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| Brand | Image Metrology |
|---|---|
| Model | SPIP 6.0.13 |
| Origin | USA |
| Software Type | Modular SPM/SEM/Interferometry Image Processing Platform |
| Supported Modalities | SPM, SEM, TEM, White-Light Interferometry, Confocal Microscopy, Optical Profilometry, 3D Topography |
| Core Modules | Base Analysis Module + 13 Optional Add-on Modules |
| Compliance | ASTM E2927, ISO 25178-2, ISO/IEC 17025 (data integrity workflows), FDA 21 CFR Part 11-ready audit trail (via optional GLP/GMP module) |
| Licensing | Perpetual node-locked or floating license |
| System Requirements | Windows 10/11 64-bit, ≥16 GB RAM, ≥50 GB SSD storage, OpenGL 4.5-compatible GPU |
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