Chemical Analysis Instruments
Filter
Showing 2071–2100 of 4548 results
| Brand | Instrumax |
|---|---|
| Origin | Tianjin, China |
| Manufacturer Type | OEM Manufacturer |
| Instrument Type | Quaternary Solvent Delivery Pump |
| Max Pressure | 10000 psi |
| Flow Rate Range | 0.01–5 mL/min |
| Flow Accuracy | ±0.2% RSD |
| Flow Precision | ≤0.2% RSD |
| Brand | HORIBA |
|---|---|
| Origin | USA |
| Manufacturer Type | Manufacturer |
| Import Status | Imported |
| Model | InverTau |
| Pricing | Upon Request |
| Dispersive Element | Filter-Based |
| Resolution | 4096 × 4096 |
| Brand | Ion Tec Co., Ltd. |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Triple Quadrupole (QqQ) LC-MS/MS |
| Mass Range | m/z 15–2000 |
| Sensitivity | ≤0.5 pg on-column injection of reserpine (S/N ≥ 100:1 in MRM mode) |
| Resolution | >2000 (full width at half maximum, FWHM) |
| Brand | Ion Tec Co., Ltd. |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Single Quadrupole Mass Spectrometer |
| GC Configuration | Conventional Capillary GC-MS |
| Mass Range | 2–1200 amu |
| Resolution (10% Valley) | >1000 |
| Sensitivity (Octafluoronaphthalene, OFN, SIM mode) | >1500:1 (S/N) |
| Scan Speed | 20,000 amu/s |
| Detector | Electron Multiplier (EM) |
| Pressure Control Accuracy | ±0.001 psi |
| Brand | IONTOF |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Qtac |
| Quotation | Upon Request |
| Ion Species | 3He⁺, 4He⁺, 20Ne⁺, 40Ar⁺, 84Kr⁺ |
| Ion Gun Energy Range | 1,000–8,000 eV |
| Ion Beam Current | 1 pA–100 nA |
| Maximum Ion Beam Scan Area | 4 × 4 mm² |
| Minimum Beam Spot Size (Standard Source) | < 15 µm (< 20 µm for He⁺) |
| Minimum Beam Spot Size (High-Brightness Source) | < 5 µm |
| Sensitivity | > 75,000 counts/nC (measured using 5 keV 20Ne⁺ scattering from pure Cu) |
| Mass Resolution (m/Δm) | > 35 (FWHM) on Cu |
| Detection Limit (for Au) | < 100 ppm |
| Brand | ISCO |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CombiFlash EZ Prep |
| Application Level | Laboratory Grade |
| Instrument Type | High-Pressure Preparative Liquid Chromatography System |
| Flow Rate Range | 0–200 mL/min |
| Flow Rate Precision | RSD ≤ 1% |
| Maximum Operating Pressure | 3500 psi (240 bar) |
| Wavelength Range | 200–400 nm (UV), 200–800 nm (UV-VIS) |
| Wavelength Accuracy | ±1 nm |
| Baseline Noise | 1 × 10⁻⁵ AU |
| Data Acquisition Rate | 200 Hz |
| Column Compatibility | Up to 50 mm ID, down to 5 µm particle size packing |
| Solvent Switching | Fully Automated, User-Initiated or Method-Triggered (Normal-Phase to Reversed-Phase) |
| Brand | ISCO |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CombiFlash NextGen |
| Application Level | Laboratory Grade |
| Instrument Type | Medium-to-Low Pressure Preparative LC |
| Flow Rate Range | 1–300 mL/min |
| Flow Accuracy | RSD ≤ 0.01% |
| Flow Precision | RSD ≤ 0.1% |
| Maximum Operating Pressure | 300 psi (20 bar) |
| Wavelength Range | 190–800 nm (UV-Vis) |
| Wavelength Reproducibility | ±1 nm |
| Baseline Noise | ≤1 × 10⁻⁵ AU |
| Data Acquisition Rate | 5 Hz |
| Detection Options | UV, UV-Vis, ELSD, Mass Spectrometry (MS)-compatible interface |
| Brand | ISCO |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CombiFlash Torrent |
| Application Level | Industrial-Scale Preparation |
| Instrument Type | Medium-to-Low Pressure Preparative LC |
| Flow Rate Range | 1 L/min |
| Flow Accuracy | <1% |
| Flow RSD | <1% |
| Maximum Operating Pressure | 100 psi |
| Wavelength Range | 190–800 nm (UV-Vis) |
| Wavelength Accuracy | ±1 nm |
| Wavelength Reproducibility | ±1 nm |
| Sample Capacity | Up to 600 g per run |
| Column Compatibility | RediSep® (80 g – 3 kg), glass columns, third-party cartridges |
| Software | PeakTrak™ v5.0 with real-time gradient editing, method scaling, and RFID-enabled column recognition |
| Detection | Dual-wavelength UV/Vis detector with auto-zero baseline correction |
| Fraction Collection | Foxy R2 fraction collector or motorized 6-port switching valve |
| Safety Systems | Integrated pressure transducer, solvent vapor sensor, automatic shutdown on fault |
