X-Ray Instruments
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| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | STRESS-X |
| Compliance | ASTM E915, EN 15305 |
| Motion System | 6-axis robotic arm |
| Deployment Options | Benchtop shielded enclosure or mobile four-wheel alloy cart |
| Measurement Principle | Sin²ψ X-ray diffraction (XRD) |
| Application Scope | Non-destructive residual stress mapping on metallic components |
| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | TX 2000 |
| Configuration | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Elemental Range | Na (11) to Pu (94) |
| Quantification Range | 10 pg – 100% |
| Energy Resolution | 124 eV (at Mn Kα) |
| Repeatability | 0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Excitation Source | Switchable Mo/W anode X-ray tube |
| Angular Control | High-precision optical encoder stepper motor |
| Brand | GKINST |
|---|---|
| Origin | Anhui, China |
| Model | VGHS200 |
| Maximum Temperature | 200 °C |
| Minimum Temperature | Room Temperature (RT) |
| Max. Heating Rate | 30 °C/min |
| Temperature Stability | < 0.5 °C |
| Temperature Resolution | 0.1 °C |
| Temperature Sensor | PT100 Platinum Resistance Thermometer |
| Temperature Control | PID Dynamic Regulation |
| Application Domain | In-situ XRD for Materials Science, Semiconductor Characterization, Battery Research, Pharmaceutical Solid-State Analysis, and Mineralogical Studies |
| Brand | Haoyuan |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | DX-2700BH |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| X-ray Generator Power | 3 kW |
| Angular Accuracy | ±0.0001° |
| Resolution (FWHM) | SiO₂ ≤ 60% |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | MESA-50 |
| Detector Type | Silicon Drift Detector (SDD) |
| Excitation Source | Micro-focus X-ray Tube |
| Analytical Spot Sizes | 0.1 mm, 0.3 mm, and 1.2 mm |
| Minimum Detection Limit (MDL) | ≤2 ppm for Pb, Cd, Hg, Cr, Br |
| Measurement Time | Typically 60–300 s per point |
| Sample Viewing | Integrated High-Resolution CCD Camera with 30× Optical Zoom |
| Operating Environment | Ambient air (no vacuum or helium required) |
| Software Interface | Multilingual (English/Chinese), Excel-compatible data export |
| Compliance Support | RoHS Directive 2011/65/EU, WEEE Directive 2012/19/EU, ELV Directive 2000/53/EC, China RoHS II (SJ/T 11364-2014), JEITA EG0201, ASTM F2617-23 |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | MESA-50 |
| Configuration | Benchtop/Free-standing |
| Industry Application | Electronics Manufacturing & Compliance Testing |
| Elemental Range | Al (Z=13) to U (Z=92) |
| Quantitative Detection Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Relative Standard Deviation (RSD) | ≤0.05% for repeated measurements under standardized conditions |
| Detector | Silicon Drift Detector (SDD) |
| Signal Processing | HORIBA Digital Pulse Processor (DPP) |
| Collimator Options | Three fixed apertures (Ø0.1 mm, Ø0.3 mm, Ø1.0 mm) |
| Dimensions | 225 × 210 × 40 mm (L×W×H) |
| Weight | 12 kg |
| Battery Life | Up to 6 hours continuous operation (integrated rechargeable Li-ion) |
| Vacuum/Atmosphere | Ambient air analysis (no vacuum pump or cryogenic cooling required) |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | MESA-7220V2 |
| Configuration | Benchtop / Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application-Specific Design | Petroleum & Lubricant Compliance Testing |
| Elemental Range | S, Cl |
| Quantification Range | S: 0.7 ppm – 10.0 wt% |
| Cl | 0.6 ppm – 10.0 wt% |
