Shimadzu EDX-GP Benchtop Energy Dispersive X-Ray Fluorescence Spectrometer (Refurbished)

Overview

The Shimadzu EDX-GP is a benchtop or floor-standing energy dispersive X-ray fluorescence (EDXRF) spectrometer engineered for non-destructive elemental analysis of solid, powder, and thin-film samples. Utilizing a high-stability X-ray tube and silicon drift detector (SDD), the system operates on the fundamental principle of X-ray fluorescence emission: incident X-rays eject inner-shell electrons from sample atoms; subsequent electron transitions generate characteristic secondary X-rays whose energies are uniquely tied to atomic number. This enables qualitative and quantitative determination of elements from aluminum (Z = 13) through uranium (Z = 92) without sample digestion or vacuum requirements. The EDX-GP is optimized for routine compositional verification in electronics manufacturing—such as plating thickness measurement, RoHS-compliant screening of restricted substances (Pb, Cd, Hg, Cr⁶⁺, Br), and alloy grade identification—where rapid turnaround, minimal operator training, and trace-level sensitivity (sub-100 ppm for many elements under optimized conditions) are critical.

Key Features

• Robust optical architecture featuring a Peltier-cooled silicon drift detector (SDD) for enhanced count-rate capability and improved peak resolution compared to Si-PIN detectors
• High-power microfocus X-ray tube (typically 50 kV / 1 mA) with selectable anode materials (e.g., Rh or Mo) to optimize excitation efficiency across light and heavy elements
• Motorized XYZ sample stage with programmable positioning for multi-point mapping and automated batch analysis
• Integrated helium purge or vacuum option for improved detection limits of light elements (Na–Cl) in air-sensitive applications
• Pre-calibrated factory-standard reference sets covering common electronic substrates (e.g., Cu, Sn, Ni, Pb, Ag, Au, Zn, Fe) and certified reference materials (CRMs) traceable to NIST standards
• Modular design supporting post-purchase upgrades including advanced spectral deconvolution algorithms and expanded library-based identification modules

Sample Compatibility & Compliance

The EDX-GP accommodates samples up to 100 mm × 100 mm × 50 mm (W × L × H) with optional custom holders for irregular geometries. It supports flat solids (PCBs, solder joints, connectors), pressed pellets, loose powders in sample cups, and coated films on conductive substrates. All measurements comply with ASTM E1621–23 (Standard Guide for XRF Analysis of Environmental Samples) and ISO 22084–1:2022 (XRF — Part 1: General requirements for qualitative and quantitative analysis). For regulated environments, the instrument’s firmware supports audit trail logging, user access control levels, and electronic signature functionality aligned with FDA 21 CFR Part 11 and GLP/GMP documentation requirements when paired with validated software configurations.

Software & Data Management

Controlled via Shimadzu’s proprietary EDX Navigator software, the system provides intuitive workflow-driven operation—from method setup and calibration to real-time spectrum acquisition and reporting. Quantitative analysis employs fundamental parameter (FP) and empirical calibration models with matrix correction capabilities. Data export is supported in CSV, PDF, and XML formats compliant with LIMS integration protocols. Raw spectra and processed results are stored with embedded metadata (operator ID, timestamp, instrument serial, calibration version), ensuring full traceability. Optional add-ons include spectral library search (for unknown phase identification), statistical process control (SPC) charting, and remote monitoring via secure HTTPS interface.

Applications

• RoHS and WEEE compliance screening of printed circuit boards, cables, and plastic housings
• Quantitative analysis of solder composition (Sn/Pb/Bi/Ag/Cu ratios) and electroplated layer thickness (Ni, Au, Pd) using FP-based thin-film algorithms
• Contamination assessment on semiconductor wafers and lead frames (e.g., Na, K, Ca, Cl residues)
• Quality assurance of metal alloys used in connectors and heat sinks (e.g., brass, stainless steel, aluminum grades)
• Failure analysis support through comparative elemental profiling of defective vs. functional components
• Raw material verification in contract manufacturing and supplier qualification programs

FAQ

Is this unit fully refurbished and tested prior to shipment?
Yes. Each EDX-GP undergoes comprehensive functional validation at Shimadzu’s authorized refurbishment center in Japan, including detector resolution verification (Mn Kα FWHM ≤ 135 eV), tube stability testing (>24 h continuous operation), and spectral calibration against certified CRMs.
Does the system include original Shimadzu software licenses?
Yes. The instrument ships with a perpetual, transferable license for EDX Navigator v3.x or later, including all core quantification modules and standard reference libraries.
What maintenance support is available after purchase?
We provide a 12-month limited hardware warranty and optional annual service contracts covering preventive maintenance, detector re-calibration, and remote diagnostics by Shimadzu-certified engineers.
Can the EDX-GP be integrated into an existing laboratory network?
Yes. The system supports standard Ethernet connectivity, DHCP/IP configuration, and OPC UA-compatible data exchange for seamless integration with enterprise LIMS or MES platforms.
Are consumables such as X-ray tubes or detectors covered under warranty?
X-ray tubes are warranted for 12 months or 2,000 operating hours (whichever occurs first); SDD detectors carry a 24-month warranty against manufacturing defects under normal use conditions.