SPECTRO
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| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | ARCOS |
| Instrument Type | Full-Spectrum Direct-Reading ICP-OES |
| Detection Limit | Sub-ppb to ppm |
| Precision (RSD) | ≤1% |
| Long-Term Stability (Drift) | ≤0.1% |
| Wavelength Range | 130–770 nm |
| Optical Resolution | ≤0.008 nm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | New SPECTRO ARCOS |
| Instrument Type | Full-Spectrum Direct-Reading ICP-OES |
| Detection Limit | <1 ppb |
| Precision (RSD) | 0.5% |
| Long-Term Stability | 1% |
| Wavelength Range | 130–770 nm |
| Optical Resolution | <8.5 pm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | SPECTRO ARCOS |
| Instrument Type | Full-Spectrum Simultaneous ICP-OES |
| Detection Limit | Sub-ppb to ppm |
| Repeatability | ≤1% RSD |
| Long-Term Stability | ≤0.1% RSD |
| Wavelength Range | 130–770 nm |
| Optical Resolution | ≤0.008 nm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO CHECK |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector Configuration | Dual Detector (PMT + CCD) |
| Focal Length | 1000 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 120–589 nm |
| Spectral Coverage | Full-Spectrum Acquisition |
| Compliance | Designed and manufactured in Germany per ISO 9001-certified production processes |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO CUBE |
| Instrument Type | Polarized ED-XRF |
| Elemental Range | Na to U |
| Detection Range | ppm to 100% |
| Energy Resolution | 130 eV |
| Detector | Silicon Drift Detector (SDD) |
| Form Factor | Benchtop/Floor-standing |
| Application Scope | General-purpose |
| Compliance Support | RoHS, ELV, ASTM D7464, ISO 8258, USP <232>/<233>, EPA Method 6200 |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO GENESIS |
| Instrument Type | Full-Spectrum Direct-Reading ICP-OES |
| Optical Detection | Dual-View Vertical Torch Configuration |
| Cooling | Air-Cooled Only |
| Purge Gas Flow | As Low as 0.5 L/min |
| Linear Dynamic Range | Sub-ppb to Percent Level |
| Sample Throughput | Up to 700 Samples per Day |
| Optical Architecture | DSOI (Dual-Spectrometer Optimized Imaging) |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO GENESIS |
| Type | Full-Spectrum Simultaneous ICP-OES |
| Wavelength Range | 175–770 nm |
| RF Generator | 27 MHz Solid-State |
| Optical Purge Flow | ≥0.5 L/min (Argon or Nitrogen) |
| Sample Throughput | Up to 700 samples/day |
| Detector | High-Quantum-Efficiency CCD Array |
| Compliance | ASTM D5185, D6595, ISO 11885, USP <233>, EPA Methods 200.7, 6010D, 6020B, GLP/GMP-ready with 21 CFR Part 11–compliant software options |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | GENESIS |
| Instrument Type | Full-Spectrum Simultaneous ICP-OES |
| Detection Limit | ppb–ppm |
| Repeatability | ≤0.2% |
| Stability | ≤0.2% |
| Wavelength Range | 130–770 nm |
| Optical Resolution | 1 pm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | GREEN |
| Instrument Type | Full-Spectrum Direct-Reading ICP-OES |
| Detection Limit | sub-ppb |
| Precision (RSD) | <1.5% |
| Stability (RSD) | <1.5% |
| Wavelength Range | 165–770 nm |
| Optical Resolution | <0.008 nm across full spectrum |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO M.01 |
| Instrument Type | Benchtop |
| Technology | Spark Optical Emission Spectrometry (OES) |
| Target Matrix | Ferrous Alloys |
| Compliance | ISO/IEC 17025 compatible, ASTM E415, ASTM E1086, EN 10315, DIN 51008 |
| Software | SPECTRO AnalyzeNet v3.x with ICAL 2.0 calibration technology |
| Gas Requirement | High-purity argon (≥99.996%) |
| Cooling | Air-cooled |
| Safety | CE, UL 61010-1 compliant |
| Data Management | Audit trail, user access levels, GLP/GMP-ready reporting |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO MAXx (LMX10) |
| Instrument Type | Floor-standing |
| Excitation Method | Spark |
| Detector Type | CMOS |
| Focal Length | 750 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 120–670 nm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO MAXx Desktop |
| Excitation Source | Spark |
| Detector Type | CMOS |
| Focal Length | 500 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 120–670 nm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | MAXx |
| Instrument Type | Floor-standing |
| Excitation Method | Spark |
| Detector Type | CCD (Charge-Coupled Device) |
| Focal Length | 400 mm |
