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| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-120i |
| Acceleration Voltage | Up to 120 kV |
| Magnification Range | 50× – 1,200,000× |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSX-1000S |
| Elemental Analysis Range | Mg–U (Na–U optional) |
| Quantitative Range | 0.1–99.9 wt% |
| Energy Resolution | <170 eV at Mn Kα |
| Repeatability | ±0.1% RSD |
| X-ray Tube | 5–50 kV, 1 mA, Rh anode |
| Filter Options | Standard — OPEN, ND, Cr, Pb, Cd |
| Detector | Silicon Drift Detector (SDD) |
| Sample Chamber | Ø300 mm × 80 mm H |
| Atmosphere Mode | Air (standard) |
| Imaging System | Integrated color camera |
| Software Suite | Qualitative & Quantitative Analysis, RoHS Compliance Module (Cd, Pb, Hg, Br, Cr), Quick-Analysis Mode, Report Generator, Daily Verification Tool |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT810 |
| Instrument Type | Floor-standing SEM |
| Electron Gun | Thermal Field Emission (TFE) |
| Secondary Electron (SE) Resolution | 0.5 nm at 15 kV |
| Backscattered Electron (BSE) Resolution | 1.5 nm at 15 kV |
| Accelerating Voltage Range | 0.01–30 kV |
| Magnification Range | ×27 to ×5,480,000 (at 1280 × 960 pixels) |
| Beam Current | Up to 500 nA |
| Detector Configuration | Standard In-lens SE, Through-the-lens BSE, and Optional EDS/EBSD Integration |
| Sample Chamber | Expandable with Multiple Ports for In-situ & Analytical Add-ons |
| Stage | Motorized, High-Precision 5-Axis Tilt/Rotation/Translation Stage |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JMS-S3000 |
| Ion Optics | SpiralTOF™-plus 2.0 |
| Operating Modes | TOF (standard), Linear TOF (optional), TOF/TOF (optional) |
| Application Scope | Synthetic polymers, biomacromolecules, materials science |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-ARM300F2 |
| Price | USD 6.8M (est.) |
| Acceleration Voltage | Up to 300 kV |
| Magnification Range | 100×–2,000,000× |
| Guaranteed HAADF-STEM Resolution | 53 pm (300 kV, with ETA corrector + FHP2 polepiece) |
| EDS Detector | Dual large-area SDD (158 mm² total active area) |
| Solid Angle for EDS | 2.2 sr (with WGP polepiece) |
| Cs Corrector | JEOL 12-Pole Monochromator-Based Spherical Aberration (Cs) Corrector |
| Software | COSMO™ Auto-Aberration Correction Suite |
| Gun Type | Next-Generation Cold Field-Emission Gun (Cold-FEG) |
| Environmental Shielding | Integrated Active Vibration & Acoustic Damping Enclosure |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT210 |
| Instrument Type | Floor-standing |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3 nm @ 30 kV |
| Magnification Range | 5× – 300,000× |
| Accelerating Voltage | 0.5–30 kV |
| Backscattered Electron Resolution | 4 nm (Low Vacuum Mode) |
| Maximum Sample Dimensions | Ø150 mm × 53 mm height |
| Specimen Chamber Expansion Ports | Multiple |
| Stage Type | Motorized 5-Axis Stage |
| Standard Detectors | Everhart-Thornley SE Detector, Solid-State BSE Detector |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JMS-Q1600GC |
| Instrument Type | Single Quadrupole Mass Spectrometer |
| GC Configuration | Conventional Gas Chromatography-Mass Spectrometry (GC-MS) |
| Series | UltraQuad™ SQ-Zeta |
| Generation | 6th-generation JEOL GC-MS platform |
| Application Scope | Quantitative and Qualitative Analysis in Environmental, Food Safety, Agrochemical, Materials, and Flavor Chemistry |
| Compliance Framework | Designed for GLP/GMP-aligned laboratories |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JNM-ECZL Series |
| Sample Type | Solid-Liquid Dual-Mode |
| Instrument Category | High-Field NMR Spectrometer |
| System Architecture | Integrated Smart Transceiver System (STS) |
