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| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-120i |
| Acceleration Voltage | Up to 120 kV |
| Magnification Range | 50× – 1,200,000× |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-ARM300F2 |
| Price | USD 6.8M (est.) |
| Acceleration Voltage | Up to 300 kV |
| Magnification Range | 100×–2,000,000× |
| Guaranteed HAADF-STEM Resolution | 53 pm (300 kV, with ETA corrector + FHP2 polepiece) |
| EDS Detector | Dual large-area SDD (158 mm² total active area) |
| Solid Angle for EDS | 2.2 sr (with WGP polepiece) |
| Cs Corrector | JEOL 12-Pole Monochromator-Based Spherical Aberration (Cs) Corrector |
| Software | COSMO™ Auto-Aberration Correction Suite |
| Gun Type | Next-Generation Cold Field-Emission Gun (Cold-FEG) |
| Environmental Shielding | Integrated Active Vibration & Acoustic Damping Enclosure |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-ARM200F(C)-NEO ARM |
| Acceleration Voltages | 30 kV, 80 kV, 200 kV |
| Magnification Range | 50× to 2,000,000× |
| Point Resolution | 0.078 nm (at 200 kV) |
| Energy Resolution | ≤0.3 eV (with monochromated cold FEG) |
| Configuration | Dual spherical aberration correctors (objective and condenser), integrated STEM/TEM/EELS/EDS platform |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-2100Plus |
| Acceleration Voltages | 80, 100, 120, 160, 200 kV |
| Magnification Range | 50× to 1,500,000× |
| Point Resolution | 0.19 nm |
| Line Resolution | 0.14 nm |
| Minimum Probe Size | 0.5 nm |
| Tilt Range | ±25° |
| Condenser System | Three-Stage Lens Design |
| Pole Piece Options | UHR, HR, HT, HC, CRYO |
| Operating System | 64-bit Windows-based Control Interface |
| Integrated Detectors | STEM, EDS, CCD, EELS |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | JEM-ACE200F |
| Price | USD $3,000,000 |
| Acceleration Voltage | Up to 200 kV |
| Maximum Magnification | 2,000,000× |
| Point Resolution | 0.21 nm |
| Lattice Resolution | 0.10 nm |
| STEM Resolution | 0.136 nm |
| Information Limit | 0.11 nm |
| EDS Configuration | Dual Ultra-High-Sensitivity Silicon Drift Detectors (SDD) |
| Lorentz Mode | Standard |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-F200 |
| Price | USD $2,000,000 |
| Acceleration Voltage | Up to 200 kV |
| Magnification Range | 50× – 2,000,000× |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | JEM-3300 |
| Price Range | USD 6.2–6.9 million (est.) |
| Acceleration Voltage | Up to 300 kV |
| Magnification Range | 2,000× – 1,000,000× |
| Electron Source | Cold Field Emission Gun (CFEG) |
| Energy Filter | Integrated Omega-Type Electron Energy Filter |
| Automation | Automated Sample Loading System, JADAS Software Suite, Phase Plate Compatibility, Köhler Illumination Optics |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | CRYO ARM™ 200 II (JEM-Z200CA) |
| Acceleration Voltage | 200 kV |
| Magnification Range | ×100 to ×1,000,000 |
| Spherical Aberration Coefficient (Cs) | 1.5 mm |
| Chromatic Aberration Coefficient (Cc) | 1.8 mm |
| Specimen Temperature | ≤100 K |
| Sample Storage Capacity | Up to 12 cryo-samples |
| Energy Filter | Integrated Omega-type Energy Filter |
| Optional Software | JEOL Automated Data Acquisition System (JADAS) |
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