X-Ray Instruments
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| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | OEM System Package |
| Form Factor | Handheld or Benchtop Configurable |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Design | Electronics Manufacturing & RoHS Compliance |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα (5.9 keV) |
| Repeatability | ≤0.1% RSD (for major elements under controlled conditions) |
| Detector | Silicon Drift Detector (SDD) with Peltier cooling |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | OEM Solution |
| Form Factor | Benchtop / Portable |
| Industry Focus | Electronics |
| Elemental Range | Na (11) – U (92) |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV FWHM at Mn Kα |
| Repeatability | ≤0.1% RSD |
| Detector Type | X-ray Detector (Si-PIN, SDD, or CdTe) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | PA-210/PA-230 |
| Power Supply Requirements | +5 VDC @ 15 mA, −5 VDC @ 15 mA |
| HV Input Range | +100 to +200 V (Si-PIN), −90 to −260 V (SDD/CdTe) |
| TEC Drive | +3.5 VDC @ 350 mA |
| Temperature Monitoring | 160 µA-biased silicon diode output |
| Signal Output | Negative pulse (Si-PIN), Positive pulse (SDD/CdTe) |
| Connector | 10-pin micro-DIN (1.0 mm pitch) |
| Thermal Control Capability | Closed-loop stabilization down to 230 K (−43 °C) |
| Compliance | Designed for integration into ISO/IEC 17025-compliant XRF, XRD, and EDX systems |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | PA-210/PA-230 |
| Power Supply Requirements | +5 VDC / −5 VDC (±50 mV ripple, 15 mA each) |
| HV Input Range | +100 to +200 V (Si-PIN), −90 to −260 V (SDD/CdTe) |
| TEC Drive | 3.5 V / 350 mA (max), <0.1 Vpp noise |
| Temperature Sensing | 160 µA-biased diode output (calibrated to 230 K minimum operating point) |
| Connector | 10-pin micro coaxial (0.025" pitch) |
| Mechanical Form Factors | Cylindrical (PA-210, Ø18 mm × 40 mm) and Flexible PCB-mount (PA-230) |
| Compliance | Designed for OEM integration into ISO/IEC 17025-compliant XRF, XRD, and EDX systems |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | XRT-450 |
| Target Anode | Ag (customizable) |
| Window | Be, 125 µm |
| Focal Spot Size | <150 µm FWHM |
| Beam Divergence | 120° |
| Operating Voltage | 5–50 kV |
| Max Tube Current | 250 µA |
| Max Output Power | 6 W |
| Input Voltage | 20 VDC |
| HV Polarity | Anode Grounded |
| Cooling | Conduction or Convection |
| Mounting | Threaded Nozzle |
| Weight | 400 g |
| Operating Temperature | –10 °C to +50 °C |
| Radiation Shielding Compliance | IEC 62495 |
| RoHS Compliance | RoHS3 |
| Warranty | 2 years or 4000 operating hours |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | X-123 |
| Form Factor | Benchtop/Portable |
| Element Range | Na (11) – U (92) |
| Detection Limit | 1 ppm – 99.99% |
| Energy Resolution | 139–260 eV @ 5.9 keV |
| Repeatability | 0.1% |
| Detector | Si-PIN with Two-Stage Thermoelectric Cooling |
| Effective Area | 6–25 mm² |
| Thickness | 500 µm |
| Be Window | 12.5–25 µm |
| Operating Temperature Range | −30 °C to +80 °C |
| Power Consumption | 2.5 W (5 VDC, 300–800 mA) |
| Weight | 180 g |
| Dimensions | 70 × 100 × 25 mm |
