Scanning Electron Microscope
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| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Electron Source | Schottky Field-Emission |
| Resolution (SE & BSE) | 1.5 nm @ 1 kV |
| Maximum Magnification | 2,000,000× |
| Accelerating Voltage Range | 1–20 kV |
| Integrated EDS Capability | Yes |
| Vacuum Pumping Time | <15 s |
| Vibration Isolation | 27 Independent Passive Damping Units |
| Sample Chamber | Fully Enclosed with Internal Vacuum Lock |
| Conductive Coating Not Required | Yes |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Electron Source | Schottky Field-Emission |
| Resolution (SE & BSE) | 1.5 nm @ 1 kV |
| Maximum Magnification | 2,000,000× |
| Accelerating Voltage Range | 1–20 kV |
| Integrated EDS Capability | Yes |
| Vacuum Pumping Time | <15 s |
| Vibration Isolation | 27 independent passive damping units |
| Sample Stage | Motorized, fully automated |
| Optical Navigation | Integrated color optical microscope with panoramic overview |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Electron Source | Schottky Field-Emission |
| Resolution (SE & BSE) | 1.5 nm |
| Maximum Magnification | 2,000,000× |
| Accelerating Voltage Range | 1–20 kV |
| Integrated EDS Capability | Yes |
| Vacuum Pumping Time | ≤15 s |
| Vibration Isolation | 27 Independent Passive Damping Units |
| Sample Stage | Motorized, Fully Automated |
| Optical Navigation | Integrated Color Optical Microscope |
| Conductive Coating Not Required | Yes |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom Pharos G2 |
| Instrument Type | Desktop/Compact FE-SEM |
| Electron Source | Schottky Field Emission Gun (FEG) |
| SEM Class | High-Resolution Field-Emission SEM |
| Secondary Electron (SE) Resolution | ≤1.5 nm |
| Backscattered Electron (BSE) Resolution | ≤1.5 nm |
| Magnification Range | 10× to 2,000,000× |
| Accelerating Voltage | 1 kV – 20 kV |
| Standard Detectors | In-lens SE Detector, Solid-State BSE Detector |
| Optional Detector | Energy-Dispersive X-ray Spectrometer (EDS) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Pro |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | <6 nm @ 10 kV |
| Maximum Magnification | 350,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | <6 nm @ 10 kV |
| Vacuum Pumping Time | <15 s |
| Imaging Time | <30 s |
| Detector Configuration | Quadrant BSE Detector + SED + Optional SE/BSE Mix Mode |
| Navigation | Integrated 27–160× Color Optical Microscope |
| Sample Stage | Motorized, Fully Automated |
| Software Output Formats | JPEG, TIFF, PNG (up to 7680×4800 px) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom Pro |
| Instrument Type | Desktop SEM |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | 6 nm |
| Backscattered Electron Resolution | 6 nm |
| Magnification | Up to 350,000× |
| Accelerating Voltage | 4.8–20.5 kV |
| Vacuum Pump-down Time | <15 s |
| Filament Lifetime | >1,500 h |
| Imaging Modes | SE, BSE, and Real-time SE/BSE Mixed Imaging |
| Upgrade Path | Compatible with Phenom ProX EDS integration |
| Brand | Phenom (Thermo Fisher Scientific) |
|---|---|
| Origin | Netherlands |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | ≤6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage | 4.8–20.5 kV (continuously adjustable) |
| Backscattered Electron Resolution | ≤6 nm |
| Vacuum System | Integrated turbomolecular pump (15 s pump-down to operational vacuum) |
| Sample Chamber Dimensions | Ø32 mm × H100 mm |
| Optical Navigation Camera | Integrated full-color CCD |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Phenom Pro_2 |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | 6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | 8 nm |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Model | Phenom Pro_3 |
| Electron Source | CeB₆ (Cerium Hexaboride) |
| Secondary Electron Resolution | ≤6 nm |
| Backscattered Electron Resolution | ≤6 nm |
| Magnification Range | 20× to 350,000× |
| Accelerating Voltage | 4.8–20.5 kV |
| Vacuum Pump-down Time | <15 s |
| Filament Lifetime | >1,500 h |
| Detector Options | Integrated SE + BSE detectors (simultaneous acquisition) |
| Optional Capabilities | Real-time SE/BSE mixed imaging, EDS-ready upgrade path (to Phenom ProX), Hydrogel-compatible dynamic observation mode |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Phenom Pro_4 |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron (SE) Resolution | 8 nm at 20 kV |
| Backscattered Electron (BSE) Resolution | 8 nm at 20 kV |
| Magnification Range | 20× to 200,000× |
| Accelerating Voltage | 4.8–20.5 kV |
| Detector | Integrated SE and BSE detectors |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | 6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | 6 nm |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom ProX |
