DAZHAN DZDR-S Transient Plane Source (TPS) Thermal Conductivity Analyzer

Overview

The DAZHAN DZDR-S is a benchtop Transient Plane Source (TPS) thermal conductivity analyzer engineered for high-precision, non-destructive measurement of thermal transport properties across a broad spectrum of homogeneous and heterogeneous materials. Based on the ISO 22007-2 standard for transient plane source methods, the instrument applies a thin, symmetrically sandwiched nickel foil sensor—acting simultaneously as both heat source and resistance thermometer—to the surface or interior of a sample. A controlled current pulse induces a transient temperature rise, and the resulting voltage response is recorded with microsecond resolution. Thermal conductivity (λ), thermal diffusivity (α), and volumetric heat capacity (ρc_p) are derived directly from the slope and curvature of the log(ΔT) vs. log(t) curve in the mid-time domain, eliminating reliance on calibration standards or geometric assumptions typical of steady-state techniques.

Key Features

• Triple-probe configuration (7.5 mm, 15 mm, and 50 mm diameter sensors) enables scalable testing—from small laboratory specimens to industrial-scale composites—with optimized signal-to-noise ratio per sample thickness and thermal inertia.
• ARM-based embedded control system ensures deterministic real-time data acquisition, synchronized pulse generation, and on-board preliminary analysis—reducing latency and external dependency.
• High-resolution analog front-end with 24-bit ADC guarantees sub-millikelvin temperature resolution during transient response capture, critical for low-conductivity materials (e.g., aerogels, foams, polymers).
• Intuitive 7-inch capacitive touchscreen interface with multilingual support (English default), graphical real-time curve monitoring, and context-sensitive parameter guidance.
• No sample machining required beyond surface planarity; minimum lateral dimensions are 2× the probe diameter, and minimum thickness is 0.5× the probe radius—enabling rapid screening of as-received materials including coatings, battery electrodes, and thermal interface materials (TIMs).
• Integrated thermal guard design minimizes lateral heat loss during short-duration tests (5–160 s), improving fidelity for anisotropic and low-diffusivity samples.

Sample Compatibility & Compliance

The DZDR-S accommodates diverse physical states without phase-specific hardware modification: rigid solids (metals, ceramics, composites), semi-solids (thermal greases, phase-change materials), viscous liquids (coolants, oils), granular media (filled powders, MOFs), and layered structures (coated substrates, laminates). Sample preparation adheres to ASTM D5470 and ISO 22007-2 guidelines for interfacial contact optimization—including recommended thermal interface paste application and clamping pressure protocols. All firmware and software modules comply with GLP documentation requirements, supporting audit trails, user access levels, electronic signatures, and raw-data immutability per FDA 21 CFR Part 11 when operated in networked laboratory environments.

Software & Data Management

Bundled DAZHAN TPS Analysis Suite v3.2 provides full workflow automation: automated probe selection based on input geometry, adaptive pulse duration optimization, multi-curve statistical fitting (including outlier rejection via Chauvenet’s criterion), and ISO-compliant uncertainty propagation reporting. Export formats include CSV, XML, and PDF reports with embedded metadata (operator ID, timestamp, environmental conditions, probe serial number). The software supports batch processing of up to 99 sequential measurements, automatic pass/fail flagging against user-defined specification limits, and direct integration with LIMS via OPC UA or RESTful API endpoints. Raw binary acquisition files (.tpsd) are stored with checksum verification and time-stamped versioning for full traceability.

Applications

• Quality control of thermal interface materials (TIMs) in electronics packaging and EV battery module assembly.
• R&D characterization of novel insulators (aerogels, vacuum panels) and high-conductivity composites (graphene-filled polymers, metal matrix composites).
• Regulatory submission support for medical device thermal management (ISO 10993-12) and aerospace material qualification (AMS 3675).
• Teaching laboratories requiring hands-on demonstration of Fourier’s law, thermal resistance networks, and transient conduction theory.
• Geotechnical and building science applications—including soil thermal resistivity mapping and insulation product certification per EN 12667.

FAQ

What standards does the DZDR-S comply with?
The instrument implements the transient plane source method per ISO 22007-2 and aligns with ASTM D5470 Annex A4 for thermal resistance measurement of thin materials.
Can the DZDR-S measure anisotropic materials?
Yes—by orienting the probe normal to principal axes and comparing results across orthogonal placements, in-plane vs. through-plane conductivity ratios can be quantified with appropriate uncertainty budgeting.
Is cryogenic or high-temperature operation supported?
Standard configuration operates at ambient temperature; optional environmental chambers extend the range to –40 °C to 300 °C, with probe-specific thermal drift compensation enabled in firmware.
How is probe calibration maintained?
Each sensor undergoes NIST-traceable factory calibration using certified reference materials (e.g., Pyroceram 9606, copper, glycerol); recalibration intervals are tracked automatically and flagged at 12-month or 500-test thresholds.
Does the system support GMP/GLP-compliant reporting?
Yes—audit trail logging, electronic signature workflows, and report templates conforming to ICH M7 and USP analytical instrument qualification (AIQ) criteria are available in licensed mode.