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| Brand | Image Metrology |
|---|---|
| Model | SPIP 6.0.13 |
| Origin | USA |
| Software Type | Modular SPM/SEM/Interferometry Image Processing Platform |
| Supported Modalities | SPM, SEM, TEM, White-Light Interferometry, Confocal Microscopy, Optical Profilometry, 3D Topography |
| Core Modules | Base Analysis Module + 13 Optional Add-on Modules |
| Compliance | ASTM E2927, ISO 25178-2, ISO/IEC 17025 (data integrity workflows), FDA 21 CFR Part 11-ready audit trail (via optional GLP/GMP module) |
| Licensing | Perpetual node-locked or floating license |
| System Requirements | Windows 10/11 64-bit, ≥16 GB RAM, ≥50 GB SSD storage, OpenGL 4.5-compatible GPU |
| Key | Brand: SPIP |
|---|---|
| Origin | USA |
| Version | 6.0.14 |
| Licensing Model | Perpetual License with Maintenance |
| Supported Microscopy Modalities | SPM/AFM, SEM, TEM, Optical Microscopy, Confocal Microscopy, Interferometry, White-Light Interferometry (WLI), Focus Variation, 3D Profilometry |
| File Format Compatibility | Standard binary and ASCII formats including Gwyddion (.gwy), Nanoscope (.nsi/.nd2), WSxM (.wsxm), Veeco (.spm), Digital Surf (.sur/.sdf), ISO 5436-2, and vendor-neutral TIFF/RAW stacks |
| Deployment | Windows 10/11 (64-bit) |
| Compliance | Supports GLP/GMP-aligned audit trails (via optional Audit Trail Module), ISO 25178-2 surface texture parameter calculation, ASTM E2923-23 for AFM measurement uncertainty reporting |
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