Keithley 2400 and 2401 SourceMeter Instruments
| Brand | Keithley (Tektronix) |
|---|---|
| Origin | USA |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Models | 2400, 2401 |
| Pricing | Upon Request |
Overview
The Keithley 2400 and 2401 SourceMeter® instruments are precision integrated source-measure units (SMUs) engineered for high-accuracy DC parametric testing of semiconductor devices, passive components, materials, and nanoscale structures. Unlike conventional power supplies or multimeters, each SMU combines a highly stable, low-noise voltage/current source with a true 5½-digit digital multimeter in a single-channel architecture—enabling simultaneous sourcing and measurement with full four-quadrant operation. This architecture supports both sink and source functionality across voltage and current domains, making it ideal for I-V characterization, leakage current analysis, diode/fet parameter extraction, and resistance profiling under controlled bias conditions. The instruments operate on the principle of closed-loop feedback-controlled sourcing with real-time measurement readback, ensuring traceable accuracy and high reproducibility essential for R&D labs, process development, and production test environments.
Key Features
- Four-quadrant operation: seamless transition between sourcing and sinking voltage/current without hardware reconfiguration
- Wide dynamic range: 10 pA to 10 A sourcing/measurement (2400), 1 μV to 1100 V sourcing/measurement, up to 1000 W pulse power capability
- High accuracy: 0.012% basic voltage measurement accuracy, 0.015% basic current measurement accuracy (1-year specification)
- True 5½-digit resolution (2400) and enhanced low-current sensitivity in the 2401 model optimized for sub-picoampere measurements
- Integrated 6-wire (Kelvin) ohms measurement with programmable current reversal to eliminate thermoelectric offset errors
- Built-in pass/fail comparator with user-definable limits for automated go/no-go testing
- Optional contact check function to verify probe integrity prior to measurement—critical for wafer-level probing and MEMS device testing
- Digital I/O interface supporting TTL-compatible signals for high-speed binning, handler synchronization, and robotic integration
Sample Compatibility & Compliance
The 2400/2401 series is widely deployed in applications requiring compliance with international test standards including ASTM F1527 (semiconductor parametric testing), JEDEC JESD22-A114 (electrostatic discharge characterization), and ISO/IEC 17025-accredited calibration workflows. Its low-noise design and guard-driven architecture meet stringent requirements for measuring high-impedance materials (e.g., dielectrics, polymers, biological membranes) and ultra-low-leakage devices (e.g., GaN HEMTs, photodiodes, MEMS sensors). All models support GLP/GMP-relevant features such as audit-trail-enabled configuration logging and password-protected instrument settings—facilitating regulatory alignment in medical device and automotive electronics validation.
Software & Data Management
Keithley’s KickStart Instrument Control Software provides intuitive, no-code test sequencing for rapid setup of sweeps, pulses, and multi-point measurements. For advanced automation, native SCPI command support enables seamless integration into LabVIEW, Python (PyVISA), MATLAB, and .NET-based test systems. Data export formats include CSV, Excel (.xlsx), and TDMS; all timestamped readings include metadata (source settings, timestamps, trigger events). The instruments comply with IEEE 488.2 and USB-TMC standards, and optional firmware upgrades support enhanced security protocols required for FDA 21 CFR Part 11-compliant environments—including electronic signatures and role-based access control.
Applications
- DC I-V characterization of diodes, transistors, solar cells, and OLEDs
- Leakage current and breakdown voltage testing of capacitors, PCB substrates, and insulating films
- Resistivity and sheet resistance mapping of thin-film materials and transparent conductive oxides
- Parametric testing of packaged ICs, bare die, and wafer-level devices in probe station environments
- Material science research involving conductive polymers, 2D materials (graphene, MoS₂), and perovskite thin films
- Automotive electronics validation: battery cell impedance screening, connector contact resistance, and ESD immunity pre-compliance checks
FAQ
What is the difference between the Model 2400 and Model 2401?
The 2401 offers enhanced sensitivity for low-current measurements (down to 10 fA typical noise floor) and improved low-current accuracy specifications, while retaining identical voltage sourcing capabilities and software compatibility with the 2400.
Can the 2400/2401 perform pulsed I-V measurements?
Yes—both models support arbitrary waveform generation via internal scripting (TSP®) or external triggering, enabling sub-millisecond pulse widths with synchronized measurement capture.
Is remote programming supported over Ethernet?
Yes—models equipped with optional LAN (LXI) interfaces support SCPI over TCP/IP, VXI-11, and raw socket communication for enterprise-scale test system deployment.
Do these instruments support 6-wire resistance measurements?
Yes—integrated 6-wire ohms mode with automatic current reversal and offset compensation is standard on both models.
Are calibration certificates included with shipment?
Factory calibration is performed per ANSI/NCSL Z540-1 and NIST-traceable standards; optional ISO/IEC 17025-accredited calibration certificates are available upon request.