| Interface | USB 2.0 (12 Mbps), RS-232 (115.2 kbps), Ethernet (10BASE-T) |
| Compliance | RoHS-compliant, UL 61010-1:2009, CAN/CSA-C22.2 No. 61010-1, TÜV Certified (CU 72101153 01) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | X-123 |
| Detector Type | Si-PIN |
| Active Area | 6–25 mm² |
| Thickness | 300–500 µm |
| Energy Range | 1.5–40 keV |
| Resolution (FWHM @ 5.9 keV) | 145–230 eV |
| Max Count Rate | 2 × 10⁶ cps |
| Power Consumption | 2.5 W (typ.) |
| Dimensions | 70 × 100 × 25 mm |
| Weight | 180 g |
| Cooling | Two-stage thermoelectric (ΔT ≤ 85 °C) |
| Interface | USB 2.0, RS-232, Ethernet (10BASE-T) |
| Compliance | RoHS, UL 61010-1:2009, CAN/CSA C22.2 No. 61010-1 |
| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | X-123 FAST SDD C-Series Window |
| Detector Type | Silicon Drift Detector (SDD) with Si₃N₄/Al Thin-Film Window |
| Application Context | Low-Energy X-ray Detection (down to ~100 eV), Vacuum-Compatible & Ambient-Pressure Configurations |
| Compliance | ASTM E1598, ISO 21434 (X-ray instrumentation framework), Compatible with IEC 61000-4 Electromagnetic Immunity Standards |
| Software Interface | USB 2.0 / Ethernet |
| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | X-123 FAST SDD C2 Window |
| Detector Type | Silicon Drift Detector (SDD) |
| Window Material | Ultra-thin Si₃N₄ (C2 series) |
| Elemental Detection Range | C (4.9 keV) to U (98 keV) |
| Energy Resolution | ≤125 eV at Mn Kα (5.9 keV), typical |
| Count Rate Capability | Up to 10⁶ counts/second |
| Vacuum Compatibility | Yes, integrated vacuum interface |
| Standard Interface | USB 2.0 and digital pulse processing |
| Compliance | CE, RoHS, FCC Class A |
| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | X-123FAST SDD (70 mm²) |
| Resolution | 123 eV FWHM @ 5.9 keV |
| Max Count Rate | >1,000,000 cps |
| Peak-to-Background Ratio | 26,000:1 |
| Window Options | 0.5-mil Be or Si₃N₄ (C2) |
| Cooling ΔT | >85 K |
| Preamplifier Output Pulse Width | <60 ns |
| Active Si Thickness | 500 µm |
| Collimated Effective Area | 50 mm² |
| Total Sensitive Area | 70 mm² |
| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | X-123FAST SDD (70 mm²) |
| Element Range | C (Z=6) to U (Z=92) with C₂ window |
| Detection Limit | 1 ppm – 99.99% |
| Energy Resolution | 123 eV FWHM at 5.9 keV |
| Count Rate Capability | >1,000,000 cps |
| Peak-to-Background Ratio | 26,000:1 |
| Window Options | 0.5-mil Be or C₂ (Si₃N₄) |
| Cooling ΔT | >85 K |
| Rise Time | <60 ns |
| Active Si Thickness | 500 µm |
| Collimated Effective Area | 50 mm² |
| Vacuum Compatibility | Yes |
| OEM Integration | Fully supported for XR100FAST, PX5, and X-123 platform configurations |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | XR-100CR |
| Detector Type | Si-PIN |
| Active Area | 6–25 mm² |
| Thickness | 300 or 500 µm |
| Be Window | 12.5 or 25 µm |
| Energy Resolution | 145–230 eV FWHM (@ 5.9 keV, ⁵⁵Fe) |
| Cooling | Two-stage thermoelectric (TEC), operating temp ≈ −55 °C |
| Power Consumption | <1 W |
| Housing | TO-8 hermetic package |
| Compliance | UL 61010-1:2004, CAN/CSA-C22.2 No. 61010-1:2004, TUV Certified (CU 72072412 01) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | XR-100CR |
