X-Ray Instruments
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| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 QUEST |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Power | 200 W (0.0002 MW) |
| Detector | PHOTON III MMPAD Hybrid Photon Counting Detector |
| Source Options | Microfocus Rotating Anode (Cu/Mo), Liquid Metal Jet (Ga/In), Dual-Target Auto-Switching |
| Software | APEX3 / PROTEUM3 |
| Compliance | ISO 17025-ready, GLP/GMP-supportive data audit trails, FDA 21 CFR Part 11 compliant modules available |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 VENTURE |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Power | 200 W (0.0002 MW) |
| Detector | PHOTON III MMPAD Hybrid Photon-Counting Detector |
| X-ray Source Options | microfocus sealed-tube (Incoatec IμS 3.0), liquid-metal-jet (MetalJet), dual-target auto-switching |
| Software | APEX4 (successor to APEX3/PROTEUM3) |
| Compliance | Fully compatible with CIF deposition standards, supports IUCr-compliant data reduction and structure refinement workflows |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ELIO |
| Application | Portable/Field-Deployable |
| Element Range | Na–U |
| Detection Range | ppm to wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Detector | Large-Area Silicon Drift Detector (SDD) with CUBE Technology |
| Excitation Source | 50 kV Microfocus X-ray Tube |
| Spot Size | 1 mm (laser-guided) |
| Weight (Measurement Head) | 2.1 kg |
| Compliance | CE, RoHS, IEC 61000-6-3 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | M4 TORNADO |
| Form Factor | Benchtop/Floor-Standing |
| Application Sector | Geology & Mining |
| Elemental Range | Na–U |
| Detection Range | ppm to wt% |
| Energy Resolution | ≤130 eV at Mn Kα |
| Excitation | Dual X-ray Tube (Cr & Rh) + 6-Position Filter Wheel |
| Detector | Silicon Drift Detector (XFlash®) |
| Spatial Resolution | <25 µm (spot size) |
| Sample Chamber | Vacuum-Compatible, Motorized XYZ Stage with Zoom Camera Navigation |
| Quantification | Standardless Bulk & Multilayer Analysis |
| Compliance | CE, RoHS, ISO/IEC 17025-ready workflow support |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | M4 TORNADO PLUS |
| Configuration | Benchtop |
| Element Range | C–U (Z = 6–92) |
| Energy Resolution | <140 eV |
| Detector | Dual Large-Area Silicon Drift Detectors (SDD) with Light-Element Windows |
| X-ray Source | Rh-target Microfocus Tube |
| Aperture Management System (AMS) | Integrated |
| Sample Compatibility | Flat & Topographically Irregular Surfaces |
| Compliance | ASTM E1598, ISO 22073, IEC 62471 (LED/X-ray Safety), GLP/GMP-Ready Data Audit Trail |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | M6 JETSTREAM |
| Configuration | Benchtop/Floor-Standing |
| Application Type | General Purpose |
| Elemental Range | Na–U |
| Quantification Range | ppm to wt% |
| Energy Resolution | <140 eV |
| Detector | XFlash® Silicon Drift Detector (SDD) |
| Sample Orientation | Horizontal & Vertical |
| Spot Size Adjustment | 5-step variable microfocus |
| Safety | Integrated X-ray interlock & ultrasonic collision avoidance |
| Portability | Modular design—disassembles into four transportable components |
| Compliance | Designed per IEC 61000-6-3, IEC 61000-6-4, and EN 62471 for radiation safety and EMC |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | S1 TITAN |
| Application | Handheld / Portable |
| Industry Type | General Purpose |
| Elemental Range | Mg–U |
| Quantification Range | ppm to % |
| Energy Resolution | 145 eV |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S2 PICOFOX |
| Detector | 4th-generation XFlash® silicon drift detector (SDD) with Peltier cooling |
| Energy resolution | 160 eV at Mn Kα (100 kcps) |
| Elemental range | Al (13) to U (92) |
| Sample volume | 1–50 µL (liquid/suspension), ≤10 µg (powder) |
| Automation options | 1-position or 25-position autosampler |
| Compliance | Fully compliant with ISO 8258 (control charts), ISO/IEC 17025 (testing laboratories), and supports GLP/GMP data integrity requirements per FDA 21 CFR Part 11 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Configuration | Benchtop/ Floor-standing |
| Model | S2 POLAR |
| Compliance | ASTM D7220, ASTM D4294, ASTM D6481, ASTM D7751, ASTM D8252, ISO 13032, ISO 20847, ISO 8754, IP 336, IP 496, IP 532, JIS K2541-4 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Configuration | Benchtop/Polarized EDXRF |
| Element Range | Na (11) to Am (95), optional C (6) to Am (95) |
| Concentration Range | ppm to 100% |
| Energy Resolution | <135 eV (Mn Kα) |
| Repeatability | <0.1% RSD |
