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| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Model | VX8000 |
| Measurement Field | 300 × 200 mm (with 4 corner R50 fillets) |
| Max. Load Capacity | 7.5 kg |
| Image Sensor | 20 MP CMOS |
| Lens | High-Resolution Dual Telecentric Optics |
| XY Stage Travel | 210 × 110 × 75 mm |
| Dimensions (L×W×H) | 531 × 503 × 731 mm |
| Optional Height Probe | Spot Diameter Φ38 µm, Measurable Depth-to-Diameter Ratio h/φ = 1.5 |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Domestic OEM |
| Model | 464 |
| Configuration | Bridge-Type |
| Operation Mode | Fully Automatic |
| Orientation | Vertical |
| Measurement Principle | Contact & Non-Contact Hybrid Metrology |
| Measurement Volume | 500 × 700 × 500 mm |
| Standard Temperature | 20 ± 2 °C |
| Minimum Air Supply Pressure | 6 bar |
| Primary Application Domains | Mechanical Manufacturing, Automotive Industry, Electronics, Aerospace, and Metrology Laboratories |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | SJ5800 |
| Price | USD 74,800 (FOB Shenzhen) |
| Operating Principle | Stylus Profilometry (Contact Tactile Method) |
| Measurement Mode | Contact |
| Sampling Lengths | 0.008, 0.08, 0.25, 0.8, 2.5, 8.0, 25 mm (selectable) |
| Evaluation Length | Automatically calculated as integer multiples of selected sampling length |
| Vertical Resolution | 0.001 µm (1 nm) |
| Measurement Repeatability | 1σ ≤ 1 nm |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | Novator 78 |
| Operation Mode | Fully Automatic |
| Measurement Volume | ≥400 × 300 × 200 mm |
| Software Platform | VisionX with PTB-Certified AI Edge Detection Engine |
| Compliance | PTB-validated sub-pixel image analysis algorithms |
| Integration | Native CAD/Gerber import with auto-coordinate alignment |
| Application Scope | Precision geometric metrology for mold, electronics, medical devices, and PCB/FPC manufacturing |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | W412 |
| Price | USD 135,000 (FOB Guangdong) |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | W1 |
| Measurement Volume | 140 × 100 × 100 mm |
| Optical Configuration | White LED Illumination, 1024 × 1024 Imaging Sensor, Standard 10× Interference Objective (Optional: 2.5×, 5×, 20×, 50×, 100×), Standard 0.5× Optical Zoom (Optional: 0.375×, 0.75×, 1×), 3-Position Manual Objective Turret (Optional: 5-Position Motorized), XY Stage Travel: 140 × 100 mm (320 × 200 mm Platform), Z-Scan Range: 10 mm, Max. Sample Load: 10 kg, Host Dimensions: 700 × 606 × 920 mm |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Model | SJ6000 |
| Measurement Range (Linear) | 0–80 m |
| Linear Measurement Accuracy | ±0.5 ppm |
| Linear Resolution | 0.001 µm |
| Angular Measurement Accuracy | ±(0.02%R + 0.1 + 0.024M)″ |
| Frequency Stability | ±0.05 ppm |
| Warm-up Time | ≤ 6 min |
| Dynamic Sampling Rate | 50 kHz |
| Maximum Measurement Speed | 4 m/s |
| Operating Temperature | 0–40 °C |
| Storage Temperature | −20–70 °C |
| Relative Humidity | 0–95% RH |
| Wavelength | 633 nm |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | VX8300 |
| Price | USD 78,500 (FOB Shenzhen) |
| Measurement Field | 300 × 200 mm (with 4 corner R50 fillets) |
| Max. Load Capacity | 7.5 kg |
| Image Sensor | 20 MP CMOS |
| Lens | High-Resolution Telecentric Lens (Dual-Sided) |
| XY Motorized Stage Travel | 210 × 110 × 75 mm |
| Optional Height Probe | Spot Diameter Φ38 µm, Max. Depth-to-Diameter Ratio h/φ = 1.5 |
| Optional Horizontal Rotary Stage | Φ60 mm max. diameter |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Model | SJ5100-Prec300 |
| Measurement Range | 0–340 mm (external), 5–200 mm (internal, with reference ring gauge) |
| Accuracy | ≤ ±(0.2 + L/1000) µm (L in mm, external dimension) |
| Repeatability (internal) | ≤ 0.1 µm (standard probe), ≤ 0.2 µm (hook probe), ≤ 0.3 µm (internal measuring assembly) |
| Measuring Force | 0.05/0.1/0.3/0.5 N (sensor-based internal force) |
| Environmental Requirement | 20 ± 2 °C, temp. stability ≤ 0.5 °C/h |
| Base Material | Granite |
| Resolution | 0.01 µm |
| Weight | 150 kg |
| Dimensions | 1400 × 400 × 450 mm |
| Five-Axis Worktable (ST-30.1) | Z-axis 0–50 mm, Y-axis ±25 mm, X-axis floating ±10 mm, Z-rotation ±3°, Y-tilt ±3°, load capacity 50 kg, table size 350 × 25 mm |
| Brand | Chotest |
|---|---|
| Model | PO40 |
| Origin | Guangdong, China |