| Mn-Kα Energy Resolution | ≤175 eV |
| Detector | Silicon Drift Detector (SDD) |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XGT-1700 |
| Price Range | USD 42,000–70,000 |
| Instrument Type | Scanning |
| X-ray Tube Power | Not Applicable (Rh anode, max 50 kV / 1 mA) |
| Elemental Range | Na to U |
| Detection Limits | Cd ≤ 2 ppm, Pb ≤ 5 ppm, Cl ≤ 50 ppm |
| Sample Chamber Max Size | 460 × 360 × 150 mm |
| X-ray Beam Diameters | Φ1.2 mm and Φ3.0 mm (motorized switching) |
| Detector | High-Purity Silicon XEROPHY Detector |
| Liquid Nitrogen Capacity | 3 L |
| LN₂ Consumption | <1 L/day (only during operation) |
| Optical Magnification | 50× (coaxial with X-ray beam) |
| Software | Automated qualitative/quantitative analysis (fundamental parameters method, calibration curve method, single-point correction) |
| PC Requirements | Pentium IV ≥1.8 GHz, ≥1 GB RAM, ≥120 GB HDD, Windows XP, 17″ monitor, color inkjet printer |
| Ambient Temp | 10–35 °C (optimal), 5–40 °C (operational) |
| Humidity | ≤80% RH at 5–31 °C |
| Power Supply | AC 100/120/220/240 V ±10%, 50/60 Hz |
| Power Consumption | ≤1.3 kVA (system-wide) |
| Weight | ~265 kg (analysis unit only) |
| Dimensions | Analyzer Unit: 610(W) × 750(D) × 500(H) mm |
| Signal Processing Unit | 220(W) × 500(D) × 480(H) mm |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-5200WR |
| Sample Environment | Air (Atmospheric) |
| Elemental Range | Na to U |
| Quantification Range | 1 ppm – 99.99% |
| Operating Conditions | 50 kV / 1 mA |
| Repeatability | ±0.1% RSD |
| Spot Size | Standard 400 µm, Optional 10 µm |
| Detector | Silicon Drift Detector (SDD), LN2-free |
| Geometry | Coaxial Optical Microscope Integration |
| Analysis Mode | Non-destructive, No Vacuum Required, No Sample Preparation |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-7000V |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Source | Rh anode, 50 kV / 1 mA |
| Spatial Resolution | Down to 10 µm |
| Measurement Range | Na (11) to U (92) |
| Vacuum Modes | Full vacuum & local vacuum (switchable in <5 s) |
| Optical Imaging | Co-axial CCD with macro/micro view |
| Sample Chamber | 300 mm × 300 mm × 80 mm (full vacuum), XY stage: 100 mm × 100 mm |
| Software | SmartMap™ for hyperspectral mapping, INCA™ pulse processor, GLP-compliant data handling |
| Quantification Methods | Fundamental Parameters (FP), single-standard FP, calibration curve, multilayer thin-film analysis (nm–µm scale) |
| Elemental Mapping | Pixel-resolved full-spectrum acquisition, offline reprocessing, RGB overlay, line scan, ROI masking |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-7200WR |
| Detection Principle | Energy Dispersive X-Ray Fluorescence (ED-XRF) |
| Spot Size Range | 10 µm to 1.2 mm |
| Detector Type | Silicon Drift Detector (SDD), Liquid-Nitrogen-Free |
| Maximum Scan Area | 10 cm × 10 cm |
| Optical-Element Image Co-Registration | Yes |
| Elemental Mapping Resolution | ≤10 µm |
| Compliance | ASTM E1621, ISO 8256, IEC 62321-5 (RoHS), USP <232>/<233>, GLP/GMP-ready data audit trail |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | XGT-9000 |
| Excitation Mode | Single-Wavelength Excitation |
| X-ray Tube Power | 50 W |
| Voltage Range | Up to 50 kV |
| Current Range | Up to 1000 µA |
| Elemental Coverage | Na (11) to U (92) |
| Minimum Spot Size | ≥10 µm |
| Optional Capillary Probes | 15 µm and 100 µm |
| Detector Configuration | Dual-mode — Energy-Dispersive XRF + Transmission X-ray Imaging |
| Sample Chamber Flexibility | Up to 4 configurable measurement atmospheres (air, He, vacuum, N₂) |
