SU1024-LDM InGaAs Short-Wave Infrared Line-Scan Camera for High-Speed OCT and Machine Vision

Overview

The SU1024-LDM is a high-performance, compact 1024-pixel short-wave infrared (SWIR) line-scan camera engineered for demanding optical coherence tomography (OCT), semiconductor wafer inspection, and industrial machine vision applications. Built on Sensors Unlimited’s proprietary InGaAs focal plane array (FPA) technology, it operates across the 0.8–1.7 µm spectral range—enabling high-contrast imaging through silicon substrates and detection of molecular vibrational signatures in combustion and spectroscopic studies. Its core architecture leverages integrate-while-read (IWR) snapshot acquisition, delivering precise temporal synchronization essential for motion-compensated OCT scanning and continuous web-based inspection. The camera employs a 25 µm pixel pitch with selectable 25 µm or 50 µm aperture height, balancing spatial resolution against photon collection efficiency. With a maximum line rate of 45,956 lines per second (lps), it supports real-time, high-throughput imaging at sub-millisecond frame intervals—critical for inline quality control in IC fabrication, solar cell production, and food sorting systems.

Key Features

• 1024-pixel InGaAs linear sensor with 25 µm pitch and configurable 25 µm / 50 µm pixel height for optimized resolution or sensitivity
• SWIR spectral response from 0.8 µm to 1.7 µm—ideal for silicon-transmissive imaging and molecular absorption band detection
• Programmable line scan rates from 80 to 45,956 lps, enabling precise synchronization with translation stages or conveyor belts
• 14-bit digital output via Base Camera Link® interface, ensuring high-fidelity data transfer with low noise floor
• Dynamic range exceeding 4500:1 (typical), achieved through low-dark-current design and correlated double sampling (CDS)
• Quantum efficiency >70% across 1.0–1.6 µm, maximizing signal-to-noise ratio in low-light SWIR applications
• Compact, ruggedized housing with C-mount and F-mount adapter options for seamless integration into OEM optical assemblies and MV platforms

Sample Compatibility & Compliance

The SU1024-LDM is routinely deployed in GLP- and GMP-aligned environments where traceability and measurement integrity are required. While not a regulated medical device itself, its use in OCT system integration complies with foundational optical safety standards (IEC 60825-1) and supports adherence to FDA 21 CFR Part 11 when paired with validated software platforms featuring audit trails and electronic signatures. For semiconductor metrology, it meets the functional requirements of SEMI E10 (Specification for Definition and Measurement of Equipment Reliability, Maintainability, and Availability) in high-duty-cycle inspection workflows. Its spectral range aligns with ASTM E1932-20 (Standard Guide for Imaging in the SWIR Band) and ISO 15529:2017 (Imaging sensors—Characterization methods for infrared detectors).

Software & Data Management

The camera is fully compatible with industry-standard machine vision SDKs including National Instruments IMAQdx, Matrox Imaging Library (MIL), and Stemmer Imaging Common Vision Blox (CVB). It supports GenICam-compliant configuration via Camera Link serial communication, enabling remote parameter adjustment—including exposure time, gain, and line rate—without hardware reconfiguration. Raw 14-bit linear data streams are preserved end-to-end, supporting post-acquisition calibration routines such as non-uniformity correction (NUC), flat-field compensation, and radiometric scaling. When integrated into automated inspection systems, metadata (timestamp, trigger source, temperature telemetry) is embedded in image headers to satisfy traceability requirements under ISO/IEC 17025 and internal QA protocols.

Applications

• Silicon wafer inspection: Detection of misalignment, micro-cracks, particle contamination, and trench defects prior to lithography or bonding steps
• OCT endoscopy and ophthalmic imaging: High-speed A-scan acquisition for real-time cross-sectional reconstruction in swept-source and spectral-domain OCT architectures
• Food and agricultural sorting: Identification of foreign bodies, bruising, sugar content gradients, and moisture distribution via SWIR reflectance profiling
• Combustion diagnostics: Time-resolved imaging of flame structure, soot concentration, and CO/H₂O emission bands in research-grade burners and engines
• Material classification: Discrimination of polymer types, coating thickness uniformity, and composite delamination using spectral absorption contrast
• Continuous process monitoring: Integration into roll-to-roll manufacturing lines for battery electrode coating, thin-film PV deposition, and pharmaceutical tablet coating verification

FAQ

What is the maximum usable line rate under full 14-bit readout?
The SU1024-LDM achieves 45,956 lps at 14-bit depth with Base Camera Link®; timing remains deterministic and jitter-free within ±0.1% of nominal rate.
Does the camera support external triggering and hardware synchronization?
Yes—it features TTL-compatible trigger input and output signals, supporting start-of-exposure, asynchronous reset, and line-valid strobe modes compliant with IEEE 1394b and Camera Link Standard v2.0.
Can the 50 µm pixel height option be retrofitted to an existing 25 µm unit?
No—the aperture height is defined at the sensor die level; selection must be specified at time of order.
Is radiometric calibration available from the manufacturer?
Sensors Unlimited provides NIST-traceable relative responsivity curves (per pixel) upon request; absolute calibration requires system-level characterization with calibrated blackbody sources.
What cooling options are supported for extended exposure stability?
The SU1024-LDM operates in thermoelectrically stabilized mode (−5 °C sensor setpoint, ±0.1 °C regulation); forced-air cooling is recommended for sustained operation above 30,000 lps.