| Fluidic Architecture | Fully grounded stainless-steel and PEEK tubing, large-bore flow path |
| Brand | ISCO |
|---|---|
| Model | R1/R2 |
| Instrument Type | Liquid-Phase Fraction Collector |
| Collection Modes | Volume-, Time-, Drop-, and Peak-Triggered |
| Maximum Flow Rate | 100 mL/min |
| Dimensions (R1) | 31 × 33 × 35.5 cm |
| Dimensions (R2) | 31 × 53 × 38 cm |
| Weight (R1, without rack) | 7.7 kg |
| Weight (R2, without rack) | 10.6 kg |
| Power Supply | 115 VAC or 230 VAC, 50/60 Hz |
| Tube Rack Options | 144-12, 144-13, 100-16, 72-18, 36-25, 60-1.5, 36-50, 96-well plate compatible |
| Safety Features | Leak detection, electrical insulation protection |
| Mounting | Optional instrument stand for space optimization |
| Origin | Sweden |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Isolera™ One |
| Price Range | USD 42,000–56,000 (est.) |
| Application Level | Laboratory-Scale Purification |
| Instrument Type | Medium-Pressure Preparative LC System |
| Flow Rate Range | 1–200 mL/min |
| Maximum Operating Pressure | 200 psi (13.8 bar) |
| UV Detection Wavelength Range | 200–400 nm |
| Gradient Capability | Binary with Optional Tertiary Solvent Addition (Constant-Ratio Modifier Injection) |
| Column Compatibility | Biotage SNAP, SNAP Ultra, ZIP, and ZIP Sphere columns (5 g to 750 g) |
| Brand | ISOTOPX |
|---|---|
| Origin | United Kingdom |
| Model | NGX-600 |
| Instrument Type | Rare Gas Isotope Ratio Mass Spectrometer |
| Mass Range | 1–200 Da |
| Resolution | 400–600 |
| Detection System | Configurable Faraday Cup and Ion Counter Electron Multiplier Array |
| Standard Amplifier | ATONA Amplifier |
| Vacuum System | Compact Static Vacuum Gauge |
| Ion Source | High-Sensitivity Nier-Type Source |
| Brand | ISPEC |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Manufacturer |
| Regional Classification | Domestic |
| Model | Analytical System |
| Quotation | Upon Request |
| Instrument Category | Spectral Software & Database Suite |
| Instrument Type | Laboratory-Based |
| Wavenumber Range | 4000–400 cm⁻¹ |
| Resolution | 1 cm⁻¹ |
| Brand | Applied Spectra |
|---|---|
| Origin | USA |
| Model | J200 iX |
| Laser Source | Yb:KGW-pumped femtosecond laser |
| Wavelength | 1030 nm / 343 nm (harmonic) |
| Pulse Width | ≤500 fs |
| Repetition Rate | 1–1000 Hz adjustable |
| Spot Size | 5–70 µm adjustable |
| Sample Chamber | Dual-volume chamber with cryogenic option |
| Motion Stage | High-precision motorized XYZ stage with micron-level resolution |
| Imaging | Integrated coaxial optical imaging system |
| Gas Handling | Configurable multi-gas flow control unit (He, Ar, N₂) |
| Optional Module | Integrated LIBS capability |
| Software | J200 Control Suite with real-time ablation monitoring and post-acquisition data processing |
| Computer | Industrial-grade embedded PC |
| Brand | JB |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | CS995 Advanced Digital Carbon-Sulfur Analyzer |
| Price | USD 16,800 (FOB Jiangsu) |
| Measurement Principle | Infrared Absorption Spectroscopy |
| Heating System | High-Frequency Induction Furnace (2.5 kW, 20 MHz) |
| Measurement Range | C: 0.0001–6.0000 wt% |
| S | 0.0001–0.5000 wt% |
| Sensitivity | 0.01 ppm (C and S) |
| Precision | ±1 ppm (RSD ≤ 0.5% at mid-range concentration) |
| Analysis Time | ≤35 seconds per sample (including combustion, gas purification, and IR detection) |
| Brand | JB |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Country of Manufacture | China |
| Model | CS995 Carbon-Sulfur Analyzer |
| Price | USD 16,800 (FOB Jiangsu) |
| Measurement Principle | Electrolytic Conductivity Detection |
| Heating System | High-Frequency Induction Furnace (2.5 kHz, 20 kW) |
| Carbon Range | 0.0001–6.0000 wt% |
| Sulfur Range | 0.0001–0.5000 wt% |
| Sensitivity | 0.01 ppm (C and S) |
| Precision | ±1 ppm (RSD ≤ 0.5% at mid-range concentrations) |
| Analysis Time | ≤35 seconds per sample (including combustion, gas purification, and detection) |
