YANRUN AMM200 Trinocular Upright Metallurgical Microscope
| Brand | YANRUN |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic (China) |
| Model | AMM200 Trinocular Upright Metallurgical Microscope |
| Price | Contact for Quote |
| Product Type | Upright (not inverted) |
| Image Analysis System Included | No |
| Eyepieces | Wide-Field 10× (18 mm field number), Wide-Field 16× (11 mm field number) |
| Objectives | Plan Achromatic, Cover-Slip-Free: 4×/NA 0.10, 10×/NA 0.25, 40×/NA 0.65 (Spring-Loaded), 63×/NA 0.85 (Spring-Loaded) |
| Optional Objectives | 100×/NA 1.25 (Oil Immersion, Spring-Loaded) |
| Mechanical Stage | 160 mm × 130 mm, Travel Range 76 mm × 50 mm, Vernier Scale Resolution 0.1 mm |
| Nosepiece | Ball-Bearing Mounted Quadruple Revolving Nosepiece |
| Focus Mechanism | Coaxial Coarse/Fine Focus, Total Travel 40 mm, Fine Focus Graduation 2 µm per division |
| Illumination | Vertical (Epi-) Illuminator with 6 V / 20 W Halogen Lamp, Dual Voltage Input (110 V / 220 V AC), Adjustable Brightness, Optional Filter Set (Light Blue, Light Green) |
| Configurations Available | Base Unit Only |
Overview
The YANRUN AMM200 Trinocular Upright Metallurgical Microscope is engineered for high-fidelity microstructural analysis of opaque, polished metallic and ceramic specimens. Unlike transmitted-light biological microscopes, the AMM200 employs epi-illumination—light directed vertically onto the specimen surface via a beam-splitter system—enabling high-contrast observation of grain boundaries, phase distributions, inclusion morphology, and surface defects without sectioning or staining. Its rigid, vibration-damped optical column and precision-machined mechanical stage ensure long-term stability during extended metallurgical evaluations. Designed in accordance with ISO 9001 manufacturing protocols and compliant with key optical metrology standards including ISO 8578 (microscope nomenclature) and ISO 10934-1 (optical components for microscopy), the AMM200 serves as a foundational instrument in QC laboratories, foundry R&D facilities, and academic materials science departments where reproducible, traceable imaging is required under GLP-aligned workflows.
Key Features
- Trinocular head with 30° inclined eyepiece tube and interpupillary adjustment range of 55–75 mm, optimized for ergonomic extended use and simultaneous visual observation plus camera coupling.
- Plan achromatic objectives (4×, 10×, 40×, 63×) featuring cover-slip-free design—eliminating focus shift when viewing unmounted or thick-sectioned metallographic samples—and spring-loaded front lenses to protect against accidental contact with abrasive specimen surfaces.
- Ball-bearing quadruple nosepiece ensures precise rotational alignment and minimal wobble during objective switching, maintaining parfocality across magnifications within ±0.02 mm tolerance.
- Coaxial coarse/fine focusing mechanism with 40 mm total vertical travel and 2 µm fine-focus graduation enables sub-micron depth discrimination in layered microstructures such as carburized case depths or oxide scale cross-sections.
- Adjustable-intensity halogen epi-illuminator (6 V / 20 W) supports consistent color temperature (≈3200 K) across brightness settings and integrates standard interference filters (light blue, light green) for selective contrast enhancement in etched steel or aluminum alloys.
- Large-format mechanical stage (160 × 130 mm) with vernier-scaled X-Y translation (76 × 50 mm range, 0.1 mm resolution) facilitates systematic grid-based scanning of large-area metallographic mounts per ASTM E3 and ISO 643 protocols.
Sample Compatibility & Compliance
The AMM200 accommodates standard metallographic specimens up to 40 mm in height and 75 mm in diameter, including mounted and polished cross-sections of ferrous/non-ferrous alloys, sintered powders, weld zones, and thermal spray coatings. Its cover-slip-free optics eliminate refractive index mismatch issues common in oil-immersion setups on rough or uneven surfaces. The system complies with ISO 10934-2 (requirements for metallurgical microscopes), meets mechanical safety requirements per IEC 61010-1, and supports documentation traceability aligned with ISO/IEC 17025 accreditation criteria for testing laboratories. While not supplied with image analysis software, its trinocular port conforms to C-mount (1″, 32 TPI) and F-mount interface standards, enabling integration with third-party digital cameras certified under FDA 21 CFR Part 11 for audit-trail-enabled image capture in regulated environments.
Software & Data Management
The AMM200 is available in multiple configuration tiers to support evolving digital workflow needs: standalone base unit; base unit with USB 3.0 digital imaging module (including 5 MP CMOS sensor and real-time preview software); base unit with video acquisition and basic measurement suite (length, area, angle, particle count); and fully integrated packages supporting grayscale thresholding, multi-region ROI annotation, and export of calibrated TIFF/PNG sequences compatible with MATLAB, ImageJ/Fiji, and commercial metallurgical analysis platforms such as Thermo Scientific™ AMETEK’s Thermo-Calc®-linked modules. All optional digital systems provide timestamped metadata embedding (date/time, magnification, objective ID, exposure parameters) and support DICOM-SR export for archival in LIMS or ELN infrastructures.
Applications
- Quantitative metallography per ASTM E112 (grain size determination), ASTM E1245 (inclusion rating), and ISO 4967 (non-metallic inclusions in steel).
- Failure analysis of fracture surfaces, fatigue striations, and intergranular corrosion patterns in aerospace-grade titanium and nickel superalloys.
- Process validation in heat treatment lines—monitoring martensite/austenite ratios in quenched steels or carbide distribution in tool steels.
- Quality assurance of additive manufactured parts—including porosity mapping, unmelted powder detection, and layer bonding integrity assessment.
- Research-scale characterization of nanocomposite coatings, diffusion barriers, and oxide scale growth kinetics at elevated temperatures.
FAQ
Is the AMM200 suitable for inverted metallurgical applications?
No—the AMM200 is an upright configuration optimized for top-illumination of conventionally mounted, polished specimens. Inverted designs (e.g., AMM300 series) are recommended for large or heavy samples requiring bottom-stage access.
Can oil immersion objectives be used with this microscope?
Yes—while the standard set excludes oil immersion, the optional 100×/NA 1.25 spring-loaded objective is mechanically and optically compatible with the quadruple nosepiece and maintains parfocality with the included objectives.
Does the system include calibration certification?
Each unit ships with a factory-verified stage micrometer calibration certificate traceable to NIM (National Institute of Metrology, China), valid for 12 months under normal operating conditions.
What power supply options are supported?
The halogen illuminator accepts dual-input AC voltage (110 V or 220 V, 50/60 Hz) and delivers stable 6 V DC output to the lamp via internal regulation—no external transformer required.
Is the microscope compatible with automated stage controllers or motorized focus?
The AMM200’s mechanical stage and focus assembly are manually operated by default; however, third-party motorization kits (e.g., Prior Scientific ProScan III) can be retrofitted using standardized mounting threads and encoder-ready focus shaft interfaces.