| Type | In-machine contact touch probe |
| Transmission | Modulated infrared |
| Repeatability (2σ) | <1.0 µm |
| Trigger life | >10 million cycles |
| Battery life | ≥150 hours (5% duty cycle) |
| Operating range | XY plane ±360°, Z-axis ±85°, linear transmission distance up to 5 m (standard power mode) |
| Protection rating | IP68 (probe & receiver), IPX8 (probe body sealing) |
| Power source | Replaceable primary battery |
| Control interface | M-code compatible, auto-wake via receiver, programmable delay-off |
| Diagnostic feedback | Multi-state LED indicators (wake/sleep, ready/triggered, battery status) |
| Software integration | Compatible with Chotest in-machine measurement software for automated program generation, 3D coordinate acquisition, and GD&T-compliant reporting |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Domestic Product | Yes |
| Model | GTS-50 |
| Price | ¥2,000,000 |
| Max Measurement Range | 160 m |
| Horizontal Rotation | ±360° |
| Vertical Pitch | −145° to +145° |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Model | WD4000 |
| Thickness Range | 150 µm – 2000 µm |
| 3D Surface Topography Resolution (Z) | ≤ 0.1 nm |
| Roughness RMS Repeatability | ±0.005 nm |
| Supported Wafer Sizes | 4″, 6″, 8″, 12″ |
| Optical Principle | Spectral Confocal Dual-Side Scanning + White-Light Interferometry (WLI) |
| Max XY Travel | 400 mm × 400 mm |
| Z Travel | 75 mm |
| Scan Modes | Full-map, Cross (‘+’), Custom Multi-point |
| Interferometric Objective Options | 2.5×, 5×, 10×, 20×, 50× |
| Reflectivity Range | 0.05% – 100% |
| Film Thickness Range (IR Interferometry) | 37 µm – 1850 µm (n ≈ 1.5) |
| Minimum Detectable Film Thickness | 0.4 µm |
| Vacuum Chuck | ESD-Safe Perforated Ceramic Vacuum Stage |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Model | W293 |
| Measurement Area | 140 × 100 mm |
| Type | Non-contact Optical 3D Surface Metrology System |
| Compliance | ISO 25178-2, ISO 25178-601, VDI/VDE 2634 Part 3 |
| Software Certification | FDA 21 CFR Part 11–compliant audit trail & electronic signature support (optional module) |
| Vertical Resolution | Sub-nanometer (≤0.1 nm typical) |
| Lateral Resolution | ≤0.5 µm (dependent on objective lens) |
| Z-Scan Range | Up to 10 mm (configurable with high-precision PZT or motorized stage) |
| Automation | Auto-focus, auto-fringe search, auto-brightness adjustment, multi-region stitching, programmable stage navigation |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Model | GTS3800 |
| Price | USD 280,000 (approx.) |
| Max Measurement Range | 160 m |
| Absolute Distance Measurement Accuracy | 10 µm (full range) |
| Horizontal Rotation | ±360° |
| Vertical Pitch | −145° to +145° |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | GTS6000-456 |
| Price | USD 280,000 (FOB Shenzhen) |
| Max Measurement Range | 160 m |
| Horizontal Rotation | ±360° |
| Vertical Pitch | −145° to +145° |
| Volumetric Accuracy | 15 µm + 6 µm/m |
| Environmental Compensation | Integrated meteorological station (temperature ±0.1°C, pressure ±0.1 kPa, humidity ±6% RH) |
| Enclosure Rating | IP54 |
| Tracking Head Weight | 16 kg |
| Communication | Dual-mode WLAN IEEE 802.11n + Gigabit Ethernet |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Regional Classification | Domestic (China) |
| Model | PO40 |
| Price | USD 1,700 (approx.) |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Model | WD4000 |
| Measurement Principles | Spectral Confocal Reflectometry (thickness), White-Light Interferometry (3D topography) |
| Wafer Compatibility | 4″–12″ |
| Max. Scan Area | 400 mm × 400 mm |
| Z-Axis Resolution | ≤ 0.1 nm |
| Thickness Range | 150 µm – 2000 µm |
| Surface Reflectivity Range | 0.05% – 100% |
| Roughness RMS Repeatability | ±0.005 nm |
| Motion Stage | Granite-based龙门 with AC servo direct-drive & 0.1 µm encoder resolution |
| Environmental Isolation | Active vibration damping for sub-nm stability |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | NS200 |
| Price | USD 84,000 (FOB Shenzhen) |
| Measurement Principle | Contact-mode stylus profilometry with LVDC capacitive transduction |
| Vertical Resolution | Sub-ångström (≤0.1 Å) |
| Lateral Scan Range | 55 mm |
| X/Y Stage Travel | 150 mm × 150 mm (motorized) |
| R-θ Stage | 360° continuous motorized rotation |
| Max Sample Thickness | 50 mm |