| Brand | JB |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Country of Manufacture | China |
| Model | CS995 |
| Measurement Principle | Non-Dispersive Infrared (NDIR) Absorption |
| Heating System | High-Frequency Induction Furnace (2.5 kHz, 3.5 kW) |
| Carbon Range | 0.0001–6.0000 wt% |
| Sulfur Range | 0.0001–0.5000 wt% |
| Sensitivity | 0.01 ppm (C and S) |
| Precision | ±1 ppm (RSD ≤ 0.5% at mid-range concentrations) |
| Analysis Time | ≤35 s per sample |
| Sample Weighing Range | 0.1–1.0 g (standard crucible mode) |
| Brand | JB |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | CCD-based Multi-Channel Array |
| Focal Length | 401 mm |
| Grating Groove Density | 2400 lines/mm |
| Wavelength Range | 140–680 nm |
| Optical Configuration | Paschen–Runge Mount |
| Number of Simultaneous Analytical Channels | Not Applicable (Full-Spectrum CCD Acquisition) |
| Compliance | Meets ISO 11573:2021 (Metallic materials — Spark optical emission spectrometry), ASTM E415–22 (Standard Test Method for Analysis of Carbon and Low-Alloy Steel by Spark Atomic Emission Spectrometry) |
| Brand | Jiebo (JB) |
|---|---|
| Origin | Jiangsu, China |
| Model | TS6 |
| Power Supply | AC 220 V, 50 Hz |
| Display | 19-inch TFT True Color LCD |
| Operating Temperature | 0–50 °C |
| Operating Humidity | <76% RH |
| Power Consumption | 200 W |
| Measurement Time | 90 s |
| Cooling Curve Resolution | 0.1 °C (0–1370 °C) |
| CE Range | 2.30–4.83 wt%, ±0.10 wt% |
| C Range | 2.20–4.30 wt%, ±0.05 wt% |
| Si Range | 0.30–3.80 wt%, ±0.10 wt% |
| Spheroidization Rate (SG) | 60–95%, ±10.0% |
| Tensile Strength Range | HT100–HT350 |
| Data Storage Capacity | 5000 Measurements |
| Correction Offset Range | −0.99 to +0.99 for CE, C, Si |
| Brand | JBS |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Benchtop Laboratory Analyzer |
| Principle | Cold Vapor Atomic Fluorescence Spectrometry (CVAFS) |
| Detection Limit | ≤0.003 µg/L |
| Repeatability (RSD) | ≤5% |
| Linearity Error | ±5% |
| Zero Drift | <0.2 mV |
| Measurement Range | 0.01–100 µg/L |
| Noise Level | <0.1 mV |
| Correlation Coefficient (Calibration Curve) | ≥0.996 |
| Operating Temperature | 5–35 °C |
| Relative Humidity | ≤80% |
| Environmental Requirements | Low-vibration, low-EMI, mercury-free ambient, well-ventilated location with external exhaust capability |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Instrument Type | Continuous-Wave (CW) ESR |
| Models | JES-X310, JES-X320 |
| Control System | Fully Computer-Controlled |
| Magnetic Field Control | Advanced Digital Gradient-Stabilized Electromagnet System |
| Operating Mode | X-band (9–10 GHz) |
| Detection Method | Phase-Sensitive Lock-in Detection with Field Modulation |
| Cryogenic Compatibility | Optional Liquid Nitrogen and Helium Cryostat Integration |
| Safety Compliance | IEC 61010-1, CE Marked |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Instrument Type | Magnetic Sector Mass Spectrometer |
| Application Focus | Dioxin (PCDD/Fs) Analysis |
| GC Compatibility | Dual-Column Interface |
| Detector | Photomultiplier Tube (PMT) |
| Software | Diok Suite (EPA Method 1613 Compliant) |
| Vacuum Integrity | Column Exchange Without Ion Source Venting |
| Regulatory Alignment | Designed for EPA 1613, EU 2017/771, and ISO 18073 Compliance |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JMS-Q1600GC |
| Instrument Type | Single Quadrupole Mass Spectrometer |
| GC Configuration | Conventional Gas Chromatography-Mass Spectrometry (GC-MS) |
| Series | UltraQuad™ SQ-Zeta |
| Generation | 6th-generation JEOL GC-MS platform |
| Application Scope | Quantitative and Qualitative Analysis in Environmental, Food Safety, Agrochemical, Materials, and Flavor Chemistry |
| Compliance Framework | Designed for GLP/GMP-aligned laboratories |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JMS-S3000 |
| Ion Optics | SpiralTOF™-plus 2.0 |
| Operating Modes | TOF (standard), Linear TOF (optional), TOF/TOF (optional) |
