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| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JMS-S3000 |
| Ion Optics | SpiralTOF™-plus 2.0 |
| Operating Modes | TOF (standard), Linear TOF (optional), TOF/TOF (optional) |
| Application Scope | Synthetic polymers, biomacromolecules, materials science |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JMS-T2000GC |
| Type | Time-of-Flight (TOF) GC-MS System |
| Ionization Modes | Electron Ionization (EI), Chemical Ionization (CI), Field Ionization (FI), and Optional Atmospheric Pressure Chemical Ionization (APCI) |
| Mass Accuracy | < 1 ppm (external calibration), < 0.5 ppm (internal lock mass) |
| Mass Resolution | > 10,000 (FWHM, m/z 500) |
| Acquisition Rate | Up to 50 spectra/sec |
| Mass Range | m/z 10–4,000 |
| Detector | Microchannel Plate (MCP) with Delayed Extraction |
| Vacuum System | Dual-stage differential pumping with turbomolecular pumps |
| GC Interface | Direct capillary column coupling with heated transfer line (up to 350 °C) |
| Software | MassCenter™ v5.x with automated deconvolution, library search (NIST, Wiley, JEOL MS Library), and quantitative workflow support |
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