| Wafer Compatibility | 150 mm (6″) and 200 mm (8″) |
| Vertical Measurement Range | Up to 1000 µm |
| Force Control | 1–50 mg adjustable, electromagnetic micro-force actuation |
| Probe Tip Radius | 2 µm diamond |
| Optical Navigation | 5 MP color camera with real-time probe trajectory overlay |
| SPC Module | Integrated statistical process control with trend charts, Cp/Cpk, histogram, and outlier detection |
| Environmental Requirements | 16–25 °C (ΔT < 2 °C/h), 30–40% RH (non-condensing), floor vibration ≤ 6.35 µm/s (1–100 Hz), ambient noise ≤ 80 dB, laminar airflow ≤ 0.508 m/s downward |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | NS200 |
| Price | USD 84,000 (FOB) |
| Measurement Principle | Capacitive (LVDC) |
| XY Stage Travel | 150 mm × 150 mm |
| Maximum Scan Length | 55 mm |
| Step Height Repeatability | ±0.005 nm (5 Å) |
| Max Sample Size | 200 mm (8-inch wafer) |
| Sensor Resolution | 0.01 Å (sub-angstrom) at 13 µm range |
| Force Control | Adjustable from 1 µN to 10 mN |
| Vertical Range | 13 µm (standard), optional up to 1050 µm |
| Optical Navigation | 5 MP color camera (orthogonal or oblique view) |
| SPC Module | Yes |
| Environmental Requirements | 16–25 °C, ≤40% RH (non-condensing), vibration <6.35 µm/s (1–100 Hz) |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | WD4000 |
| Price | USD 420,000 (FOB Shenzhen) |
| Thickness Range | 150 µm – 2000 µm |
| TTV/Bow/Warp Measurement Accuracy | ±0.1 µm (typical, calibrated per ISO 21287) |
| Z-Axis Resolution (Interferometry) | ≤ 0.1 nm |
| Lateral Scan Area | 400 mm × 400 mm |
| Vertical Travel | 75 mm |
| Maximum Wafer Size | 300 mm (12″) |
| Surface Reflectivity Range | 0.05% – 100% |
| Roughness RMS Repeatability | ≤ 0.005 nm (ISO 25178-6 compliant) |
| Interferometric Objective Options | 2.5×, 5×, 10×, 20×, 50× |
| Spectral Confocal Thickness Sensor | Dual-beam, high-stability SLED source, 90 µm measurement range (n = 1.5), minimum detectable thickness: 0.4 µm |
| Infrared Interferometry Module | SLED source, 37–1850 µm range |
| Scan Modes | Full-map, cross (‘X’), star (‘+’), user-defined multi-point |
| Compliance | ISO 5725 (accuracy & precision), ISO 25178-2 (areal texture), ISO 10110-7 (optical surface form), SEMI D39 (wafer geometry), ASTM F39 (silicon wafer bow/warp) |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Model | SJ5100-Prec300 |
| Measurement Range | 0–340 mm |
| Resolution | 0.01 µm |
| Operating Environment | 20 ± 2 °C |
| Compliance | ISO/IEC 17025-aligned calibration infrastructure, compatible with JJG 30–2012 (China), DIN 861, and ASTM E1316 (indirect metrological traceability framework) |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Model | NS391 |
| Measurement Principle | Capacitive (LVDC Sensor) |
| Measurement Area | 150 mm × 150 mm |
| Scan Length | 55 mm |
| Step Height Repeatability | 5 Å |
| Maximum Sample Size | 200 mm (8-inch wafer) |
| Sensor Resolution | ≤0.01 Å (at 13 µm range) |
| Force Control | Adjustable constant contact force, ultra-low inertia electromagnetic actuation |
| Structural Design | Single-arch龙门 (monolithic龙门) frame with vibration isolation |
| Optical Navigation | 5 MP color camera, coaxial & oblique viewing options |
| Software Modules | SPC analysis, multi-region auto-scan, 3D surface reconstruction, stress calculation, roughness/waviness parameter extraction (Ra, Rq, Rv, Rp, Rz, etc.) |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Model | SJ6000 |
| Linear Measurement Range | 80 m |
| Linear Measurement Accuracy | ±0.5 ppm |
| Linear Resolution | 1 nm |
| Angular Measurement Accuracy | (0.02%R + 0.1 + 0.024M) arcsec |
| Frequency Stabilization Accuracy | ±0.05 ppm |
| Warm-up Time | ≤ 6 min |
| Light Source | Single-Frequency He-Ne Laser |
| Environmental Compensation | Integrated ECU Unit (air temperature, material temperature, pressure, humidity) |
| Maximum Dynamic Measurement Speed | 4 m/s |
| Supported Geometric Error Measurements | Straightness, Flatness, Squareness, Pitch, Yaw, Roll, Perpendicularity, Runout |
| Data Output | CNC-compatible error compensation files, ISO-compliant calibration reports with full audit trail |
| Brand | CHOTEST |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | VX8000 |
| Measuring Range | 300 mm × 200 mm (with 4 corner R50 fillets) |
| Max Load Capacity | 7.5 kg |
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