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| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | TX3000 |
| Application | Field-Portable |
| Instrument Type | Total-Reflection X-Ray Fluorescence (TXRF) |
| Industry-Specific Use | Soil & Atmospheric Environmental Monitoring |
| Sample Form Compatibility | Liquid, Suspension, Solid, Filter-Collected Particulates |
| Detection Principle | Grazing-Incidence Excitation with Multilayer Monochromator and Silicon Drift Detector (SDD) |
| Key Performance | Sub-pg Absolute Detection Limits for Heavy Metals (e.g., Cr, Pb, As, Cd, Hg, Ni, Cu, Zn), Simultaneous Multi-Element Quantification (up to 30 elements), Minimal Sample Requirement (<10 µL liquid or <1 mg solid) |
| Brand | LANScientific |
|---|---|
| Model | ScopeX PC7 |
| Origin | Jiangsu, China |
| Manufacturer | LANScientific |
| Type | Benchtop ED-XRF Coating Thickness Analyzer |
| Measurement Principle | Energy-Dispersive X-Ray Fluorescence (ED-XRF) |
| Geometry | Bottom-illumination (upward irradiation) |
| Sample Handling | Manual X-Y stage with 25 µm resolution |
| Detection Depth Range | Up to 30 mm in recessed features |
| Optional Configurations | Micro-focus X-ray source, interchangeable collimators (φ0.1 mm to φ2.0 mm), automatic filter wheel (Al, Cu, Ti, Ni, Mo, Sn, Pb) |
| Compliance | Designed for ISO 3497, ASTM B568, ASTM F136, EN 14571, and GB/T 1764–2022 conformance |
| Software | Multi-FP fundamental parameters quantification engine with matrix correction, spectral deconvolution, and GLP-compliant audit trail |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX G59 |
| Configuration | Benchtop |
| Instrument Type | Conventional ED-XRF Spectrometer |
| Industry-Specific Application | Non-Ferrous Metals (Precious Metals) |
| Elemental Range | Al (13) to U (92) |
| Detection Limit | ≤10 ppm for Ag and Cu |
| Quantitative Accuracy | ±0.001% for Au in AU99999-grade material |
| Detector | Large-Area Silicon Drift Detector (SDD) |
| Optical Geometry | Vertical Beam Path |
| Sample Chamber | Extra-Large, Accommodates Irregular & High-Volume Specimens |
| Excitation Source | Rhodium Anode Microfocus X-ray Tube |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg–Brentano reflection (θs–θd) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ cps |
| Power | kW-class (integrated high-power microfocus X-ray source) |
| Compliance | CE-marked, IEC 61000-6-3/6-4, EN 62471 (UV/X-ray safety) |
| Sample Stage | Motorized goniometer with air-spring assisted large-window lift door |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic (China) |
| Model | TX3000 |
| Application | Field-Portable |
| Instrument Type | Total Reflection X-Ray Fluorescence (TXRF) |
| Industry-Specific Use | Soil & Atmospheric Analysis |
| Sample Forms | Liquid, Suspension, Solid, Particulate Deposits |
| Detection Principle | Grazing-Incidence Excitation with Multilayer Monochromator |
| Key Elements | Cr, Pb, As, Cd, Hg, Ni, Cu, Zn (expandable to ~30 elements) |
| Minimum Sample Volume | <10 µL (liquid) or <100 ng (solid deposit) |
| Detection Limits | Sub-pg to low-pg range for most metals (e.g., 0.1–5 pg for transition metals under optimized conditions) |
| Radiation Safety | Compliant with GBZ 126–2011 and IEC 62495 |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | LabStation-5 |
| Instrument Type | Powder X-ray Diffractometer |
| Instrument Configuration | Floor-standing |
| Detector | High-Performance Photon-Counting (HPC) Pixelated Detector |
| Goniometer | θ/θ Closed-Loop Drive System |
| Optical Geometry | Switchable Bragg-Brentano & Parallel-Beam Configurations |
| Sample Stage | Modular, Tool-Free Quick-Release Sample Holder System |
| Diffractometer Radius | ≥300 mm |
| Beam Path Architecture | Non-Coplanar Arm Design |
| Slit System | Motorized Variable Aperture |
| Brand | LANScientific |
|---|---|
| Model | TrueX 700 Series |
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Portable/Handheld EDXRF Spectrometer |
| Application Field | Environmental Soil & Sediment Screening |
| Elemental Range | Mg to U |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements under standardized conditions) |
| Detector | High-resolution silicon drift detector (SDD), Peltier-cooled, 25 mm² active area |