| Software Platform | HORIBA X-RAY LAB |
| Brand | HP Spectroscopy |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | hiXAS |
| X-ray Energy Range | 5–12 keV |
| Minimum Detectable Element Concentration | Low to several wt% |
| XAFS Acquisition Time | 3–8 min (depending on sample concentration and normalization requirements) |
| Spectral Resolution (E/ΔE) | Constant 4000 across full energy range |
| Detector | Photon-counting pixelated X-ray detector |
| Monochromator | HAPG-based von Hamos geometry spectrometer |
| Footprint | 2.0 m × 1.0 m |
| Sample Handling | Motorized sample wheel with multi-position mounting |
| Brand | I-CHEQ |
|---|---|
| Origin | USA |
| Model | F2-9000 |
| Application | Handheld/Field-Portable |
| Element Range | Mg–Pu |
| Detection Range | 1 ppm – 99.99% |
| Energy Resolution | 120–140 eV |
| Repeatability | 0.1% |
| Detector | High-Resolution Silicon Drift Detector (SDD) |
| Excitation Source | Variable-Voltage (up to 50 kV) Microfocus X-ray Tube with Selectable Anode Materials (Au, Ag, W, Ta, Pd) |
| Cooling | Peltier Semiconductor |
| Operating System | Windows CE |
| Display | Industrial-Grade TFT Color Touchscreen |
| Dimensions (L×W×H) | 233 × 84 × 261 mm |
| Weight (with battery) | 1.46 kg |
| Compliance | Meets IEC 61000-6-3 (EMC), IEC 61000-6-2, ANSI N43.3, and FDA 21 CFR Part 1020.40 for X-ray safety |
| Brand | Innov-X |
|---|---|
| Origin | USA |
| Model | DELTA Series |
| Portability | Handheld |
| Elemental Range | Mg to U |
| Detection Limit | 1 ppm |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <165 eV |
| Repeatability | ≥95% |
| Excitation Source | Micro-focus X-ray Tube (10–40 kV) |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Weight | <1.5 kg |
| Operating System | Microsoft Windows Embedded CE |
| Battery Life | >4 hours continuous operation |
| Hot-Swap Battery Support | Yes |
| Display | 32-bit color touchscreen |
| Sample Targeting | Integrated camera + collimated beam optics |
| Trigger Options | Mechanical trigger, Deadman safety trigger, or external PC control |
| Brand | Innov-X |
|---|---|
| Origin | USA |
| Model | XDD-5000 Series |
| Elemental Range | Mg to U |
| Detection Limit | 1 ppm – 99.99% |
| Energy Resolution | <165 eV |
| Repeatability | 95% |
| Weight | <12 kg |
| Excitation Source | 10 W Microfocus X-ray Tube |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Operating System | Windows XP |
| Configuration | Benchtop or Floor-Standing |
| Distribution Type | Imported Instrument via Authorized Distributor |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSX-1000S |
| Elemental Analysis Range | Mg–U (Na–U optional) |
| Quantitative Range | 0.1–99.9 wt% |
| Energy Resolution | <170 eV at Mn Kα |
| Repeatability | ±0.1% RSD |
| X-ray Tube | 5–50 kV, 1 mA, Rh anode |
| Filter Options | Standard — OPEN, ND, Cr, Pb, Cd |
| Detector | Silicon Drift Detector (SDD) |
| Sample Chamber | Ø300 mm × 80 mm H |
| Atmosphere Mode | Air (standard) |
| Imaging System | Integrated color camera |
| Software Suite | Qualitative & Quantitative Analysis, RoHS Compliance Module (Cd, Pb, Hg, Br, Cr), Quick-Analysis Mode, Report Generator, Daily Verification Tool |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JXA-8230 |
| Accelerating Voltage | 0.2–30 kV (0.1 kV step) |
| Beam Current Range | 1×10⁻¹² – 1×10⁻⁵ A |
| Beam Current Stability | ±5% / h, ±0.3% / 12 h |
| Secondary Electron Resolution | 6 nm (W filament, WD = 11 mm, 30 kV) |
| Magnification | ×40 – ×300,000 |
| Max. Sample Size | 100 mm × 100 mm × 50 mm (H) |