| Multi-Resonance Capability | Standard Configuration |
| Design Principle | Compact High-Field Platform with Digital RF Control |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JMS-T2000GC |
| Type | Time-of-Flight (TOF) GC-MS System |
| Ionization Modes | Electron Ionization (EI), Chemical Ionization (CI), Field Ionization (FI), and Optional Atmospheric Pressure Chemical Ionization (APCI) |
| Mass Accuracy | < 1 ppm (external calibration), < 0.5 ppm (internal lock mass) |
| Mass Resolution | > 10,000 (FWHM, m/z 500) |
| Acquisition Rate | Up to 50 spectra/sec |
| Mass Range | m/z 10–4,000 |
| Detector | Microchannel Plate (MCP) with Delayed Extraction |
| Vacuum System | Dual-stage differential pumping with turbomolecular pumps |
| GC Interface | Direct capillary column coupling with heated transfer line (up to 350 °C) |
| Software | MassCenter™ v5.x with automated deconvolution, library search (NIST, Wiley, JEOL MS Library), and quantitative workflow support |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-ARM200F(C)-NEO ARM |
| Acceleration Voltages | 30 kV, 80 kV, 200 kV |
| Magnification Range | 50× to 2,000,000× |
| Point Resolution | 0.078 nm (at 200 kV) |
| Energy Resolution | ≤0.3 eV (with monochromated cold FEG) |
| Configuration | Dual spherical aberration correctors (objective and condenser), integrated STEM/TEM/EELS/EDS platform |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Instrument Type | Time-of-Flight (TOF) Mass Spectrometer |
| Configuration | Liquid Chromatography–Mass Spectrometry (LC-MS) Platform |
| Ionization Modes | Electrospray Ionization (ESI), Direct Analysis in Real Time (DART™), Cold Spray Ionization (CSI) |
| Intended Use | General-purpose high-resolution mass analysis in research, quality control, and regulatory-compliant laboratories |
| Compliance Context | Designed to support GLP/GMP workflows and data integrity requirements per FDA 21 CFR Part 11 and ISO/IEC 17025 guidelines |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Instrument Type | Magnetic Sector Mass Spectrometer |
| Application Focus | Dioxin (PCDD/Fs) Analysis |
| GC Compatibility | Dual-Column Interface |
| Detector | Photomultiplier Tube (PMT) |
| Software | Diok Suite (EPA Method 1613 Compliant) |
| Vacuum Integrity | Column Exchange Without Ion Source Venting |
| Regulatory Alignment | Designed for EPA 1613, EU 2017/771, and ISO 18073 Compliance |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-2100Plus |
| Acceleration Voltages | 80, 100, 120, 160, 200 kV |
| Magnification Range | 50× to 1,500,000× |
| Point Resolution | 0.19 nm |
| Line Resolution | 0.14 nm |
| Minimum Probe Size | 0.5 nm |
| Tilt Range | ±25° |
| Condenser System | Three-Stage Lens Design |
| Pole Piece Options | UHR, HR, HT, HC, CRYO |
| Operating System | 64-bit Windows-based Control Interface |
| Integrated Detectors | STEM, EDS, CCD, EELS |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT800 |
| Instrument Type | Floor-Standing SEM |
| Electron Source | Thermal Field-Emission Gun (TFEG) |
| Secondary Electron Resolution | 0.6 nm @ 15 kV, 0.7 nm @ 1 kV |
| Backscattered Electron Resolution | 1.5 nm |
| Accelerating Voltage Range | 0.01–30 kV |
| Maximum Magnification | 2,000,000× (real) |
| Specimen Diameter Capacity | 150 mm |
| Stage Type | 5-Axis Motorized Precision Stage |
| Detector Configuration | In-lens SE detector, upper-stage BSE detector, optional EDS/WDS integration |
| Beam Current | ≥300 nA @ 15 kV |
| Objective Lens Design | Super Hybrid Objective Lens (Magnetic-Field-Free) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | IB-19530CP |
| Price | USD 150,000 |