| Pricing | Upon Request |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | XR-100FastSDD-70 |
| Active Area | 70 mm² (effective to 50 mm²) |
| Energy Resolution | 123 eV FWHM @ 5.9 keV |
| Max Count Rate | >2,000,000 cps |
| Peak-to-Background Ratio | >26,000:1 |
| Window Options | Be (12.5 µm) or Si₃N₄ (C₂) |
| Detector Thickness | 500 µm |
| Cooling ΔT | >85 K |
| Preamplifier Rise Time | <60 ns |
| Package | TO-8 |
| Certifications | UL 61010-1:2009, CAN/CSA C22.2 No. 61010-1, TUV CU 72101153 01 |
| Brand | Amptek |
|---|---|
| Model | XR-100SDD |
| Detector Type | Silicon Drift Detector (SDD) |
| Active Area | 25 mm² |
| Silicon Thickness | 500 µm |
| Energy Resolution @ 5.9 keV (⁵⁵Fe) | 125–140 eV FWHM |
| Max Count Rate | 500,000 cps |
| Peak-to-Background Ratio | 8200:1 |
| Be Window Thickness | 12.5 µm |
| Operating Temperature | 0°C to +50°C |
| Power Consumption | <1 W |
| Weight | 125 g |
| Dimensions | 7.6 × 4.4 × 2.9 cm |
| Warranty | 1 year |
| Typical Lifetime | 5–10 years |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | XR-100SDD |
| Detector Type | Silicon Drift Detector (SDD) |
| Active Area | 25 mm² |
| Thickness | 500 µm |
| Energy Resolution | 125 eV FWHM @ 5.9 keV (11.2 µs peaking time) |
| Max Count Rate | 500,000 cps |
| Peak-to-Background Ratio | 20,000:1 (5.9 keV / 1 keV) |
| Be Window Thickness | 12.5 µm (0.5 mil) |
| Operating Temperature | ~250 K (−23 °C) |
| Cooling | Two-stage thermoelectric (Peltier), no liquid nitrogen required |
| Encapsulation | TO-8 metal can with vacuum-compatible Be window |
| Power Consumption | <1 W |
| Certifications | UL 61010-1:2004, CAN/CSA-C22.2 No. 61010-1:2004, TÜV Certificate #CU 72072412 02 |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | XR-100SDD |
| Detector Type | Silicon Drift Detector (SDD) |
| Active Area | 25 mm² |
| Thickness | 500 µm |
| Energy Resolution | 125 eV FWHM @ 5.9 keV (11.2 µs peaking time) |
| Max Count Rate | 500,000 cps |
| Peak-to-Background Ratio | 20,000:1 (5.9 keV / 1 keV) |
| Be Window Thickness | 12.5 µm (0.5 mil) |
| Cooling Method | Two-stage thermoelectric (Peltier), no liquid nitrogen required |
| Operating Temperature | ~250 K (−23 °C) |
| Housing | TO-8 metal can |
| Compliance | UL 61010-1:2004, CAN/CSA-C22.2 No. 61010-1:2004, TUV Certified (CU 72072412 02) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | XRA-700 |
| Detector Channels | 7 |
| Cooling | Thermoelectric (Peltier) |
| Power Supply | Integrated regulated DC supply |
| Preamp | Low-noise charge-sensitive preamplifier per channel |
| Energy Range | 1 keV – 40 keV (dependent on detector configuration) |
| Compliance | RoHS, CE |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | OEM Solution |
| Pricing | Upon Request |
| Brand | Amsterdam Scientific Instruments (ASI) |
|---|---|
| Origin | Netherlands |
| Model | Cheetah M3/T3 Ultra (512 × 1024) |
| Sensor Technology | Medipix3RX / Timepix3 hybrid pixel architecture |
| Pixel Size | 55 µm |
| Radiation Tolerance | >1 GGy (electron beam, Giga-eV equivalent) |
| Readout | SPIDR3 or SPIDR3 Turbo (event-driven or frame-based) |
| Data Interface | Gigabit Ethernet (TCP/UDP) to Linux (Ubuntu) workstation |