| Sample Form Compatibility | Solids, powders, filter residues, slurries (dried or semi-dry), thin films, particulates, and heterogeneous field-collected matrices |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX Limestone Analyzer |
| Price Range | USD $13,500 – $40,500 (FOB) |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Design | Geological & Mineralogical Applications |
| Elemental Coverage | Na (Sodium) to U (Uranium) |
| Detection Limit | Sub-ppm to % level (matrix-dependent) |
| Sample Compatibility | Solid, Powder, Pellet, Liquid, Thin Film |
| Regulatory Compliance | GB18871-2002, GBZ115-2002 |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Country of Origin | China |
| Model | YANG 700 |
| Pricing | Upon Request |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX Cement CaO Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Design | Non-Ferrous Metals & Construction Materials |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | ppm-level |
| Sample Compatibility | Solid, Powder, Pellet, Liquid, Thin Film |
| Regulatory Compliance | GB18871-2002, GBZ115-2002 |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX Refractory Materials Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Application | Non-Ferrous Metals & Refractories |
| Elemental Range | Na (11) – U (92) |
| Detection Limit | down to ppm level |
| Light Element Capability | Enhanced Si, P, S, Al, Mg via low-energy X-ray excitation + intelligent vacuum system |
| Collimators | 5 mm, 3 mm, 1 mm, 0.5 mm (motorized auto-switching) |
| Filters | Multiple filter sets (software-selectable) |
| Detector | Peltier-cooled silicon drift detector (SDD) |
| Sample Chamber | Large-volume, multi-geometry compatible (solid, powder, liquid, thin film, irregular shapes) |
| Data Interface | USB 3.0, Wi-Fi 802.11ac, Bluetooth 5.0 |
| Report Output | Customizable Excel/PDF reports with logo, spectral overlays, and sample metadata |
| Safety Compliance | Fully shielded metal enclosure with interlocked safety door |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Regional Category | Domestic |
| Model | TrueX 200S |
| Application | Handheld/Portable |
| Instrument Type | Conventional |
| Industry-Specific Type | General-Purpose |
| Elemental Range | Mg–U |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV |
| Repeatability | 0.1% |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | FRINGE EV |
| Instrument Type | Powder X-ray Diffractometer |
| Power | kW-class (rated for continuous operation in desktop configuration) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ counts per second (CPS) |
| Geometry | Bragg–Brentano θ–2θ reflection mode |
| Sample Stage | Motorized goniometer with fixed center-of-rotation |
| Slit System | Integrated Soller collimators (no moving adjustment parts) |
| Safety | Interlocked sample chamber with auto-shutdown, door-closed status indicator |
| Software | CrystalX — automated phase identification, quantitative Rietveld refinement, crystallinity index calculation, and EDS-enabled hybrid XRD/EDS data correlation |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Line | TX3300 Series |
| Instrument Type | Total Reflection X-Ray Fluorescence (TXRF) |
| Application Form Factor | Handheld / Portable |
| Elemental Range | Mg (12) to U (92) |
| Detection Limit | 20 pg/mL (ppb) in liquid matrix |
| Sample Consumption | ≤ 10 µL per analysis |
| Detector | 20 mm² Silicon Drift Detector (SDD) |
| Industry Focus | Energy & Chemicals |
| Compliance Context | Designed for GLP-compliant trace metal quantification in regulated environmental and industrial labs |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | FRINGE D200 |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Benchtop |
| Power Rating | kW-class (air-cooled or integrated water-cooling system) |
| Detector | Xeye2D 2D hybrid pixel array detector |
| Goniometer | High-precision vertical θ–θ configuration |
| Software | CrystalX automated phase analysis suite |
| Sample Compatibility | Powders, bulk solids, thin films, liquids |
| Safety | Interlocked sample chamber, automatic beam shutter, real-time door status feedback |
| Optional Accessories | High-temperature stage, cryo-stage, humidity-controlled cell |