| Equipment Type | Ion Beam Sample Preparation System for Electron Microscopy |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JXA-iHP200F |
| Instrument Type | Floor-standing, High-Performance EPMA |
| Electron Source | Thermal Field-Emission Gun (TFEG) |
| Secondary Electron Resolution | 2.5 nm at 15 kV |
| Magnification Range | 40× to 300,000× |
| Accelerating Voltage | 1–30 kV |
| Backscattered Electron Imaging | High-Contrast Mode |
| Maximum Sample Dimensions | 100 mm × 100 mm × 50 mm (H) |
| Motorized Stage | 5-Axis Precision Drive |
| Standard Detectors | Solid-State Backscatter Detector, Wavelength-Dispersive Spectrometer (WDS), Energy-Dispersive Spectrometer (EDS) |
| Vacuum System | Ultra-High Vacuum (UHV) Compatible |
| Interface Expansion | Multiple Dedicated Ports for Optional Analyzers (e.g., EBSD, CL, STEM-in-SEM) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SXES |
| Price | USD 700,000 |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-ACE200F |
| Price | USD $3,000,000 |
| Acceleration Voltage | Up to 200 kV |
| Maximum Magnification | 2,000,000× |
| Point Resolution | 0.21 nm |
| Lattice Resolution | 0.10 nm |
| STEM Resolution | 0.136 nm |
| Information Limit | 0.11 nm |
| EDS Configuration | Dual Ultra-High-Sensitivity Silicon Drift Detectors (SDD) |
| Lorentz Mode | Standard |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JIB-PS500i |
| Electron Beam Resolution | 0.7 nm @ 15 kV, 1.0 nm @ 1 kV |
| Ion Beam Resolution | 3 nm |
| Maximum Ion Beam Current | 100 nA |
| Maximum Electron Beam Current | 500 nA |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT510 |
| Instrument Type | Floor-standing SEM |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3 nm @ 30 kV, 15 nm @ 1 kV |
| Backscattered Electron Resolution | 4 nm @ 30 kV |
| Accelerating Voltage Range | 0.3–30 kV |
| Magnification Range | 14×–800,000× (on display) |
| Vacuum Mode | Low-vacuum compatible with LHSED detector |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT710HR |
| Instrument Type | Benchtop SEM |
| Electron Source | Thermal Field Emission Gun (TFEG) |
| Secondary Electron Resolution | 1 nm @ 30 kV |
| Backscattered Electron Resolution | 2 nm @ 30 kV |
| Accelerating Voltage | 0.1–30 kV |
| Maximum Magnification | 1,000,000× |
| Probe Current | Up to 300 nA |
| Sample Chamber | Large-volume, front-loading with wide-access door |
| Operating Modes | High Vacuum / Low Vacuum (LV/LA variants available) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JIB-4700F |
| Instrument Type | Benchtop Dual-Beam FIB-SEM |
| Electron Source | Cold Field Emission Gun (CFEG) |
| Secondary Electron Resolution | 1.2 nm @ 15 kV, 1.6 nm @ 1 kV |
| Backscattered Electron Resolution | 2.5 nm |
| FIB Resolution | 5 nm @ 30 kV |
| Magnification Range | 25× – 1,000,000× |
| Acceleration Voltage | 0.1–30 kV |
| Maximum FIB Current | 90 nA |
| Maximum SEM Probe Current | 300 nA |
| Gas Injection System | Up to 3 independent channels |
| Sample Stage | 5-axis fully aligned motorized stage |
| Maximum Sample Diameter | 150 mm |
| Sample Loading | Airlock-style exchange |
| Detector Interfaces | EDS, EBSD, STEM, SE/BSE |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | Gather-X |
| Mounting Type | Side-entry (inclined insertion) |
| Energy Resolution | ≤129 eV (Mn-Kα), ≤59 eV (C-Kα) |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | >500,000 cps |
| Elemental Detection Range | Li to U |
| Detector Active Area | 100 mm² |
| Window Type | Windowless |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-F200 |
| Price | USD $2,000,000 |
| Acceleration Voltage | Up to 200 kV |
| Magnification Range | 50× – 2,000,000× |
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