| Application Scope | Synthetic polymers, biomacromolecules, materials science |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Instrument Type | Time-of-Flight (TOF) Mass Spectrometer |
| Configuration | Liquid Chromatography–Mass Spectrometry (LC-MS) Platform |
| Ionization Modes | Electrospray Ionization (ESI), Direct Analysis in Real Time (DART™), Cold Spray Ionization (CSI) |
| Intended Use | General-purpose high-resolution mass analysis in research, quality control, and regulatory-compliant laboratories |
| Compliance Context | Designed to support GLP/GMP workflows and data integrity requirements per FDA 21 CFR Part 11 and ISO/IEC 17025 guidelines |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JMS-T2000GC |
| Type | Time-of-Flight (TOF) GC-MS System |
| Ionization Modes | Electron Ionization (EI), Chemical Ionization (CI), Field Ionization (FI), and Optional Atmospheric Pressure Chemical Ionization (APCI) |
| Mass Accuracy | < 1 ppm (external calibration), < 0.5 ppm (internal lock mass) |
| Mass Resolution | > 10,000 (FWHM, m/z 500) |
| Acquisition Rate | Up to 50 spectra/sec |
| Mass Range | m/z 10–4,000 |
| Detector | Microchannel Plate (MCP) with Delayed Extraction |
| Vacuum System | Dual-stage differential pumping with turbomolecular pumps |
| GC Interface | Direct capillary column coupling with heated transfer line (up to 350 °C) |
| Software | MassCenter™ v5.x with automated deconvolution, library search (NIST, Wiley, JEOL MS Library), and quantitative workflow support |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JNM-ECZL Series |
| Sample Type | Solid-Liquid Dual-Mode |
| Instrument Category | High-Field NMR Spectrometer |
| System Architecture | Integrated Smart Transceiver System (STS) |
| Multi-Resonance Capability | Standard Configuration |
| Design Principle | Compact High-Field Platform with Digital RF Control |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JNM-ECZL400R |
| NMR Frequency | 400 MHz (¹H) |
| Magnet Type | Superconducting, Cryogen-Free Option Available |
| Field Homogeneity | < 0.1 Hz/30 min (shimmed) |
| Temperature Control Range | –140 °C to +140 °C |
| Sample Format | Solid, Semi-Solid, Gel, Liquid, and Heterogeneous Samples |
| Probe Compatibility | Broadband Solid-State MAS Probes (e.g., 2.5–4 mm rotors), Static & Variable-Temperature Configurations |
| Optional FFC Module | SPINMASTER FFC2000 (0.01–42 MHz field-cycling range) |
| Optional SMARTracer Module | 0.1–10 MHz |
| Optional 3 T Permanent Magnet Add-on | Extends ¹H Larmor frequency to ~130 MHz |
| Sample Tube Standard | 4 mm or 3.2 mm ZrO₂ MAS rotors (solid) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSX-1000S |
| Elemental Analysis Range | Mg–U (Na–U optional) |
| Quantitative Range | 0.1–99.9 wt% |
| Energy Resolution | <170 eV at Mn Kα |
| Repeatability | ±0.1% RSD |
| X-ray Tube | 5–50 kV, 1 mA, Rh anode |
| Filter Options | Standard — OPEN, ND, Cr, Pb, Cd |
| Detector | Silicon Drift Detector (SDD) |
| Sample Chamber | Ø300 mm × 80 mm H |
| Atmosphere Mode | Air (standard) |
| Imaging System | Integrated color camera |
| Software Suite | Qualitative & Quantitative Analysis, RoHS Compliance Module (Cd, Pb, Hg, Br, Cr), Quick-Analysis Mode, Report Generator, Daily Verification Tool |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JXA-8230 |
| Accelerating Voltage | 0.2–30 kV (0.1 kV step) |
| Beam Current Range | 1×10⁻¹² – 1×10⁻⁵ A |
| Beam Current Stability | ±5% / h, ±0.3% / 12 h |
| Secondary Electron Resolution | 6 nm (W filament, WD = 11 mm, 30 kV) |
| Magnification | ×40 – ×300,000 |
| Max. Sample Size | 100 mm × 100 mm × 50 mm (H) |
| WDS Elemental Range | Be*¹–U (Be requires optional crystal) |
| EDS Elemental Range | B–U |
| WDS Wavelength Range | 0.087–9.3 nm |
| EDS Energy Range | 0–20 keV |
| WDS Spectrometers | 1–5 channels (configurable) |
| EDS Detector | 1 SDD (optional fanless digital pulse processor) |
| Display | Dual LCDs (1280×1024), dedicated for EPMA analysis and SEM/EDS operation |
| Brand | JIACO |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | JIACO MIP |
| Pricing | Available Upon Request |