| Detector | HighSense™ Ultra-Low-Noise Silicon Drift Detector (SDD) |
| Compliance | ASTM D6481, ASTM D7751, ASTM D7220, ISO 13032, ASTM D4294, ISO 20847, ISO 8754, IP 336/496/532, JIS K2541-4, GB/T 11140 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S2 PUMA Series 2 |
| Configuration Options | Benchtop / Floor-standing |
| Elemental Range | C (Z=6) to Am (Z=95) |
| X-ray Tube Power | 50 W |
| Detector | HighSense™ Silicon Drift Detector (SDD) |
| Sample Chamber Dimensions | 450 × 420 × 100 mm |
| Autochanger Capacity | Up to 20 positions (XY Autochanger) or 12–18 samples (Carousel) |
| Mapping Resolution | Down to 1 mm |
| Spot Size | 1–34 mm (with collimator masks) |
| Software | SPECTRA.ELEMENTS with SMART.QUANT FP |
| Compliance | Designed for GLP/GMP environments |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S2 PUMA Series II |
| Element Range | Na (11) to Am (95) [C (6) to Am (95)] |
| Detection Range | ppm to 100% |
| Energy Resolution | <135 eV |
| Repeatability | <0.1% RSD |
| Detector | HighSense™ Silicon Drift Detector (SDD) |
| Configuration Options | Manual Single-Position, XY Autochanger, Carousel Autosampler |
| Sample Chamber Dimensions | 450 × 420 × 100 mm |
| X-ray Tube | 50 W Rh anode |
| Filter Changer | 10-position automatic |
| Software Suite | SPECTRA.ELEMENTS with Smart-Quant FP, Geo-Quant, Cement-Quant, and regulatory-compliant modules |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S4 TSTAR |
| Technique | Total Reflection X-Ray Fluorescence (TXRF) |
| Detection Limit | Sub-ppb for liquid, solid, and thin-film samples |
| Sample Forms | Liquids, suspensions, dried residues, wafers, microscope slides, quartz carriers, membranes, filters, and nanoparticle layers |
| Compliance Context | Supports ISO 17025-compliant workflows |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S6 JAGUAR |
| Instrument Type | Benchtop |
| Instrument Kind | Scanning |
| X-ray Tube Power | 400 W |
| Analyzable Elements | F to Am (Fluorine to Americium) |
| Detector | High-sensitivity solid-state detector (HighSense XE™) |
| Optical Configuration | Compact WDXRF optical path with up to 4 collimators, up to 4 analyzing crystals, and dual high-sensitivity detectors |
| Software Platform | SPECTRA.ELEMENTS with SMART-QUANT WD fundamental parameters quantification |
| Automation Interface | AXSCOM-compatible |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S8 LION |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 3–4 kW |
| Analyzable Elements | C (6) to U (92) |
| Instrument Configuration | Simultaneous Multi-channel |
| Compliance | DIN EN ISO 9001:2008, CE, TÜV/PTB certified, radiation dose < 1 µSv/h (H*) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S8 TIGER |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 1–4.2 kW |
| Elemental Range | Be (4) to Am (95) |
| Instrument Configuration | Scanning-type WDXRF |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S8 TIGER (3rd Generation) |
| Instrument Type | Floor-standing WDXRF Spectrometer |
| X-ray Tube Power | 3 kW / 4 kW |
| Analyzable Elements | Be to Am |
| Configuration | Simultaneous/Sequential Multi-channel |
| Detector System | HighSense™ XE + SensorBoost™ Signal Processing |
| Operating Voltage Range | 20–60 kV |
| Sample Capacity | 84-position EasyLoad™ Autoloader with AI Vision |
| Vacuum System | Dual-chamber sealed vacuum with high-transmission beryllium window |
| Crystal Options | 8-position analyzing crystal changer |
| Collimator Options | 4-position collimator changer |
| Filter Options | 10-position filter changer |
| Aperture Mask Options | 5-position mask changer |
| Detectors | Flow-proportional counter & scintillation counter |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | TRACER 5 |
| Application | Handheld / Portable |
| Industry Use | General-Purpose |
| Elemental Range | F to U |
| Quantification Range | ppm to wt% |
| Energy Resolution | 145 eV |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | Powder X-ray Diffractometer |
| Model | JV QC3 |
| Application Focus | Compound Semiconductor Epitaxial Layer & Substrate QC |
| Automation Level | Fully Automated Wafer Handling (Optional Robotic Arm) |
| Sample Capacity | Up to 4 × 100 mm wafers per batch |
| Compliance | Designed for ISO/IEC 17025-aligned semiconductor manufacturing environments |
| Software Platform | Bruker JV-RADS (Bede RADS) with automated peak fitting, strain/relaxation quantification, and multi-layer compositional analysis |
| X-ray Source Protection | XRG Protect™ tube longevity technology |
