Electron Microscope
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| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | blueDrive |
| Price Range | USD 13,500 – 68,000 |
| Instrument Type | AFM Accessory |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher ES EC-AFM |
| Price Range | USD 340,000 – 410,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM), Materials-Focused |
| Position Detection Noise | 625 Hz (RMS, bandwidth-corrected) |
| Sample Dimensions | Ø < 15 mm, Thickness < 5 mm |
| XY Stage Scan Range | 180 µm × 180 µm (optical field of view), with full 180 mm × 180 mm motorized sample positioning area |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher S |
| Instrument Type | Materials-Focused AFM |
| Closed-Loop Noise (X,Y) | <0.06 nm |
| Closed-Loop Noise (Z) | <0.05 nm |
| Height Noise | <0.015 nm |
| Sample Diameter | <15 mm (standard), <7 mm (high-stability configuration) |
| XY Stage Travel Range | 180 mm × 180 mm |
| Imaging Speed | Up to 10–100× faster than conventional AFMs |
| Probe Compatibility | Supports ultra-small probes (e.g., 3 × 9 µm optical spot size, optional) |
| Environmental Flexibility | Upgradeable to Cypher ES (environmental control) and Cypher VRS (video-rate scanning) |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Model | Cypher VRS |
| Instrument Type | Material-Focused Atomic Force Microscope |
| XY Positional Noise | <60 pm |
| Z Positional Noise | <50 pm |
| Maximum Sample Diameter | ≤15 mm |
| Maximum Sample Thickness | ≤7 mm |
| Sample Stage Travel Range | 180 mm × 180 mm |
| Scan Speed | Up to 625 lines/sec |
| Frame Rate | >10 fps at 512×512 pixel resolution |
| Excitation Method | blueDrive™ Photothermal Actuation |
| Compliance | ASTM E2539, ISO/IEC 17025-compatible operation, GLP/GMP-ready data integrity architecture |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Fast-Scan Scanning Capacitance Microscope (SCM) |
| Price Range | USD 25,000 – 65,000 |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Jupiter XR |
| Price Range | USD 320,000 – 385,000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | 35 pm |
| Maximum Sample Diameter | 210 mm |
| XY Stage Travel Range | 200 mm × 200 mm |
| Scan Range | Up to 100 μm (full closed-loop) |
| Imaging Speed | 5–20× faster than conventional large-sample AFMs |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MFP-3D |
| Price Range | USD 135,000 – 205,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Z-Axis Positioning Noise | < 0.06 nm (RMS, in air) |
| X/Y Closed-Loop Scanning Noise | < 0.5 nm (RMS) |
| Sample Diameter | ≤ 80 mm |
| Sample Thickness | ≤ 25 mm |
| Visual Field of View | 200 mm × 200 mm (XY stage travel with optical alignment) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Scanning Microwave Impedance Microscopy (sMIM) |
| Instrument Type | Scanning Probe Microscope |
| Application Domain | Nanoscale Electrical Characterization |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Vero |
| Price | Upon Request |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | X&Y Sensor Noise < 60 pm, Z Sensor Noise < 50 pm |
| Sample Dimensions | Up to 15 mm in diameter, 7 mm in thickness |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecBattery |
| Detector Compatibility | Ultim Max / Xplore / UltimExtreme EDS detectors |
| Maximum Field Count | 10,000 fields per sample |
| Max Particle Count | 200,000 particles per sample |
| Throughput | Up to 30,000 particles/hour |
| EDS Count Rate Capability | Up to 400 kcps |
| Effective Detector Area | Up to 170 mm² |
| Software-Enabled Capabilities | Automated particle detection, multi-threshold contrast segmentation, morphology-based filtering, Z-focus stabilization across large-area scans, cross-field particle reconstruction, customizable classification logic, ASTM/ISO-compliant reporting templates, FDA 21 CFR Part 11-ready audit trail (optional configuration) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | AZtecFeature |
