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| Brand | Klocke Nanotechnik |
|---|---|
| Origin | Germany |
| Product Type | Contact-Mode 3D Profilometer / Surface Topography & Roughness Measuring System |
| Measurement Range (X/Y/Z) | 10–50 mm / 10–50 mm / 10–20 mm |
| Extended XY Travel | 100 × 100 mm² or 350 × 350 mm² |
| Motion Resolution | 1 nm |
| Tip Resolution | 0.5 nm |
| Probe Types | Metallic wire tip (radius < 100 nm), hook-type wire tip (radius < 100 nm), spherical tip (Ø 0.12–0.3 mm), diamond tip (for indentation) |
| Sensor Configuration | Dual-axis (horizontal & vertical) capacitive displacement sensors |
| Software Features | Automated tip calibration & approach, 2D/3D visualization, quantitative surface analysis, optional sequence generator for automated measurement routines |
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