| WDS Elemental Range | Be*¹–U (Be requires optional crystal) |
| EDS Elemental Range | B–U |
| WDS Wavelength Range | 0.087–9.3 nm |
| EDS Energy Range | 0–20 keV |
| WDS Spectrometers | 1–5 channels (configurable) |
| EDS Detector | 1 SDD (optional fanless digital pulse processor) |
| Display | Dual LCDs (1280×1024), dedicated for EPMA analysis and SEM/EDS operation |
| Brand | Ju Chuang Environmental |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | JC-350X |
| Form Factor | Benchtop/Floor-Standing |
| Instrument Type | Conventional EDXRF |
| Application Scope | General-Purpose |
| Detection Range | 0.07 ppm – 99.9% |
| Energy Resolution | 125 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements, 100 s counting) |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Measurement Range | 1–45 keV |
| High Voltage | 5–50 kV |
| Tube Current | 5–1000 µA |
| Vacuum Level | ≤10⁻² Pa within 10 s (operational range: 10⁻¹–10⁻⁵ Pa) |
| Sample Imaging | 5 MP CCD camera with real-time positioning |
| Power Consumption | 50 W (main unit), 550 W (vacuum pump) |
| Dimensions | 720 × 440 × 435 mm (W×D×H) |
| Weight | 65 kg |
| Brand | JWGB |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Benchtop |
| X-ray Source | Sealed Mo-target Tube |
| Maximum Power | 1600 W |
| Angular Accuracy | ±0.01° |
| Angular Resolution | 0.1° |
| Goniometer Geometry | Vertical θ–2θ |
| Goniometer Radius | 144 mm |
| Angular Range | 0°–150° |
| Detector | Photon-counting 2D Array Detector |
| Sample Stage | Temperature-Controlled Pouch-Cell Holder (−30 °C to 300 °C) |
| Dimensions | 900 mm × 680 mm × 550 mm |
| Weight | 100 kg |
| Brand | Malvern PANalytical |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Aeris Cement Edition |
| Pricing | Upon Request |
| Brand | GKInst |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | MiniSAXS |
| Price Range | USD 140,000 – 280,000 |
| Instrument Type | Small-Angle X-ray Scattering (SAXS) System |
| Measurement Range | 1 nm – 100 nm |
| Available Anode Materials | Cu, Mo, Ag |
| Collimation | Pinhole-based collimation system |
| Filtration | Integrated beam filtration unit |
| Sample Stage | Motorized 3-axis stage with 16-position powder holder and 16-position solid-sample holder |
| Detector | Two-dimensional silicon pixel array single-photon counting detector |
| Pixel Size | 75 µm × 75 µm |
| Readout Mode | Continuous, zero dead time, no readout noise or dark current |
| Dynamic Range | 32-bit |
| Sample-to-Detector Distance (SD) | 40 mm – 350 mm |
| Scattering Vector (q) Range | 0.063 nm⁻¹ – 6.3 nm⁻¹ |
| Dimensions (W×D×H) | 840 mm × 750 mm × 700 mm |
| Power Supply | AC 220 V, 50 Hz (single-phase) |
| Supported Techniques | SAXS, WAXS, GIWAXS, GISAXS |
| Brand | Moxtek |
|---|---|
| Origin | USA |
| Model | Monoblock |
| Tube Type | Metal-Ceramic |
| Target Materials | Ag, W, Pd, Rh |
| Operating Voltage Range | 10–50 kV |
| Current Range | 0–0.2 mA |
| Max Output Power | 10 W |
| Focal Spot Size | 400 µm |
| Stability | < 1.0% RSD |
| Beryllium Window Thickness | 0.25 mm |
| Max Input Power | 20 W |
| Operating Temperature | −10 °C to +50 °C |
| Storage Temperature | −40 °C to +60 °C |
| Weight | 500 g |
| Compliance | RoHS, CE (per IEC 61010-1), FDA 21 CFR Part 1020.40 (X-ray equipment) |
| Brand | Moxtek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TUB00046 |
| Voltage Range | ±4–40 kV |
| Current Range | 0–100 µA |
| Max Power Output | 4 W |
| Anode Target Options | Tungsten (W), Rhodium (Rh), Copper (Cu) |
| Focal Spot Size | 300 µm |
| HV Cable Length Options | 1–11.5 inches |