| Compliance | Designed to meet IEC 61010-1 (safety), ISO 17025 operational readiness guidelines, and GLP-aligned data integrity practices |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX CSA 660F |
| Configuration | Benchtop / Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose Elemental Analysis |
| Elemental Range | Mg (12) to U (92) |
| Detection Limit | 1 ppm (for typical matrixes) |
| Energy Resolution | <125 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for homogeneous standards) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | ScopeX 800 |
| Configuration | Benchtop (non-vacuum) |
| Detector | High-resolution silicon drift detector (SDD), Peltier-cooled |
| Software | LANScientific XRF Analysis Suite v3.2 |
| Compliance | GB18871-2002, GBZ115-2002 |
| Sample Chamber | Sealed metal enclosure with interlocked safety shutter |
| Analysis Modes | Fundamental Parameters (FP), Calibration Curve, Empirical Matrix Correction |
| Report Export | PDF, Excel, CSV, XML |
| User Management | Role-based access control (Admin, Operator, Viewer) |
| Data Audit Trail | GLP-compliant timestamped logs |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX Mn-Fe Alloy Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm (for selected elements under optimized conditions) |
| Energy Resolution | <125 eV at Mn Kα (5.89 keV) |
| Repeatability | ≤0.1% RSD (for major alloying elements at ≥1 wt%) |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | TrueX 800 |
| Application | Handheld / Portable |
| Instrument Type | Conventional EDXRF |
| Industry-Specific Use | Non-Ferrous & Ferrous Alloys |
| Elemental Range | Mg to U |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD for major elements |
| Detector | Si-PIN Semiconductor Detector |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg–Brentano θ–2θ reflection mode |
| Power Supply | kW-class integrated X-ray source (exact rating per configuration) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1 × 10⁷ counts per second (CPS) |
| Sample Stage | Fixed-height goniometer with air-spring assisted large-window lift door |
| Software | CrystalX™ automated phase identification & quantification suite |
| Compliance | Designed for GLP-compliant labs |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg-Brentano θ–2θ reflection mode |
| Power | kW-class sealed-tube X-ray source (rated output ≥ 1.8 kW) |
| Detector | Digital Pulse Processing Counter (DPPC), count rate capacity ≥ 1×10⁷ cps |
| Sample Stage | Motorized goniometer with integrated Soller slits, fixed divergence slit, anti-scatter slit, and receiving slit |
| Compliance | CE-marked, IEC 61010-1 safety certified, radiation-shielded enclosure with interlocked safety door and real-time chamber status feedback |
| Software | CrystalX™ v3.x — automated phase identification (ICDD PDF-4+ database), quantitative Rietveld refinement, crystallinity index calculation (e.g., Lc, La, graphitization degree via (002) peak FWHM & d-spacing), energy-dispersive spectroscopy (EDS) co-acquisition support |
| Sample Forms | Powders, solid blocks, thin films, coatings |
| Dimensions | 620 × 540 × 480 mm (W × D × H) |
| weight | ~95 kg |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Category | Domestic (China) |
| Model | TrueX G7 |
| Price Range | USD 14,000 – 42,500 |
| Form Factor | Handheld / Portable |
| Instrument Type | Benchtop-Portable Hybrid ED-XRF |
| Industry-Specific Design | Non-Ferrous & Precious Metals |
| Elemental Range | Al (13) to U (92) |
| Detection Limit | Sub-ppm to % level (matrix-dependent) |
| Compliance | CE, RoHS, FCC Class B |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Regional Category | Domestic |
| Model | ScopeX PG7 |
| Price Range | USD 14,000 – 42,500 (FOB) |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Application | Non-Ferrous Metals |
| Elemental Range | Al (13) to U (92) |
| Detection Limit | Sub-ppm to % level (matrix-dependent) |
| Safety Compliance | IEC 62495, GB/Z 25488–2010, EN 61000-6-3 |
| Software | ScopeX Suite v3.2 (with audit trail, user-level permissions, CFR Part 11 ready) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Regional Classification | Domestic |
| Model | ScopeX |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <125 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
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