| Instrument Type | Desktop SEM |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | 6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage | Basic Modes: 2 / 5 / 10 / 15 / 20 kV |
| Advanced Mode | Continuously Adjustable from 4.8–20.5 kV (for simultaneous imaging & EDS analysis) |
| Backscattered Electron Resolution | 6 nm |
| Vacuum Pump-down Time | <15 s |
| Elemental Analysis Range | B (Z=5) to Am (Z=95) |
| Detector | Silicon Drift Detector (SDD) |
| Cooling | Peltier (cryogen-free) |
| Optional Modules | Automated Particle Analysis, Inclusion Analysis, Fiber Morphology Statistics, 3D Roughness Reconstruction, High-Magnification Stitching |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | ProX |
| Instrument Type | Desktop SEM |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | 6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | 6 nm |
| EDS Detector | Silicon Drift Detector (SDD) |
| Cooling | Peltier (liquid-nitrogen-free) |
| Vacuum Pump-down Time | <15 s |
| Elemental Analysis Range | B (5) to Am (95) |
| Operating Environment | Standard lab/office/facility (no anti-vibration table required) |
| Brand | Phenom |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | Phenom ProX (Domestically Manufactured Variant) |
| Instrument Type | Desktop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| SEM Type | High-Resolution Field-Emission SEM |
| Secondary Electron Resolution | ≤6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | ≤6 nm |
| Sample Stage Capacity | Ø32 mm × H100 mm |
| Vacuum Mode | Standard & Charge Reduction Mode |
| Integrated Detector | Silicon Drift Detector (SDD) EDS |
| Software | Element Identification (EID) with Point, Line, and Area Mapping |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Model | ProX |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | <1.5 nm |
| Magnification Range | Up to 2,000,000× |
| Accelerating Voltage | 1–20 kV (continuously adjustable) |
| Maximum Sample Size | 100 × 100 mm |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom ProX SEM-EDS Integrated System |
| Instrument Type | Desktop Scanning Electron Microscope |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | 6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage | Basic modes: 2 kV, 5 kV, 10 kV, 15 kV, 20 kV |
| Advanced mode | continuously adjustable from 4.8 kV to 20.5 kV |
| Backscattered Electron Resolution | 6 nm |
| Standard Detector | High-sensitivity quadrant backscattered electron detector (BSE) with compositional and topographic imaging modes |
| Optional Detector | Secondary Electron Detector (SED), Mix mode imaging with adjustable SE/BSE ratio |
| EDS Detector | Silicon Drift Detector (SDD) |
| EDS Cooling | Peltier thermoelectric cooling (liquid-nitrogen-free) |
| Elemental Range | Boron (Z=5) to Americium (Z=95) |
| Vacuum Pump-down Time | <15 s |
| Filament Lifetime | ~3,000 hours |
| Optical Zoom | 20×–135× |
| Environmental Tolerance | No anti-vibration table required |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | ProX Desktop Scanning Electron Microscope |
| Instrument Type | Desktop SEM-EDS Integrated System |
| Electron Source | Cerium Hexaboride (CeB6) |
| Secondary Electron Image Resolution | 6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage | Basic Mode: 2 / 5 / 10 / 15 / 20 kV |
| Advanced Mode | 4.8–20.5 kV (continuous, for simultaneous imaging & EDS analysis) |
| Backscattered Electron Image Resolution | 6 nm |
| Standard Detectors | Backscattered Electron Detector (BSD), Energy-Dispersive X-ray Spectrometer (EDS) |
| Optional Detector | Secondary Electron Detector (SED) |
| Vacuum Modes | High Vacuum / Low Vacuum (for charge mitigation) |
| Optical Navigation Camera | Integrated Full-Color CCD Camera |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom ProX_1 |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | 6 nm |
| Backscattered Electron Resolution | 8 nm |
| Magnification Range | Up to 350,000× |
| Accelerating Voltage | 4.8–20.5 kV |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Phenom ProX_2 |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | ≤6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | ≤6 nm |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom Pure |
| Instrument Type | Desktop SEM |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | <10 nm |
| Maximum Magnification | 175,000× |
| Accelerating Voltages | 5 kV, 10 kV |
| Backscattered Electron Resolution | <10 nm |
| Vacuum Pump-down Time | <10 s |
| Imaging Time to First Image | ≤30 s |
| Optional Environmental Mode | Temperature-Controlled Stage for Liquid Samples |
| Upgrade Path | Compatible with Phenom Pro Series |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Model | Pure |
| Electron Source | Cerium Hexaboride (CeB6) |
| Secondary Electron Resolution | 10 nm |
| Maximum Magnification | 175,000× |
| Accelerating Voltages | 5 kV and 10 kV |
| Backscattered Electron Resolution | 10 nm |
