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| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Xradia 515 Versa |
| Spatial Resolution | ≤500 nm (true native resolution) |
| Imaging Modes | Absorption Contrast, Propagation-Based Phase Contrast |
| Software Platform | Scout-and-Scan Control System with ART 3.0 Advanced Reconstruction Toolbox |
| Compatibility | In Situ Mechanical & Thermal Stages, Automated Sample Handling, Flat-Panel Detector Options |
| Regulatory Compliance | Designed for GLP/GMP-aligned workflows |
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