YANRUN YR-F5030 Practical Image Measuring System

Overview

The YANRUN YR-F5030 Practical Image Measuring System is a high-precision, benchtop optical coordinate measuring instrument engineered for routine 2D geometric metrology in quality control laboratories, precision machining workshops, and R&D environments. It operates on the principle of non-contact optical imaging—capturing high-resolution digital images of parts placed on a motorized or manually traversed stage, then applying sub-pixel edge-detection algorithms to extract dimensional data with traceable uncertainty. Unlike tactile CMMs, the YR-F5030 eliminates mechanical probing forces that may deform soft or thin-walled components, making it especially suitable for measuring sheet metal parts, stamped components, PCBs, gaskets, plastic injection-molded features, and micro-machined geometries where surface integrity must be preserved. Its rigid granite base, thermally stable optical path, and calibrated stage motion ensure repeatable measurements across shifts and operators—critical for ISO 9001-compliant inspection processes.

Key Features

• High-stability mechanical platform with reinforced granite base and precision-ground linear guideways for minimal thermal drift and long-term geometric fidelity.
• Sony progressive-scan color CCD camera delivering low-noise, high-contrast imagery under both coaxial surface and bottom-transmitted LED illumination—both independently dimmable for optimal contrast on reflective, translucent, or opaque samples.
• Motorized or manual zoom objective lens (0.7×–4.5×) enabling seamless magnification adjustment without refocusing; total optical magnification range spans 28× to 180×, supporting measurement of features from ~0.02 mm to >50 mm in field of view.
• Digital encoder-based X/Y/Z axes with 0.5 µm resolution readout and certified positioning accuracy per ISO 10360-2: ≤ (3 + L/200) µm, where L is measured length in mm—fully compliant with calibration requirements for Class II dimensional verification tasks.
• Z-axis vertical travel of 175 mm accommodates tall fixtures, stacked assemblies, or parts requiring multi-level focus stacking for height profiling (when used with optional focus-scan modules).
• Integrated measurement software with automated edge recognition, noise suppression filters, and real-time GD&T evaluation (position, concentricity, parallelism, perpendicularity) aligned to user-defined datums.

Sample Compatibility & Compliance

The YR-F5030 accepts flat, planar, or moderately contoured parts up to 450 kg on its dedicated heavy-duty support stand (1250 × 900 × 780 mm). Samples with reflective surfaces (e.g., polished stainless steel), semi-transparent materials (e.g., acrylic lenses), or fine-textured finishes (e.g., EDM-machined surfaces) are accommodated via dual-mode LED lighting and adjustable exposure/gain parameters. The system meets general-purpose metrology requirements under ISO 14253-1 (Geometrical Product Specifications) and supports audit-ready reporting per ISO/IEC 17025 clause 7.8. While not certified to FDA 21 CFR Part 11 out-of-the-box, its software architecture permits configuration with electronic signatures, audit trails, and secure user access levels when deployed in regulated medical device or pharmaceutical manufacturing QA labs.

Software & Data Management

The standard YANRUN Metrology Suite includes full scripting capability (via embedded Lua engine), customizable report templates (PDF/Excel/CSV export), batch measurement routines, and database-driven part program storage. Measurement data is timestamped, operator-ID tagged, and archived with full traceability—including raw image capture, coordinate logs, and tolerance deviation heatmaps. Optional modules support SPC charting (X̄-R, Cp/Cpk), MSA (Gage R&R) analysis, and integration with enterprise MES or QMS platforms via OPC UA or RESTful API interfaces. All software updates and calibration certificate renewals are managed through version-controlled firmware packages aligned with NIST-traceable reference artifacts.

Applications

• Dimensional validation of CNC-machined housings, brackets, and flanges against GD&T callouts per ASME Y14.5.
• First-article inspection of automotive stampings—including hole position, slot width, and edge radius verification.
• PCB land pattern and solder mask alignment verification prior to SMT assembly.
• Quality gate screening of injection-molded plastic components for flash, sink marks, and cavity-to-cavity variation.
• Tooling verification for die sets, jigs, and go/no-go gauges using reverse-engineered CAD overlays.
• Educational use in metrology training labs for teaching optical measurement fundamentals, uncertainty budgeting, and ISO conformity assessment.

FAQ

Is the YR-F5030 compatible with CAD-based comparison workflows?
Yes—the software supports import of DXF, STEP, and IGES files for overlay-based deviation mapping, nominal-actual comparison, and automated pass/fail decision logic.
Does the system support third-party calibration services?
Yes—YANRUN provides dimensional calibration certificates traceable to CNAS-accredited laboratories; users may also engage ISO/IEC 17025-certified external providers using the system’s built-in calibration routine and artifact kit.
Can the YR-F5030 measure features with poor edge contrast?
Through adaptive thresholding, gradient-based edge enhancement, and multi-frame averaging, the system achieves reliable edge localization even on low-contrast edges such as anodized aluminum or matte-finish composites.
What maintenance is required for long-term accuracy?
Annual verification using certified step gauges and optical gratings is recommended; periodic cleaning of optical surfaces and stage guideways with lint-free cloths and isopropyl alcohol ensures sustained performance.
Is technical support available outside China?
Yes—YANRUN maintains authorized service partners in North America, Germany, and Southeast Asia, with remote diagnostics, English-language documentation, and on-site engineer dispatch options under extended warranty agreements.