Modes | Diffuse Reflectance, Specular Reflectance, Transmission |
| Chemometrics Software | Indico Pro |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Wafer XRD |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Sample Size Compatibility | 3-inch to 8-inch wafers (custom FOUPs, carriers, or single-wafer stages available) |
| Measurement Speed | <10 seconds per wafer |
| Typical Standard Deviation (Tilt Angle) | <0.003° for Si(100) |
| X-ray Source Options | Air-cooled microfocus Cu-target tube (30 W) or water-cooled fine-focus Cu-target tube (1.5 kW) |
| Safety Compliance | Fully CE-compliant with integrated interlock and three-color tower light status indication |
| Interface Protocols | SEMI-compliant MES and SECS/GEM |
| Optional Modules | Resistivity measurement (0.01–0.020 Ω·cm), automated matrix/QR/barcode recognition, unpolished & mirror-surface distance metrology |
| Material Support | Si, SiC, GaAs, GaN, Sapphire (Al₂O₃), Ge, AlN, Quartz, InP, and >100 additional crystalline semiconductor substrates |
| Brand | Malvern PANalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | X’Pert3 MRD (XL) |
| Instrument Type | Powder X-ray Diffractometer |
| Power Supply | Not Specified |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Crystal Orientation |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Orientation Speed | ≤10 s per measurement |
| Angular Accuracy | ±0.003° (Wafer XRD 200/300), ±0.01° (DDCOM/SDCOM) |
| Sample Diameter Range | 1–225 mm |
| Cooling Requirement | Air-cooled (no water cooling required) |
| Compliance | ASTM E975, ISO 18755, IEC 61000-6-3, CE, RoHS |
| Interface Options | Ethernet/IP, Profibus, Modbus TCP, SECS/GEM |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Zetium |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 2.4–4 kW |
| Elemental Range | 4Be to 95Am |
| Instrument Class | Scanning-type WDXRF |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Instrument Type | Floor-standing |
| Excitation Source | High-power X-ray tube (2.4–4 kW) |
| Analytical Range | Be (4) to Am (95) |
| Configuration | Scanning-type WDXRF with integrated EDXRF core (SumXcore technology) |
| Software Platform | SuperQ with Virtual Analyst |
| Compliance | Designed for ISO/IEC 17025, ASTM E1621, ASTM E2488, USP <233>, and GLP/GMP environments requiring audit trail and electronic signature support (21 CFR Part 11 ready) |
| Brand | Mapada |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | OEM Manufacturer |
| Instrument Architecture | Dual-Beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Scanning Mode | Automatic |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ±0.5 nm |
| Wavelength Repeatability | ≤0.3 nm |