Empowering Scientific Discovery

Suzhou Langsheng Scientific Instrument Co., Ltd.

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BrandLANScientific
OriginJiangsu, China
Manufacturer TypeDirect Manufacturer
Regional CategoryDomestic (China)
ModelSuperSEM N10XL
Instrument TypeDesktop SEM
Electron SourceTungsten Filament
SEM ClassEntry-Level Tungsten-Filament SEM
Sample Chamber SizeUp to 100 × 100 mm
Detector ConfigurationSecondary Electron Detector (SED), Quadrant Backscattered Electron Detector (BSE), Integrated Silicon Drift Detector (SDD)-based EDS System
Real-Time Imaging ModeVideo-rate BSE + EDS spectral acquisition
Software FeaturesAuto-focus, Auto-stigmation, Auto-contrast/brightness, Large-area Stitching, Live EDS Mapping, Real-time Spectral Overlay
Power RequirementStandard AC 220 V, 50 Hz
Footprint< 0.8 m²
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BrandLANScientific
OriginJiangsu, China
Manufacturer TypeDirect Manufacturer
Origin CategoryDomestic (China)
ModelSuperSEM N10
Instrument TypeBenchtop SEM
Electron SourceTungsten Filament
SEM ClassEntry-Level Tungsten-Filament SEM
Max Sample Diameter90 mm
Max Sample Thickness40 mm
Stage TravelX: 25 mm, Y: 25 mm, Z: 30 mm
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BrandLANScientific
OriginJiangsu, China
Manufacturer TypeDirect Manufacturer
Country of OriginDomestic (China)
ModelSuperSEM N10eV
Instrument TypeDesktop / Benchtop SEM
Electron Gun TypeTungsten Filament
Microscope ClassEntry-Level Tungsten-Filament SEM
Maximum Sample Dimensions90 mm (diameter) × 40 mm (thickness)
Stage Travel RangeX: 25 mm, Y: 25 mm, Z: 30 mm
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BrandLANScientific
OriginJiangsu, China
Manufacturer TypeDirect Manufacturer
Region ClassificationDomestic (China)
ModelSuperSEM N10eX
Instrument TypeDesktop SEM
Electron SourceTungsten Filament
SEM ClassEntry-Level Tungsten-Filament SEM
Maximum Sample Diameter90 mm
Maximum Sample Thickness40 mm
Stage TravelX: 25 mm, Y: 25 mm, Z: 30 mm
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