| Warranty | 12 months |
| Brand | Moxtek |
|---|---|
| Origin | USA |
| Model | XPIN-BT |
| Active Area | 6 mm² or 13 mm² |
| Silicon Thickness | 625 µm |
| Beryllium Window Thickness | 8 µm or 25 µm |
| Collimator Materials | Tungsten / Cobalt / Titanium / Aluminum |
| Energy Resolution (FWHM) | < 170 eV (6 mm²), < 230 eV (13 mm²) |
| Peak-to-Background Ratio | 3600:1 @ 1 keV (6 mm², typical), 3000:1 @ 1 keV (13 mm², typical) |
| Brand | National Innovation Scientific Instruments |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (PRC) |
| Model | SuperXAFS M9000 |
| Price Range | USD 560,000 – 1,400,000 |
| Energy Range | 4.5–20 keV (upgradable to 25 keV) |
| Photon Flux at Sample | ≥4×10⁶ photons/s @ 7–9 keV |
| Energy Resolution | 0.5–1.5 eV @ 7–9 keV |
| Energy Reproducibility | ≤30 meV over 24 h |
| Minimum Energy Step Size | 0.1 eV |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic Laboratory X-ray Spectrometer |
| Model | NatureXAS 1500 |
| Pricing | Upon Request |
| Brand | NCS |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Floor-standing |
| Instrument Category | Scanning-type |
| X-ray Tube Power | 4 kW |
| Analyzable Elements | B to U |
| Beryllium Window Thickness | 75 μm (optional ≤75 μm variants) |
| Goniometer Angular Reproducibility | θ–2θ independent drive |
| Scan Ranges | SC (1–118°), PC (10–148°) |
| Step Angles | 0.001°, 0.002°, 0.005°, 0.01°, 0.02°, 0.05°, 0.1° |
| Brand | NCS |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Type | Domestic |
| Model | PORT-X710 Handheld ED-XRF Spectrometer |
| Application | Field-Portable |
| Instrument Class | General-Purpose |
| Industry-Specific Use | Multi-Material Alloy Analysis |
| X-ray Tube | 5 W / 50 kV / 200 µA max |
| Target Material | Rhodium (Rh) |
| Detector | Si-Pin |
| Energy Resolution | ≤185 eV |
| Operating Temperature | –10 °C to 50 °C |
| Dimensions | 240 mm (L) × 110 mm (W) × 240 mm (H) |
| Weight | 1.6 kg |
| Quantitative Method | Fundamental Parameters (FP) |
| Elemental Range | Ti to U |
| Battery | Dual Li-ion, 7.4 V / 9600 mAh |
| Runtime | ≥10 h (typical) |
| Processor | Qualcomm Snapdragon™ octa-core, 2.0 GHz, 14 nm FinFET, 1 MB L2 cache |
| OS | Android 7.1 |
| Display | 5.5-inch Full HD (1080p) capacitive touchscreen |
| Connectivity | Wi-Fi 802.11 a/b/g/n/ac, Bluetooth 4.2/LE |
| Radiation Safety | Integrated shutter, sample proximity sensor, password-protected startup, certified radiation shielding per CNAS and GBZ 188–2014 |
| Sample Compatibility | Solid metal alloys (e.g., stainless steels, low-alloy steels, Cu-based, Ni-based, Ti alloys), scrap fragments, billets, pipes, fasteners |
| Brand | NCS |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Type | Handheld/Portable |
| Model | PORT-X720 |
| X-ray Tube | 5 W, 50 kV, 200 µA max |
| Anode Material | Rhodium (Rh) |
| Detector | Silicon Drift Detector (SDD) |
| Energy Resolution | ≤155 eV |
| Operating Temperature | −10 °C to 50 °C |
| Dimensions | 240 × 110 × 240 mm |
| Weight | 1.6 kg |
| Measurement Elements | Mg to U |
| Battery | Dual 7.4 V / 9600 mAh Li-ion |
| Runtime | ≥10 h |
| Processor | Qualcomm Snapdragon™ Octa-core (14 nm FinFET), 2.0 GHz, 1 MB L2 cache |
| OS | Android 7.1 |
| Display | 5.5-inch Full HD (1080p) touchscreen |
| Connectivity | Wi-Fi 802.11 a/b/g/n/ac, Bluetooth 4.2/LE, USB |
| Radiation Safety | Integrated shutter, sample proximity sensor, password-protected startup, regulatory compliance per CNAS and GBZ 188–2014 |
| Analysis Algorithm | Fundamental Parameters (FP) method with user-customizable method development capability |