| Instrument Type | Benchtop SEM-EDS System |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 1.0 nm @ 15 kV, WD = 4 mm |
| Magnification Range | 20–2,000× (low mag) |
| Accelerating Voltage | 1–30 kV |
| Backscattered Electron Resolution | 4 nm @ 30 kV (low-vacuum mode) |
| Detector Configuration | Up to four Ultim Max SDDs supported |
| Real-time Particle Counting Capacity | Up to 200,000 particles per sample |
| Data Acquisition & Quantification Engine | Tru-Q® automated elemental identification and quantification |
| Peak Deconvolution | Advanced sum-peak correction for high-count-rate accuracy |
| Software Architecture | Native 64-bit multithreaded processing |
| Compliance | ASTM E1588–10e1 (GSR), ISO 16232 (cleanliness), VDA 19.1, USP <788>, GLP/GMP-aligned audit trail support |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecPharma |
| Compliance | FDA 21 CFR Part 11, EU Annex 11, GxP-aligned |
| Software Platform | AZtecLive-based |
| User Authentication | Integrated Windows Active Directory / LDAP |
| Audit Trail | Immutable, timestamped, user-attributed, inspector-accessible |
| Digital Signature | Enforced per action (acquisition, processing, reporting) |
| SOP Integration | Configurable acquisition profiles with version-controlled parameters |
| Real-time EDS Imaging | Elemental mapping with live spectral overlay comparison |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecTEM |
| Instrument Type | EDS Software Platform |
| Compatibility | JEOL 200 kV & 300 kV Transmission Electron Microscopes equipped with JED EDS detectors |
| Key Features | Point-and-ID analysis, LineScan, Elemental Mapping (TruMap, QuantMap), Drift Correction (AutoLock), Real-time Dynamic Imaging (AZtecLive) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecWave |
| Detector Type | Wavelength Dispersive Spectrometer (WDS) with Integrated EDS Compatibility (Ultim Max) |
| Roland Circle Radius | 210 mm |
| Energy Resolution | <10 eV (Mn Kα, typical) |
| Detection Limit | <100 ppm (matrix-dependent) |
| Peak-to-Background Ratio | >10,000:1 (typical for major elements) |
| Optical Geometry | Focusing Johann-type spectrometer with bent crystals |
| Incident Slit | Motorized, variable width |
| Installation | Tilt-mounted for minimal working distance dependency |
| Software Platform | AZtecWave v4.x or later |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | C-Nano |
| CCD Camera Resolution | 1244 × 1024 pixels |
| Maximum Pattern Acquisition Rate | 870 Hz |
| Spatial Resolution | 2 nm |
| Angular Resolution | < 0.05° |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | C-Swift |
| CCD Camera Resolution | 1244 × 1024 |
| Maximum Frame Rate | 870 Hz |
| Spatial Resolution | 2 nm |
| Angular Resolution | < 0.05° |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher ES Polymer Edition |
| Price Range | USD 420,000 – 700,000 (est.) |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science |
| Position Detection Noise | 625 Hz |
| Sample Dimensions | Ø < 15 mm, Thickness < 5 mm |
| Stage Travel Range | 180 mm × 180 mm |
| Environmental Control | Sealed fluid/gas chamber compatible |
| Temperature Control Range | 0–250 °C |
| Nanomechanical Capabilities | Integrated NanoMechPro toolkit (Force Modulation, Contact Resonance, and HarmoniX™) |
| Excitation Method | blueDrive photothermal excitation for tapping mode |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Cypher VRS1250 |
| Instrument Type | Materials-Focused Atomic Force Microscope |
| Position Detection Noise | X&Y < 60 pm |
| Sample Dimensions | Ø ≤ 15 mm, Thickness ≤ 7 mm |
| Stage Travel Range | 180 mm × 180 mm |
| Software | SmartScan |
| Environmental Compatibility | Fully compatible with Cypher ES environmental control system (temperature-controlled sample stage: –30 °C to +250 °C) |
| Excitation Method | blueDrive™ photothermal excitation |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Jupiter Discovery AFM |
