Lei-Tech LK-4K60330 4K Apochromatic Continuous Zoom Lens (0.3–3.0×)

Overview

The Lei-Tech LK-4K60330 is a high-performance apochromatic continuous zoom lens engineered for demanding industrial inspection, metrology, and scientific imaging applications requiring full 4K resolution (3840 × 2160) across its entire magnification range (0.3× to 3.0×). Designed using advanced multi-element apochromatic optical architecture, it corrects chromatic aberration across the visible spectrum (400–700 nm) and minimizes spherical and coma aberrations—ensuring consistent color fidelity, edge-to-edge sharpness, and geometric accuracy at all magnifications. Its fixed 100 mm working distance enables stable integration into automated vision systems, coordinate measuring machines (CMMs), and inverted or upright microscope configurations. The lens features a robust mechanical design with precision-ground glass elements, anti-reflective broadband coatings optimized for machine vision illumination (including LED ring lights and coaxial sources), and thermal stability suitable for extended operation in controlled laboratory and production-floor environments.

Key Features

• Apochromatic correction: Simultaneous correction of primary and secondary chromatic aberration for minimal color fringing and high-fidelity monochrome/RGB imaging.
• True 4K resolution support: Optimized MTF performance ≥ 120 lp/mm at Nyquist frequency for 2/3″ and 1″ sensors; validated under ISO 19246 test conditions.
• Continuous zoom with tactile detents: Smooth manual or motorized zoom actuation with positive stops at standard magnification increments (0.3×, 0.5×, 1.0×, 2.0×, 3.0×) for repeatable setup and calibration traceability.
• Fixed working distance (100 mm): Eliminates focus drift during zooming; compatible with fixed-focus lighting geometries including coaxial, ring, and oblique illumination.
• C-mount interface with 50 mm barrel diameter: Enables direct mounting on industrial cameras and seamless integration with standard optomechanical rails and stages.
• Modular configuration options: Available with 90° prism adapter, APO-enhanced variants (LK-4K60330-1APO / -2APO), motorized zoom drive interfaces, and integrated turret-compatible versions for multi-objective workflows.

Sample Compatibility & Compliance

The LK-4K60330 supports both 2/3″ and 1″ format image sensors, making it compatible with leading global machine vision camera platforms (e.g., Basler ace, FLIR Blackfly S, Sony IMX series). Its optical design meets ISO 10110 surface quality standards (scratch-dig 20–10) and complies with RoHS 2011/65/EU and REACH (EC) No. 1907/2006 material restrictions. While not certified to FDA 21 CFR Part 11, its deterministic mechanical behavior, repeatable zoom positioning, and stable optical parameters support validation under GLP and GMP-aligned quality systems. Documentation packages include factory-measured MTF curves, distortion maps (per ISO 9039), and calibration reports traceable to NIST-traceable interferometric measurement standards.

Software & Data Management

The lens operates as a passive optical component and requires no firmware or driver installation. However, its deterministic magnification scaling (verified per ISO 10934-1) enables precise pixel-to-micron conversion in third-party metrology software—including Keyence IM Series, Mitutoyo Quick Vision, OpenCV-based custom inspection suites, and HALCON 22.11+ with calibrated lens models. Optional encoder-integrated zoom modules provide real-time magnification feedback via TTL or RS-422 output, supporting closed-loop scaling in automated AOI and SPC reporting workflows. All technical documentation—including dimensional drawings, Zemax® .ZAR files, and distortion correction coefficients—is provided in English and conforms to ISO/IEC 17025 documentation requirements for accredited calibration labs.

Applications

• High-accuracy PCB and semiconductor package inspection: Resolves solder joint geometry, wire bond profiles, and micro-via registration at sub-5 µm effective resolution (at 3.0×).
• Non-contact dimensional metrology: Used in conjunction with calibrated stage motion for length, angle, and radius measurements compliant with ISO 15530-3 protocols.
• Life science imaging: Supports fluorescence and brightfield macroscopy of tissue sections, microfluidic devices, and 3D-printed scaffolds with uniform illumination response across zoom range.
• Automotive component QA: Verifies surface finish, coating thickness uniformity, and assembly alignment on brake calipers, fuel injectors, and EV battery modules.
• Educational and R&D microscopy: Serves as an upgrade path for legacy stereo and compound microscopes seeking native 4K acquisition without sensor crop or interpolation artifacts.

FAQ

Is the LK-4K60330 compatible with 1″ sensors?
Yes—the lens projects a fully illuminated image circle ≥ 16.0 mm in diameter, supporting 1″ format sensors (13.2 × 8.8 mm active area) without vignetting at all magnifications.
Does the lens require refocusing when zooming?
No—it is a parfocal design: focus remains constant across the full 0.3×–3.0× range when used with its specified 100 mm working distance.
Can distortion be corrected in software?
Yes—Lei-Tech provides polynomial distortion coefficients (radial and tangential terms) and calibrated grid images per ISO 9039 Annex B for integration into HALCON, VisionPro, or custom OpenCV pipelines.
What is the maximum permissible sensor resolution this lens supports?
It delivers diffraction-limited performance up to 12 MP (4096 × 3000) on 1″ sensors and 8 MP (3840 × 2160) on 2/3″ sensors under optimal illumination and alignment conditions.
Are APO variants certified to ISO 10110-5 Class 1?
Yes—LK-4K60330-1APO and -2APO variants undergo additional wavefront error testing (λ/20 RMS @ 632.8 nm) and are supplied with interferometric certification reports.