| Mounting Options | Bottom-mount static or side-insert retractable |
| Compliance | Designed for GLP/GMP-adjacent TEM environments |
| Software Integration | SerialEM, Instamatic, PantaRhei, LiberTEM via RESTful Serval API |
| Brand | Amsterdam Scientific Instruments (ASI) |
|---|---|
| Origin | Netherlands |
| Model | LynX T3 or M3 |
| Pixel Pitch | 55 µm |
| Sensor Options | Si, GaAs, CdTe |
| Readout Speed | Up to >500 MHz (LynX T3), 1800 fps (LynX 1800), 120 fps (LynX 120) |
| Energy Thresholds | 1–8 adjustable thresholds |
| Frame Buffer | On-chip, configurable |
| Compliance | Designed for GLP/GMP-aligned workflows, compatible with ISO/IEC 17025 traceable calibration protocols |
| Software Interface | Native support for EPICS, TANGO, and HDF5-based data streaming |
| Brand | Analytical Instruments |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | Atomray CX-6500 |
| Application | Handheld / Portable |
| Industry-Specific Use | Geological & Mineral Exploration |
| Elemental Range | Mg to U |
| Quantitative Detection Range | 10 ppm – 99 wt% |
| Energy Resolution | <140 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements under controlled conditions) |
| Weight | 1.6 kg (with battery) |
| Dimensions | 254 × 79 × 280 mm (L × W × H) |
| X-ray Tube | Ag anode (standard), optional Au/W/Rh anodes |
| Max. Tube Voltage/Current | 50 kV / 200 µA, fully adjustable |
| Detector | BOOST-type Si-Pin detector (CX-5500 series) |
| Display | 5-inch industrial-grade resistive touchscreen |
| Operating System | Embedded Linux with proprietary analytical software |
| Language Support | English, Chinese, Spanish, French, Russian, Arabic |
| Brightness Control | Ambient-light adaptive auto-brightness |
| Onboard Storage | 32 GB internal flash memory |
| Battery Life | ~8 hours per charge (smart MSBUS battery with real-time SOC monitoring) |
| Connectivity | USB 2.0, Bluetooth 5.0, Wi-Fi 802.11 b/g/n |
| Safety | DoubleBeam™ beam-on-sample interlock system |
| Compliance | Meets IEC 62495 (handheld XRF safety), RoHS, and CE requirements for portable radiation-emitting devices |
| Brand | Anchor Wisdom |
|---|---|
| Origin | Beijing, China |
| Model | DUBHE-1610 |
| Detection Limit (LLD) | 0.4 ppm (S) |
| Measurement Range | 0.4 ppm – 5 wt% |
| Analysis Time | 60–300 s |
| Repeatability | ≤0.2 ppm (at 2 ppm S), ≤0.5 ppm (at 10 ppm S), ≤2.5 ppm (at 50 ppm S) |
| Excitation Line | Cr Kα (5.41 keV) |
| Optical Configuration | Dual Polycapillary Focusing Monochromator + Full-Focus Bent Crystal Analyzer |
| Sample Preparation | ESP (Easy Sample Prepare) System |
| Operating Mode | Benchtop, Air-path, No Gas or Solvent Consumption |
| Brand | Anchor Wisdom |
|---|---|
| Origin | Beijing, China |
| Model | DUBHE-1710 |
| Detection Limit (Cl) | 0.1 ppm |
| Measurement Range | 0.1 ppm – 5 wt% |
| Analysis Time | 60–300 s |
| Repeatability | ≤0.2 ppm (at 1 ppm Cl), ≤0.5 ppm (at 5 ppm Cl), ≤2.5 ppm (at 50 ppm Cl) |
| Sample Prep Time | <10 s |
| Operating Warm-up | ≤10 min |
| Cost per Sample | <USD 0.55 (excl. labor) |
| Brand | Anchor Wisdom |
|---|---|
| Origin | Beijing, China |
| Model | MEGREZ-A |
| Excitation | Dual X-ray tube sources with polycapillary-focusing monochromators |