| Pricing | Available Upon Request |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Matrix |
| Price Range | USD 320,000 – 385,000 |
| Instrument Type | Magnetic Force Microscope (MFM) Control System |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | NA-TKD |
| Compatibility | Fully compatible with Oxford Instruments Symmetry CMOS EBSD detectors |
| Configuration | Near-axis phosphor screen geometry |
| Primary Application | High-resolution crystallographic orientation and strain mapping in thin, beam-sensitive, or nanoscale materials |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | OmniGIS II |
| Gas Port Configuration | Single-port, multi-source compatible |
| Gas Capacity | Up to 3 primary gas sources + 2 auxiliary gases |
| Control Architecture | Pressure-feedback regulated flow control |
| Vacuum Compatibility | Adaptive operation across wide chamber pressure range (10⁻⁷ mbar to 10⁻¹ mbar) |
| Integration | Designed for SEM and FIB platforms |
| Compliance | CE-marked |
| Software Interface | Native integration with AZtec GIS Control Suite (v5.0+) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | OmniProbe (OP350, OP400, Cryo) |
| Drive Technology | Piezoelectric actuation |
| Positioning Resolution | Sub-nanometer |
| Operating Temperature Range (Cryo) | –180 °C to room temperature |
| Port Compatibility | Standard SEM/FIB vacuum feedthroughs (e.g., 60 mm, 80 mm) |
| Control Interface | Digital USB/Ethernet with real-time image-synchronized calibration |
| Compliance | Designed for GLP/GMP-aligned workflows |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Relate Correlative Imaging Software |
| Data Format Support | Aztec H5oina, AFM native formats (e.g., Gwyddion, Nanoscope, SPIP) |
| Primary Function | Multi-modal correlative analysis of SEM/TEM, EDS, EBSD, and AFM datasets |
| Compatibility | Integrated with Oxford Instruments Aztec and Symmetry platforms |
| Licensing | Node-locked or floating license options |
| Compliance | Supports GLP/GMP-aligned documentation workflows, audit-trail-ready metadata logging |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Symmetry S2 EBSD Detector |
| CCD Camera Resolution | 1244 × 1024 pixels |
| Pattern Resolution (High-Speed Mode) | 156 × 88 pixels |
| Spatial Resolution | 10 nm |
| Angular Resolution | 0.05° |
| Maximum Indexing Speed | 4500 patterns per second (pps) |
| Beam Current Requirement for 4500 pps | 12 nA |
| Integrated Forward Scatter Detectors (FSD) | 5-channel |
| Interface | Bellows-type SEM vacuum-compatible port with auto-calibrating tilt mechanism |
| Collision Avoidance | Proximity sensor–enabled retraction system |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Symmetry S3 |
| CCD Camera Resolution | 1244 × 1024 pixels |
| Maximum Acquisition Speed | 870 Hz (≥5700 patterns per second at 156 × 128 binning) |
| Spatial Resolution | 2 nm |
| Angular Resolution | <0.1° |
| Optical System | Lensless fiber-optic coupling |
| Sensor | Custom EBSD-optimized CMOS |
| Pattern Distortion | <1 pixel (sub-pixel guaranteed) |
| Sensitivity | up to 1000 pps/nA |
| Fluorescent Screen Travel Range | ±22 mm motorized vertical adjustment |
| Collision Protection | Patented proximity sensor system |
| Optional FSD | 5-diode front-scatter detector system |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TKD |
| Price Range | USD 1,400 – 7,000 |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Extreme Infinity ∞ |
| Quotation | Upon Request |
| Detector Type | Sidewall-Insertion (Side-Entry) |
| Energy Resolution | C Ka ≤ 46 eV @ 50,000 cps |
| Elemental Range | Li (Z=3) to Cf (Z=98) |
| Window Type | Windowless |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Extreme |
| Instrument Type | Multi-Detector Configuration |
| Energy Resolution | 127 eV (Mn Kα) |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | 500,000 cps |
| Elemental Detection Range | Li to Bi |
| Detector Active Area | 100 mm² |
| Window Type | Windowless |