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| Brand | AUTOSCAN |
|---|---|
| Model | FastTracks 3 (v.3) |
| Measurement Principle | Optical microscopy-based fission track counting and length analysis on etched mineral surfaces (apatite, zircon) |
| Imaging Resolution | 0.1 µm step resolution, sub-micron feature detection capability |
| Motorized Stage | 75 mm (X) × 50 mm (Y) × 3 mm (Z), repeatability ±2 µm |
| Camera | Monochrome CCD, 768 × 576 pixels, 40 fps full-resolution acquisition |
| Software Suite | TrackWorks 3 + FastTracks 3 v.3, GLP-compliant audit trail support |
| Compliance | Designed for ISO/IEC 17025-accredited thermochronology labs |
| Sample Compatibility | Standard petrographic thin sections (25 × 75 mm), polished grain mounts, apatite/zircon separates on epoxy resin stubs |
| Automation Level | Fully automated grain search, track identification, constrained/unconstrained track counting, 3D semi-track length measurement, Dpar/Dper calculation, c-axis orientation mapping |
| Training Module | Integrated pedagogical overlay with instructor-reference overlay and change-diff annotation |
| Brand | AMPTek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | 3D Force Measurement System |
| Pricing | Upon Request |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | XR-100CR |
| Detector Type | Si-PIN |
| Active Area | 6–25 mm² |
| Silicon Thickness | 500 µm |
| Energy Resolution | 145–230 eV FWHM @ 5.9 keV (⁵⁵Fe) |
| Be Window Thickness | 12.5 µm or 25 µm |
| Operating Temperature | ~−55 °C (thermoelectrically stabilized) |
| Power Consumption | <1 W total |
| Package | Hermetic TO-8 with beryllium window |
| Weight | 139 g |
| Certifications | UL 61010-1:2004, CAN/CSA-C22.2 No. 61010-1:2004, TUV CU 72072412 01 |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MINI-X |
| Price | Upon Request |
| Target Material | Silver (Ag) or Gold (Au) |
| Target Thickness | Ag = 0.75 µm |
| Tube Voltage Range | 10–50 kV |
| Tube Current Range | 5–200 µA |
| Max Continuous Output Power | 4 W |
| Window Material | Beryllium (Be), grounded |
| Window Thickness | 127 µm |
| Focal Spot Size | ~2 mm |
| Output Cone Angle | 120° |
| Cooling Method | Air-cooled |
| High Voltage Stability | <0.1% |
| Leakage Radiation (5 cm, safety plug installed) | <5 µSv/h |
| Input Voltage | 12 VDC (AC adapter included) |
| Control Interface | USB (mini-USB connector, cable included) |
| Settling Time | <1 s typical |
| Weight | 360 g |
| Operating Temperature | −10 °C to +50 °C |
| Storage Temperature | −25 °C to +60 °C |
| Relative Humidity | 30–90% non-condensing |
| Safety Features | External hardware interlock, flashing LED, audible beeper |
| Software | Mini-X Control GUI + Mini-X API for custom integration |
| Warranty | 1 year or 2000 operating hours, whichever occurs first |
| Key | Brand: Amptek |
|---|---|
| Origin | USA |
| Model | Mini-X2 |
| Max Power | 4 W or 10 W |
| Max HV | 50 kV or 70 kV |
| Anode Materials | Ag, Rh, Au, W |
| Tube Voltage Range | 10–50 kV or 35–70 kV |
| Tube Current Range | 5–200 µA |
| Anode Thickness | Ag/Rh = 0.75 µm (±0.1 µm), Au/W = 1.00 µm (±0.1 µm) |
| Window Material | Be (127 µm) |
| Focus Size | ~2 mm |
| HV Polarity | Grounded Anode |
| HV Stability | <0.1% |
| Output Flux Stability | <0.3% (temperature-stabilized) |
| Beam Divergence | 120° |
| Cooling | Air-cooled |