| Detection Principle | Energy-dispersive X-ray fluorescence (ED-XRF) with monochromatic excitation |
| Elemental Range | Z ≥ 5 (Boron and heavier elements) |
| Detection Limit (Heavy Metals) | As low as 0.05 mg/kg (matrix-dependent) |
| Quantification Method | Fast fundamental parameters (FP) algorithm with minimal or zero calibration standards |
| Compliance | Designed for ISO 8258, ASTM E1621, and GB/T 30091–2013 compliant workflows |
| Brand | Anchor Wisdom |
|---|---|
| Origin | Beijing, China |
| Model | MERAK-CEMII |
| Price Range | USD 70,000 – 140,000 |
| Compliance | GB/T 176–2008 |
| Elements Analyzed | Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn |
| Detection Principle | Wavelength-Dispersive XRF (WDXRF) with High-Flux Doubly Curved Crystal Spectrometer (HF DCCS) and Secondary Target Excitation |
| Sample Form | Solid powders (pressed pellets or fused beads) |
| Vacuum/Atmosphere | Ambient air operation (no vacuum pump or He purge required) |
| Cooling | Peltier-cooled detector (no liquid nitrogen) |
| Stability | Ready for measurement within 3 minutes after power-on |
| Brand | Anchor Wisdom |
|---|---|
| Origin | Beijing, China |
| Model | MERAK-LEII |
| Detection Range | Na–Ti (extendable to C, N, O, F) |
| Light Element LLDs | S ≤ 0.2 ppm, Cl ≤ 0.1 ppm, Si ≤ 0.8 ppm |
| Excitation | Monochromatized Wavelength-Selective X-ray Beam via Focusing Polycapillary Optics |
| Optical Architecture | Fixed X-Ray Path System (XFS) |
| Sample Form | Solid, Liquid, or Powder in Disposable Cups/Membranes |
| Compliance | Designed for ASTM D2622, D4294, D7039, ISO 8754, IP 287, and USP <233> elemental impurity testing workflows |
| Brand | Anchor Wisdom |
|---|---|
| Origin | Beijing, China |
| Model | MERAK-MINI |
| Detection Limit (S) | 0.5 ppm (300 s) |
| Detection Limit (Cl) | 0.3 ppm (300 s) |
| Quantification Range | 0.5 ppm – 5% |
| Analysis Time | 60–300 s |
| Repeatability | RSD ≤ 3% @ 10 ppm S, RSD ≤ 1.5% @ 1000 ppm S |
| Dimensions | 350 mm × 230 mm × 370 mm |
| Weight | 12.5 kg |
| Power Consumption | 80 W |
| Operating Temperature | 5–40 °C |
| Battery Life | >4 h |
| Compliance | ASTM D7039, ASTM D7536, ISO 20884, ISO 15597 |
| Brand | Anchor Wisdom |
|---|---|
| Origin | Beijing, China |
| Model | MERAK-SC |
| Excitation | Monochromatic Focused X-ray (Johansson-type DCC crystal) |
| Detection | Ultra-thin Graphene-window Silicon Drift Detector (SDD) |
| Elemental Range | F–Cl (light elements), K–Zn (transition metals) |
| LOD (F) | 0.15 wt% (300 s, aqueous matrix) |
| LOD (Al–Cl) | 0.0002–0.005 wt% (300 s) |
| Sample Types | Liquids, powders, solids |
| Geometry | Top-illumination |
| Sample Rotation | Motorized, software-controlled |
| Temperature Control | 24 ± 0.3 °C |
| Analysis Time | 30–300 s per sample |
| Stability | < ±3% intensity drift over 24 h |
| Quantification Engine | Fast FP 2.0 fundamental parameters software |
| Compliance | Designed for ISO 8258 (control charts), ASTM E1621 (ED-XRF for cement), USP <233> (elemental impurities), and GLP/GMP-aligned data integrity workflows |
| Brand | Anchor Wisdom |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | MERAK-TINY |
| Pricing | Upon Request |