| Grating Line Density | 3600 lines/mm |
| Wavelength Range | Customizable (140–670 nm) |
| Number of Channels | User-configurable |
| Optical Architecture | Optimized Paschen-Runge Mount |
| Environmental Control | Thermostatically Stabilized & Pressure-Compensated Enclosure |
| Argon Consumption | Reduced by up to 50% vs. conventional systems |
| Calibration Protocol | ICAL Intelligent Calibration (single-standard, multi-matrix) |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROMIDEX |
| Instrument Type | Benchtop ED-XRF Spectrometer |
| Application Scope | General-purpose elemental analysis, optimized for precious metals |
| Compliance | Designed for ISO/IEC 17025-compliant labs, supports GLP/GMP data integrity requirements |
| Detector | High-resolution silicon drift detector (SDD) with micro-focus X-ray source |
| Measurement Principle | Energy-dispersive X-ray fluorescence (ED-XRF) with polycapillary optic collimation |
| Sample Form | Solid, powdered, or plated samples (non-destructive) |
| Software | SPECTRO XRF Analyzer Suite with audit trail, user-level permissions, and 21 CFR Part 11–ready reporting modules |
| Data Export | CSV, XML, PDF |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | MIDEX |
| Configuration | Benchtop / Floor-Standing |
| Excitation Source | Mo-target X-ray tube (max. 48 kV, 30 W) |
| Measurement Spot Size | 0.2–3.3 mm (optional collimator exchange) |
| Standard Spot | 0.7 mm (Midex SD) / 1.0 mm (Midex LD) |
| Detector | Peltier-cooled Si drift detector (SDD), 10 mm² (SD) / 30 mm² (LD) |
| Energy Resolution | FWHM < 160 eV at Mn Kα (10,000 cps) |
| Max. Count Rate | 250,000 cps |
| Sample Chamber Dimensions | 520 × 310 × 160 mm (L×W×H) |
| XYZ Motorized Stage | 240 × 178 × 160 mm travel, 3 kg max load |
| Operating Temp. | 5–30 °C |
| Relative Humidity | 10–80 % RH (non-condensing) |
| Power Supply | 95–240 V AC, 50/60 Hz, 200 W |
| Instrument Weight | 55–70 kg |
| Software | FP-based quantification (alloys, RoHS, halogen-free polymers), real-time spectral evaluation, spatial mapping, GLP-compliant reporting |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | PORT |
| Instrument Type | Portable / Mobile |
| Excitation Source | Spark |
| Detector Type | Dual Detector (PMT + CCD) |
| Focal Length | 400 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 178–530 nm |
| Spectral Coverage | Full-Spectrum Acquisition |
| Compliance | Designed for ISO/IEC 17025-compliant metal analysis workflows, supports ASTM E415, E1086, and EN 10315 traceability requirements |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO SCOUT |
| Instrument Type | Polarized ED-XRF |
| Configuration | Benchtop/Field-Deployable |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Tube | Rhodium (Rh) anode, up to 50 kV |
| Elemental Range | Na (11) to U (92) |
| Detection Limits | As low as <1 ppm for selected elements |
| Analysis Time | 3–10 min per sample |
| Dimensions | 270 × 306 × 306 mm |
| Weight | 12.75 kg |
| Battery Life | Up to 5 hours continuous operation |
| Sample Chamber | Large-volume, accommodates irregular and bulk samples |
| Calibration | iCAL single-sample standardization in ≤5 minutes |
| Software Interface | Integrated touchscreen with preloaded application packages |
| Optional | Integrated high-resolution camera for sample positioning and image-result correlation |
| Connectivity | USB, Wi-Fi, Ethernet |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO SCOUT |
| Application | Field-Portable ED-XRF Analysis |
| Element Range | Na (11) to U (92) |
| Detection Range | ppm to 100% |
| Energy Resolution | <140 eV |
| Detector | Silicon Drift Detector (SDD) |
| Weight | 12 kg |
| Dimensions | 270 × 306 × 306 mm |
| Integrated Touchscreen PC | Yes |
| Battery-Operated | Yes |
| Optional Integrated Imaging System | Yes |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTRO SCOUT |
| Type | Portable, Hybrid (Scanning + Multi-Channel) ED-XRF Spectrometer |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Tube | Rh anode, max. 50 kV |
| Elemental Range | Na (11) to U (92) |
| Spot Size | 1 mm diameter |
| Dimensions (transport) | 270 × 306 × 306 mm |
| Dimensions (operational) | 350 × 306 × 306 mm |
| Weight | 12.0 kg (without battery), 12.75 kg (with battery) |
| Power Supply | 10–30 V DC (integrated Li-ion battery) |
| AC adapter | 90–264 V AC, 50–60 Hz |
| Interface | Integrated touchscreen PC, Bluetooth, Wi-Fi, LAN, USB |
