X-Rite Ci62 Portable Spectrophotometer

Overview

The X-Rite Ci62 Portable Spectrophotometer is an industrial-grade, handheld integrating sphere spectrophotometer engineered for high-fidelity color measurement across challenging substrates—including metallic inks, laminated foils, embossed packaging, and textured or curved surfaces. Operating on the d/8° geometry with diffuse illumination, the Ci62 eliminates directional bias caused by surface gloss, texture, or orientation—enabling metrologically robust color data where conventional 0/45° instruments exhibit significant variability. Its 400–700 nm spectral range captures full visible reflectance with 10 nm nominal bandwidth, supporting CIE-compliant tristimulus calculation (CIE 1931 2° and CIE 1964 10° observer), multiple illuminants (D65, A, F2, etc.), and standard color difference metrics (ΔE*ab, ΔE00, ΔEcmc). Designed for production-floor deployment, the Ci62 delivers laboratory-grade repeatability (≤0.05 ΔE*ab) without requiring environmental stabilization or operator expertise beyond basic calibration protocol.

Key Features

• Integrating sphere optical design (d/8°, specular component included/excluded) ensures consistent measurement of glossy, pearlescent, and metallized materials
• Tungsten halogen light source provides stable spectral output across >1 million actuations; thermally regulated for minimal drift during extended operation
• Two aperture options (4 mm and 8 mm) support both spot verification and area-averaged readings—critical for heterogeneous prints and substrate variations
• High-resolution color TFT display with intuitive graphical interface and flip-capable head for ergonomic access to recessed or overhead surfaces
• Dedicated lock key prevents accidental parameter changes during QA/QC workflows, ensuring procedural integrity
• On-device storage for up to 4,000 spectral measurements with timestamp, operator ID, and instrument configuration metadata
• Integrated Bluetooth 4.2 (certified for CE, FCC, IC, SRRC, BIS, MIC, KN, NCC) enables wireless synchronization with NetProfiler and mobile quality apps

Sample Compatibility & Compliance

The Ci62 is validated for use with non-uniform, optically complex surfaces common in packaging, label printing, automotive trim, and consumer electronics—where BRDF effects dominate color appearance. It complies with ASTM E308-23 (computing tristimulus values from spectral data), ISO 13655:2017 (spectral measurement of printed materials), and ISO 27668-1:2012 (performance criteria for portable spectrophotometers). Its spectral data structure supports FDA 21 CFR Part 11-compliant audit trails when used with NetProfiler-enabled enterprise software. All firmware updates and calibration certificates are traceable to NIST-traceable standards via X-Rite’s certified service centers. The device meets IEC 61000-4-2 (ESD immunity) and IP54 ingress protection for dust and water resistance in manufacturing environments.

Software & Data Management

NetProfiler 3.0 serves as the central cloud-based validation and optimization platform for the Ci62. It enables remote instrument profiling, inter-device agreement monitoring, and automated recalibration scheduling—without requiring physical connection to a host PC. Each measurement generates a unique UUID containing instrument serial number, firmware version, aperture selection, geometry mode, and spectral raw data hash—ensuring full traceability per GLP/GMP requirements. Embedded spectral conversion algorithms ensure backward compatibility with legacy SP-series instruments and minimize inter-instrument variability (<0.15 ΔE*ab median across fleet). PantoneLIVE™ integration allows authenticated, real-time download of brand-specific spectral libraries directly to the device—eliminating manual reference updates and reducing cross-site color deviation risk.

Applications

• Color release verification of foil-laminated cartons and metallized labels in pharmaceutical and luxury packaging lines
• In-process monitoring of metallic ink consistency on flexible packaging gravure and flexo presses
• Supplier qualification audits for automotive interior trim components with multi-angle appearance effects
• Brand stewardship across global contract manufacturers using standardized spectral targets and tolerance sets
• Root-cause analysis of batch-to-batch hue shifts via spectral curve overlay and PCA-based outlier detection
• Integration into MES/SCADA systems via RESTful API for real-time SPC charting and automatic non-conformance flagging

FAQ

What distinguishes the Ci62 from 0/45° spectrophotometers like the eXact?
The Ci62 uses d/8° integrating sphere geometry to average reflectance over all angles, making it insensitive to surface texture and gloss—whereas 0/45° instruments measure only at fixed angles and yield inconsistent results on metallic or structured surfaces.
Is the Ci62 suitable for measuring transparent or translucent films?
No—the Ci62 is optimized for opaque and reflective substrates. For transmission or semi-transparent materials, X-Rite recommends the RM200QC or benchtop Ci7800 series.
How frequently must the Ci62 be calibrated?
Daily zero and white calibration is recommended before first use and after major ambient temperature shifts (>5°C); annual NIST-traceable certification is advised for regulated industries.
Can measurement data be exported in CSV or XML format?
Yes—via NetProfiler web portal or direct USB transfer, supporting ISO 12233-compliant spectral data export (.spc, .cie, .csv) with embedded metadata.
Does the Ci62 support UV fluorescence compensation?
No—UV excitation capability is exclusive to the Ci64 UV model. The Ci62 operates strictly within the 400–700 nm visible band.