| Power Mode | Eco-standby with reduced idle power consumption |
| Brand | GKINST |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic |
| Model | D-POWER |
| Price Range | USD 42,000 – 210,000 |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| Power Rating | 3 kW |
| Angular Accuracy | 0.0001° |
| Brand | GKINST |
|---|---|
| Model | DAC-HTP700 |
| Origin | Anhui, China |
| Press Type | BX90 (optional) |
| Press Material | Inconel 718 superalloy |
| Temperature Range | RT to 700 °C |
| Temperature Control Accuracy | ±1 °C |
| DAC Components | Tungsten Carbide gasket, Type-Ia diamond anvils |
| Temperature Regulation | PID dynamic feedback control |
| Thermocouple | K-type |
| Vacuum Chamber Leak Rate | <1×10⁻⁸ Pa·L/s |
| Brand | DECTRIS |
|---|---|
| Origin | Switzerland |
| Model | EIGER2 R |
| Detector Module Count | 1 / 2 / 4 |
| Active Area (W×H) | 77.2×38.6 mm² / 77.1×79.7 mm² / 155.1×162.2 mm² |
| Pixel Size | 75×75 µm² |
| Point Spread Function | 1 pixel |
| Energy Thresholds | 2 |
| Threshold Range | 3.5–30 keV |
| Maximum Count Rate | 6.9×10⁸ cps/mm² |
| Counter Depth | 2×16 bit per threshold |
| Frame Rate | 50 / 100 / 20 Hz |
| Readout Mode | Simultaneous read/write, zero dead time |
| Image Bit Depth | 32 bit |
| Vacuum Compatibility | Optional |
| Cooling | Air / Water / Water |
| Dimensions (W×H×D) | 100×140×93 mm³ / 114×133×240 mm³ / 235×235×372 mm³ |
| Weight | 1.8 / 4.7 / 15 kg |
| Brand | Dexela |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | CMOS X-ray Camera |
| Pricing | Upon Request |
| Effective Area | 114.9 × 64.6 mm |
| Resolution | 1536 × 864 pixels |
| Pixel Size | 74.8 µm (1×1), 149.6 µm (2×2), 299.2 µm (4×4) |
| Frame Rate | Up to 65 fps at full resolution (Camera Link) |
| MTF @ 6 lp/mm | >20% (with 150 µm high-resolution CsI scintillator, no binning) |
| DQE | ~0.7 at 0.5 lp/mm (28 kV, W/Al filtration) |
| Binning Modes | 1×1, 1×2, 2×2, 1×4, 2×4, 4×4 |
| Dynamic Range | 6400:1 (low-noise mode), 2400:1 (high-dynamic-range mode) |
| ADC Resolution | 14-bit |
| Interface | Camera Link or Gigabit Ethernet |
| Max. X-ray Energy | Standard ≤220 kV |
| Scintillator Options | Gd₂O₂S (Gadox) or columnar CsI, thickness customizable per application |
| Dimensions | 241 × 150 × 42 mm |
| Weight | 1.9 kg |
| Brand | Dongxi Analysis |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | XD-8010 |
| Form Factor | Benchtop/Floor-standing |
| Industry Application | Geological & Mineralogical Analysis |
| Elemental Range | S (Z=16) to U (Z=92) |
| Quantification Range | ppm to wt% |
| Filter Options | 15-position automatic filter wheel |
| Beam Diameter | 1–7 mm adjustable |
| Sample Chamber | Large-volume, non-destructive chamber |
| Software | Integrated EDXRF workstation with real-time video imaging, report customization (PDF/Excel), spectral comparison, and GLP-compliant data archiving |
| Brand | GKInst |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | Custom-Engineered DAC Dynamic Actuation System |
| Pricing | Available Upon Technical Inquiry |
| Brand | GKInst |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | Custom-Engineered System |
| Pricing | Available Upon Request |
| Brand | GKINST |
|---|---|
| Model | EC120 |
| Temperature Range | –50 °C to +120 °C |
| Max. Heating/Cooling Rate | 30 °C/min |
| Temp. Stability | < 0.05 °C |
| Temp. Resolution | 0.01 °C |
| Sensor | PT100 Platinum Resistance Thermometer |
| Control Algorithm | PID Dynamic Regulation |
| Compatibility | Liquid-phase electrochemical cells (e.g., coin-cell, pouch-cell, fuel cell configurations) |
| Compliance | Designed for integration with X-ray diffractometers (XRD), synchrotron beamlines, and in situ/operando electrochemical characterization platforms |
| Brand | GKInst |
|---|---|
| Origin | Anhui, China |
| Model | EC150 |
| Temperature Range | −50 °C to +150 °C |
| Max. Heating/Cooling Rate | 30 °C/min |
| Temp. Stability | < 0.05 °C |
| Temp. Resolution | 0.01 °C |
| Sensor | PT100 Platinum Resistance Thermometer |
| Control Algorithm | PID Dynamic Regulation |
| Compliance | Designed for ASTM D3418, ISO 11357, and IEC 62660-2 thermal cycling protocols in electrochemical cell characterization |
| Origin | Switzerland |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MED-1 |
| Price | €200,000 |
| Brand | ESI |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | EDX9000B PLUS |
| Configuration | Benchtop/Floor-standing |
| Industry-Specific Application | Non-Ferrous Metals |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability (RSD) | ≤0.05% |
| Detector | Peltier-Cooled Fast Silicon Drift Detector (FSDD) |