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| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT810 |
| Instrument Type | Floor-standing SEM |
| Electron Gun | Thermal Field Emission (TFE) |
| Secondary Electron (SE) Resolution | 0.5 nm at 15 kV |
| Backscattered Electron (BSE) Resolution | 1.5 nm at 15 kV |
| Accelerating Voltage Range | 0.01–30 kV |
| Magnification Range | ×27 to ×5,480,000 (at 1280 × 960 pixels) |
| Beam Current | Up to 500 nA |
| Detector Configuration | Standard In-lens SE, Through-the-lens BSE, and Optional EDS/EBSD Integration |
| Sample Chamber | Expandable with Multiple Ports for In-situ & Analytical Add-ons |
| Stage | Motorized, High-Precision 5-Axis Tilt/Rotation/Translation Stage |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT210 |
| Instrument Type | Floor-standing |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3 nm @ 30 kV |
| Magnification Range | 5× – 300,000× |
| Accelerating Voltage | 0.5–30 kV |
| Backscattered Electron Resolution | 4 nm (Low Vacuum Mode) |
| Maximum Sample Dimensions | Ø150 mm × 53 mm height |
| Specimen Chamber Expansion Ports | Multiple |
| Stage Type | Motorized 5-Axis Stage |
| Standard Detectors | Everhart-Thornley SE Detector, Solid-State BSE Detector |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT800 |
| Instrument Type | Floor-Standing SEM |
| Electron Source | Thermal Field-Emission Gun (TFEG) |
| Secondary Electron Resolution | 0.6 nm @ 15 kV, 0.7 nm @ 1 kV |
| Backscattered Electron Resolution | 1.5 nm |
| Accelerating Voltage Range | 0.01–30 kV |
| Maximum Magnification | 2,000,000× (real) |
| Specimen Diameter Capacity | 150 mm |
| Stage Type | 5-Axis Motorized Precision Stage |
| Detector Configuration | In-lens SE detector, upper-stage BSE detector, optional EDS/WDS integration |
| Beam Current | ≥300 nA @ 15 kV |
| Objective Lens Design | Super Hybrid Objective Lens (Magnetic-Field-Free) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JXA-iHP200F |
| Instrument Type | Floor-standing, High-Performance EPMA |
| Electron Source | Thermal Field-Emission Gun (TFEG) |
| Secondary Electron Resolution | 2.5 nm at 15 kV |
| Magnification Range | 40× to 300,000× |
| Accelerating Voltage | 1–30 kV |
| Backscattered Electron Imaging | High-Contrast Mode |
| Maximum Sample Dimensions | 100 mm × 100 mm × 50 mm (H) |
| Motorized Stage | 5-Axis Precision Drive |
| Standard Detectors | Solid-State Backscatter Detector, Wavelength-Dispersive Spectrometer (WDS), Energy-Dispersive Spectrometer (EDS) |
| Vacuum System | Ultra-High Vacuum (UHV) Compatible |
| Interface Expansion | Multiple Dedicated Ports for Optional Analyzers (e.g., EBSD, CL, STEM-in-SEM) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT510 |
| Instrument Type | Floor-standing SEM |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3 nm @ 30 kV, 15 nm @ 1 kV |
| Backscattered Electron Resolution | 4 nm @ 30 kV |
| Accelerating Voltage Range | 0.3–30 kV |
| Magnification Range | 14×–800,000× (on display) |
| Vacuum Mode | Low-vacuum compatible with LHSED detector |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT710HR |
| Instrument Type | Benchtop SEM |
| Electron Source | Thermal Field Emission Gun (TFEG) |
| Secondary Electron Resolution | 1 nm @ 30 kV |
| Backscattered Electron Resolution | 2 nm @ 30 kV |
| Accelerating Voltage | 0.1–30 kV |
| Maximum Magnification | 1,000,000× |
| Probe Current | Up to 300 nA |
| Sample Chamber | Large-volume, front-loading with wide-access door |
| Operating Modes | High Vacuum / Low Vacuum (LV/LA variants available) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JIB-4700F |
| Instrument Type | Benchtop Dual-Beam FIB-SEM |
| Electron Source | Cold Field Emission Gun (CFEG) |
| Secondary Electron Resolution | 1.2 nm @ 15 kV, 1.6 nm @ 1 kV |
| Backscattered Electron Resolution | 2.5 nm |
| FIB Resolution | 5 nm @ 30 kV |
| Magnification Range | 25× – 1,000,000× |
| Acceleration Voltage | 0.1–30 kV |
| Maximum FIB Current | 90 nA |
| Maximum SEM Probe Current | 300 nA |
| Gas Injection System | Up to 3 independent channels |
| Sample Stage | 5-axis fully aligned motorized stage |
| Maximum Sample Diameter | 150 mm |
| Sample Loading | Airlock-style exchange |
| Detector Interfaces | EDS, EBSD, STEM, SE/BSE |
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