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Xi’an Shenketai Instrumentation & Equipment Co., Ltd.

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BrandAnton Paar TriTec (formerly CSM Instruments, Switzerland)
OriginSwitzerland
ModelHIT 300
Instrument TypeNanoindentation and Scratch Tester
Thermal Drift≤0.0008 nm/s
Frame Stiffness10⁸ µN/µm
Positioning Accuracy<1 µm
RepeatabilityHigh
ComplianceASTM E2546, ISO 14577, ISO 20519, USP <1089>, GLP/GMP-ready data traceability
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BrandAnton Paar TriTec (formerly CSM Instruments, Switzerland)
OriginSwitzerland
ModelNST³
Instrument TypeNano Scratch Tester
Application ScopeThin film and coating adhesion, cohesion, scratch resistance, and mechanical integrity assessment for layers < 1 µm thick
Key Measurement CapabilitiesCritical load (Lc) determination, real-time scratch depth profiling, friction force mapping, elastic recovery quantification, and simultaneous panoramic imaging
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