| Vacuum Pump-down Time | <15 s |
| Filament Lifetime | ~1,500 hours |
| Operating Environment | Standard laboratory or office floor (anti-vibration design) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom Pure |
| Instrument Type | Desktop SEM |
| Electron Source | Cerium Hexaboride (CeB6) |
| Secondary Electron Resolution | ≤10 nm |
| Backscattered Electron Resolution | ≤10 nm |
| Maximum Magnification | 175,000× |
| Accelerating Voltages | 5 kV, 10 kV |
| Vacuum Pump-Down Time | <15 s |
| CE-B6 Filament Lifetime | >1500 h |
| Detectors | Integrated BSE Detector, Optional SE Detector |
| Sample Chamber Dimensions | Ø 100 mm × 80 mm (H) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Product Type | Desktop SEM |
| Electron Source | Cerium Hexaboride (CeB6) |
| Secondary Electron Resolution | 10 nm |
| Maximum Magnification | 175,000× |
| Accelerating Voltages | 5 kV and 10 kV |
| Backscattered Electron (BSE) Resolution | 10 nm |
| Vacuum Pump-down Time | <15 s |
| CeB6 Filament Lifetime | ~1,500 hours |
| Operating Environment | Standard lab/office floor (anti-vibration design) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom Pure G7 Desktop SEM |
| Instrument Type | Desktop / Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | <10 nm |
| Maximum Magnification | 175,000× |
| Accelerating Voltages | 2 kV / 5 kV / 10 kV |
| Backscattered Electron Resolution | <10 nm |
| Standard Detector | Quad-segment Backscattered Electron Detector (Topography & Composition Modes) |
| Optional Detector | Secondary Electron Detector (SED) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | SEM-AFM |
| Instrument Type | Benchtop SEM-AFM Integrated System |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Maximum Sample Dimensions | 21 mm × 11 mm × 8 mm |
| Sample Weight Limit | 100 g |
| Open-Loop Scan Range | 100 µm × 100 µm × 20 µm |
| Closed-Loop Scan Range | 80 µm × 80 µm × 16 µm |
| Spatial Resolution (XY/Z) | 0.2 nm × 0.2 nm / 0.04 nm |
| Compatible Modes | Topography, Roughness, CAFM, KPFM, FMM, PFM, EFM, Force–Distance (F–z), Current–Voltage (I–V) |
| Brand | Phenom |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China-made) |
| Model | Phenom XL |
| Instrument Type | Desktop SEM |
| Electron Gun | Cerium Hexaboride (CeB6) |
| Secondary Electron Resolution | ≤8 nm |
| Maximum Magnification | 200,000× |
| Accelerating Voltage | 4.8–20.5 kV (continuously adjustable) |
| Backscattered Electron Resolution | ≤8 nm |
| Optical Microscope Magnification | 3–19× |
| Vacuum Pumping Time | <30 s |
| Standard Detector | High-Sensitivity Quad-SEG BSE Detector |
| Filament Lifetime | ~3,000 h |
| Sample Chamber Diameter | 100 mm |
| Optional Add-ons | EDS spectrometer, 3D roughness reconstruction, fiber/particle/porosity statistical analysis modules, in-situ tensile stage (2–1000 N, 0.1–15 mm/min) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | XL G3 |
| Instrument Type | Desktop SEM |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | 8 nm |
| Backscattered Electron Resolution | 8 nm |
| Magnification Range | 20×–200,000× |
| Accelerating Voltage | 4.8–20.5 kV |
| Maximum Sample Diameter | 100 mm |
| Vacuum Pumping Time | <30 s |
| Optical Navigation Lens | 3–19× |
| Detector | High-Sensitivity Quad-SEG BSE Detector |
| Filament Lifetime | ~3,000 h |
| Optional | EDS Detector Integration |
| Brand | Phenom (Thermo Scientific) |
|---|---|
| Origin | Netherlands |
| Instrument Type | Desktop SEM |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | <8 nm |
| Maximum Magnification | 200,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | <8 nm |
| Optional Detectors | EDS, Secondary Electron Detector |
| Brand | Quantum Design |
|---|---|
| Origin | USA |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | FusionScope |
| Instrument Type | Floor-standing / Conventional Large-scale |
| Electron Gun Type | Thermal Field Emission |
| Magnification Range | 25× – 200,000× |
| Acceleration Voltage | 3.5 kV – 15 kV |
| Maximum Sample Diameter | 20 mm |
| Standard Detector System | In-chamber Secondary Electron (SE) Detector |
| AFM Scan Range (XY) | 22 × 22 µm (closed-loop) |
| AFM Z-Range | 15 µm |
| AFM Imaging Noise | <50 pm @ 1 kHz |
| AFM Probe Type | Self-sensing piezoresistive cantilever |
| AFM Modes | Contact, Dynamic (Tapping), FIRE, MFM, C-AFM, EFM |
| SEM Beam Current | 5 pA – 2.5 nA (typ. 300 pA) |
| Chamber Vacuum | 1–10 µTorr |
| Pump-down Time | <5 min |
| Sample Stage Tilt | −10° to +80° |
| Dimensions (W×D×H) | 690 × 835 × 1470 mm |
| Weight | 330 kg |
| Brand | Safematic |
|---|---|
| Origin | Switzerland |
| Model | CCU-010 LV |
| Instrument Type | Benchtop Coating System |
| Secondary Electron Image Resolution | 3–8 nm |
| Maximum Magnification | <100,000× |
| Accelerating Voltage | 0.5–30 kV |
| Sample Stage | ≥60 mm diameter, height-adjustable, tilt-capable, optional planetary or rotation stage |