| Leakage Radiation | <5 µSv/h at 5 cm with safety plug |
| Operating Temp | −10°C to +50°C |
| Storage Temp | −25°C to +60°C |
| Humidity | 30–90% RH (non-condensing) |
| Interface | USB 2.0 (mini-USB), 12 VDC input, AUX I/O with interlock & status indicators |
| Control Software | Mini-X Control GUI + Mini-X API (C/C++, Python, LabVIEW) |
| Warranty | 1 year or 2000 operating hours, whichever occurs first |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | X-123 |
| Price | Upon Request |
| Detector Type | Si-PIN |
| Cooling | 2-Stage Thermoelectric Cooler |
| Active Area | 5–25 mm² |
| Thickness | 300–680 µm |
| Energy Resolution | 145–260 eV FWHM @ 5.9 keV |
| Optimal Energy Range | 1–40 keV |
| Max Count Rate | 2 × 10⁵ cps |
| Power Consumption | 1.2 W |
| Dimensions | 70 × 100 × 25 mm (2.7 × 3.9 × 1 in) |
| Weight | 180 g (6.3 oz) |
| Interface | USB & RS-232 |
| Compliance | RoHS/WEEE |
| Brand | Amptek |
|---|---|
| Model | XR-100SDD |
| Detector Type | Silicon Drift Detector (SDD) |
| Active Area | 25 mm² |
| Silicon Thickness | 500 µm |
| Energy Resolution @ 5.9 keV (⁵⁵Fe) | 125–140 eV FWHM |
| Max Count Rate | 500,000 cps |
| Peak-to-Background Ratio | 8200:1 |
| Be Window Thickness | 12.5 µm |
| Operating Temperature | 0°C to +50°C |
| Power Consumption | <1 W |
| Weight | 125 g |
| Dimensions | 7.6 × 4.4 × 2.9 cm |
| Warranty | 1 year |
| Typical Lifetime | 5–10 years |
| Brand | MiXran |
|---|---|
| Model | Meg1134 |
| Type | Zero-Order Quarter-Wave Plate (λ/4) |
| Construction | Air-Gap Retarder |
| Design Wavelengths | 257 nm to 1550 nm |
| Aperture | ≥8.0 mm (for Ø12.7 mm plates) or ≥15.0–18.0 mm (for Ø25.4 mm plates) |
| Thickness | 6.35 mm or 7.92 mm |
| Incident Angle | 0° |
| Surface Quality | λ/10 @ 633 nm |
| Wavefront Distortion | <λ/4 over clear aperture |
| Substrate Material | Fused Silica (UV-grade for ≤355 nm |
| Coating | Broadband AR coating (R<0.25% per surface, specified per wavelength band) |
| Damage Threshold | >5 J/cm² (10 ns, 10 Hz, 1064 nm) |
| Brand | Nikon |
|---|---|
| Origin | Japan |
| Model | Eclipse Ni-E / Ni-U |
| Optical System | CFI60 / CFI75 Infinity-Corrected |
| Illumination | 12V 100W Halogen with Fly-Eye Lens Array |
| Objective Compatibility | CFI Plan Apochromat λ Series (350–850 nm) |
| Fluorescence Performance | Noise Terminator™ High-S/N System |
| Focus Mechanism | Motorized Coaxial Fine/Coarse (Ni-E, 0.05 µm encoder resolution) / Manual with Re-Positioning Function (Ni-U) |
| Stage | Ceramic-Coated Mechanical or Motorized XY (66 × 52 mm, 0.1 µm step) |
| Eyepiece Options | Widefield UW10× (25 mm FOV), Photomask-Compatible, Ergonomic Tilting Binoculars (10°–30°) |
| Compliance | Designed for ISO 10993-compliant sample handling workflows |
| Brand | Narishige |
|---|---|
| Origin | Japan |
| Model | M-152 |
| Coarse Travel (X/Y/Z) | 25 mm / 20 mm / 25 mm |
| Fine Adjustment Resolution | Sub-micrometer (via optional single-axis micrometer drive) |
| Dimensions (W×D×H) | 95 × 36 × 135 mm |
| Weight | 320 g |
| Standard Accessory | B-8B Spherical Joint |
| Optional Upgrade | Uniaxial Micrometer Drive (pipette-aligned axis) |
| Brand | CRAIC |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | CRAIC Apollo II™ Confocal Raman Microspectrometer |
| Pricing | Available Upon Request |
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