Empowering Scientific Discovery

3nh TS7010 Portable Spectrophotometric Colorimeter for Plastics and Coatings

Add to wishlistAdded to wishlistRemoved from wishlist 0
Add to compare
Brand 3nh
Origin Guangdong, China
Manufacturer Type Manufacturer
Product Category Domestic
Model TS7010
Product Type Spectrophotometric Colorimeter
Instrument Type Portable
Optical Geometry d/8° Integrating Sphere
Illuminants D65, A, F2 (CWF)
Spectral Range 400–700 nm
Repeatability ΔE*ab ≤ 0.1 (MAV/SCI, after warm-up and calibration, 30 measurements of white tile at 5 s intervals)

Overview

The 3nh TS7010 Portable Spectrophotometric Colorimeter is an ISO- and CIE-compliant instrument engineered for high-precision color measurement in industrial quality control environments. It operates on the principle of diffuse illumination and 8° viewing geometry (d/8°), conforming to CIE Publication No. 15, ISO 7724-1, ASTM E1164, GB/T 3978, and DIN 5033 Teil 7. The device employs a dual-row 24-element silicon photodiode array detector coupled with a planar grating spectrometer, enabling full-spectrum acquisition across the visible range (400–700 nm) at 10 nm bandwidth resolution. Unlike filter-based tristimulus meters, the TS7010 captures complete spectral reflectance data—ensuring traceable, physics-based colorimetric calculations in CIE LAB, XYZ, Yxy, and LCh spaces. Its integrated ETC (Every Test Calibration) system performs automatic optical recalibration against an internal reference white tile before each measurement, eliminating drift and maintaining long-term stability of L*, a*, b* values without external recalibration. Designed for metrological integrity, every unit ships with a traceable calibration certificate aligned to China’s National Institute of Metrology (NIM), satisfying GLP-aligned audit requirements for laboratories operating under ISO/IEC 17025 or IATF 16949 frameworks.

Key Features

  • Human-centered ergonomic design: Compact form factor (81 × 71 × 214 mm), contoured grip, and 460 g mass enable fatigue-free continuous operation during production-line inspections.
  • Full-spectrum LED illuminant: Engineered white-light LED source delivers uniform spectral power distribution across 400–700 nm—avoiding gaps common in single-chip LEDs and ensuring compliance with CIE standard illuminants D65, A, and F2 (CWF).
  • Dual 24-channel silicon photodiode array: Provides extended dynamic range—resistant to saturation under high-reflectance conditions while retaining sensitivity at low reflectance levels—critical for measuring dark plastics and metallic coatings.
  • ETC real-time calibration: Each measurement cycle includes an internal reference check using a proprietary scratch-resistant, non-yellowing ceramic white standard embedded within the optical path—guaranteeing <0.1 ΔE*ab repeatability (MAV/SCI mode) over time.
  • Self-contained operation: On-device color evaluation—including pass/fail judgment, color difference mapping, and directional hue shift visualization—requires no PC connection or proprietary software installation.

Sample Compatibility & Compliance

The TS7010 accommodates solid, flat, or slightly curved surfaces typical of injection-molded plastics, painted automotive parts, powder-coated panels, textile swatches, ceramic tiles, and printed packaging substrates. Its 8 mm aperture is optimized for representative sampling of heterogeneous materials while minimizing edge effects. Measurement compliance extends to multiple international standards: CIE 15:2018 (Colorimetry), ISO 7724-1:2022 (Paints and varnishes — Color measurement), ASTM D2244-22 (Standard Practice for Calculation of Color Differences), and GB/T 3978–2008 (Standard Illuminants and Geometrical Conditions for Colorimetry). Instrument validation follows NIM-traceable protocols, supporting regulatory readiness for FDA 21 CFR Part 11–aligned workflows when paired with optional secure data export modules.

Software & Data Management

While fully functional as a standalone instrument, the TS7010 supports USB data transfer for traceable reporting. Internal memory stores up to 500 standard references and 10,000 sample records—including spectral curves, CIE coordinates, ΔE*ab and ΔE00 values, and pass/fail status flags. Exported CSV files contain wavelength-resolved reflectance data (at 10 nm intervals), enabling third-party analysis in MATLAB, Python (NumPy/SciPy), or commercial QC platforms such as Minitab or JMP. Firmware updates preserve backward compatibility with historical datasets, and all timestamped measurements include environmental metadata (ambient temperature, humidity, and battery level) for root-cause analysis in deviation investigations.

Applications

The TS7010 serves as a primary color verification tool across regulated and high-volume manufacturing sectors. In plastics processing, it validates batch-to-batch consistency of ABS, PC, and PP components prior to assembly. For coating suppliers, it quantifies gloss-independent color match between spray-applied and baked finishes on metal substrates. Within textile dye houses, it verifies shade conformity across dye lots under standardized D65 simulation. Printers use its spectral output to assess metamerism risk between CMYK process colors and PMS spot inks. Additionally, its portability enables field verification of architectural coatings on façade mock-ups and automotive OEM paint shops where lab-based benchtop spectrophotometers are impractical.

FAQ

What standards does the TS7010 comply with for color measurement?
It conforms to CIE No. 15, ISO 7724-1, ASTM E1164, DIN 5033 Teil 7, and GB/T 3978—ensuring cross-platform comparability with other CIE-compliant instruments.
Does the TS7010 require periodic recalibration by a service center?
No. Its ETC system performs automatic internal calibration before every measurement; however, annual verification against a NIST-traceable white standard is recommended for ISO/IEC 17025 accreditation.
Can the TS7010 measure translucent or textured samples?
It is optimized for opaque, matte-to-semi-gloss surfaces. For translucent films or heavily textured parts, use the optional 8 mm platform adapter to ensure consistent contact pressure and minimize scattering artifacts.
Is spectral data export supported for advanced analysis?
Yes—full 400–700 nm reflectance spectra (10 nm intervals) are exportable via USB in CSV format, compatible with spectral modeling and PCA-based batch clustering workflows.
How is measurement traceability maintained across multiple TS7010 units?
Each unit undergoes inter-instrument agreement testing per BCRA Series II tiles (ΔE*ab ≤ 0.4), and factory calibration reports document individual spectral responsivity curves referenced to NIM primary standards.

InstrumentHive
Logo
Compare items
  • Total (0)
Compare
0