| Software | SPECTRO XRF Analyzer Pro with iCAL (intelligent Calibration) |
| Compliance | Designed for field-deployable GLP-aligned workflows |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROCUBE |
| Configuration | Benchtop/Floor-Standing |
| Elemental Range | Na–U |
| Quantification Range | 0.1 ppm – 99.99% |
| Energy Resolution | 130 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements, n ≥ 10) |
| Detector | Silicon Drift Detector (SDD) |
| Compliance | CE, RoHS, IEC 61000-6-3/6-4 |
| Instrument Class | ED-XRF Spectrometer for Petrochemical QA/QC |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROCUBE (RoHS-Optimized) |
| Configuration | Benchtop/Free-Standing |
| Detector Type | High-Resolution Silicon Drift Detector (SDD) |
| Count Rate Capability | Up to 100,000 cps |
| Elemental Range | Na (11) to U (92) |
| Minimum Detection Limits (MDL) | Sub-ppm to low-ppm range for regulated elements (Pb, Cd, Hg, Cr, Br, Cl, etc.) |
| Compliance Standards | IEC 62321-5:2013, EN 62321-5:2014, ASTM F2853-21, USP <232>/<233>, ISO 17025-accredited operation support |
| Software | SPECTRO XRF Suite with RoHS-specific method templates, audit trail, and 21 CFR Part 11-compliant user management |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROLAB S |
| Instrument Type | Floor-Standing |
| Excitation Method | Spark |
| Detector Type | CMOS |
| Focal Length | 750 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 120–800 nm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROLAB S LAS02 |
| Instrument Type | Floor-Standing |
| Excitation Source | Spark |
| Detector Type | CMOS+T Solid-State Array |
| Focal Length | 750 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 120–800 nm |
| Number of Channels | Application-Defined |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROMAXx (Desktop) |
| Instrument Type | Desktop |
| Excitation Method | Spark |
| Detector Type | CMOS |
| Focal Length | 400 mm |
| Grating Density | 3600 lines/mm |
| Wavelength Range | User-Configurable |
| Number of Channels | Application-Dependent |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROMAXx (Floor-standing) |
| Instrument Type | Floor-standing |
| Excitation Method | Spark |
| Detector Type | CMOS |
| Focal Length | 400 mm |
| Grating Density | 3600 lines/mm |
| Wavelength Range | User-configurable |
| Number of Channels | Application-dependent |
| Compliance | ASTM E1184, ISO 11577, ISO 6871, EN 10052, USP <233>, FDA 21 CFR Part 11 (software-enabled), GLP/GMP-ready audit trail |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROMAXx |
| Instrument Type | Floor-standing |
| Excitation Source | Spark Discharge |
| Detector | Charge-Coupled Device (CCD) |
| Focal Length | 400 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | User-configurable |
| Number of Channels | User-configurable |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROMAXx08 |
| Excitation Source | Spark |
| Detector Type | Charge-Coupled Device (CCD) |
| Focal Length | 400 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | User-configurable |
| Number of Channels | Not applicable (Full-spectrum CCD-based system) |
| Instrument Form Factor | Floor-standing |
| Application Domain | Metal & Foundry Quality Control, Incoming/Outgoing Material Inspection, Process Monitoring |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | SPECTROPORT |
| Instrument Type | Portable / Field-Deployable |
| Excitation Method | Spark Discharge |
| Detector Type | CCD (Charge-Coupled Device) |
| Focal Length | 300 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 178–530 nm |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Instrument Type | Portable/Mobile |
| Excitation Method | Spark & Arc |
| Detector Type | CCD (Charge-Coupled Device) |
| Focal Length | 400 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 174–670 nm |
| Number of Channels | Unlimited |
| Power Supply | Rechargeable Battery (up to 800 measurements per charge) |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SPECTRO TEST |
| Instrument Type | Portable/Mobile |
| Excitation Method | Spark & Arc |
| Detector Type | CCD (Charge-Coupled Device) |
| Focal Length | 400 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 174–670 nm |
| Spectral Coverage | Full-Spectrum (Echelle + Prism Cross-Dispersion) |
| Price Range | USD 52,000–65,000 (FOB Hamburg) |