Scanning Electron Microscope
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| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | ZEM20 EDS-integrated Desktop SEM |
| Instrument Type | Desktop / Benchtop SEM |
| Electron Source | Tungsten Filament |
| SEM Class | Entry-level Tungsten-Filament SEM |
| Secondary Electron Image Resolution | 4 nm |
| Maximum Magnification | 360,000× |
| Accelerating Voltage Range | 3–20 kV (1 kV step adjustment) |
| Backscattered Electron Image Resolution | 4 nm |
| Integrated EDS System | Oxford Instruments Xplore Compact 30 |
| EDS Detector Active Area | 30 mm² (SuperATW window) |
| Energy Resolution | ≤129 eV (Mn Kα) |
| Cooling | Peltier-cooled (LN₂-free) |
| Elemental Detection Range | Boron (B, Z=5) to Californium (Cf, Z=98) |
| Analysis Modes | Point, Line, and Area Mapping |
| Software Interface | Fully Localized Chinese UI with Optional English Toggle |
| Vacuum Architecture | Dual-chamber Separated Vacuum System (Gun Chamber & Sample Chamber) |
| Sample Chamber Camera | Integrated HD In-Chamber Camera |
| Sample Stage Mode | Deceleration Mode for Low-Conductivity Specimens |
| Typical Sample Exchange Time | <60 s |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Model | ZEM20Pro |
| Instrument Type | Desktop SEM |
| Electron Source | LaB₆ (Lanthanum Hexaboride) |
| Secondary Electron Resolution | 3 nm |
| Magnification Range | up to 360,000× |
| Accelerating Voltage | 3–30 kV |
| Backscattered Electron Resolution | 3 nm |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Model | ZEM20Pro |
| Instrument Type | Desktop SEM |
| Electron Source | LaB₆ (Lanthanum Hexaboride) |
| Secondary Electron Resolution | 3 nm @ 30 kV |
| Backscattered Electron Resolution | 3 nm @ 30 kV |
| Magnification Range | 10× – 360,000× |
| Accelerating Voltage | 3–30 kV |